{"id":"https://openalex.org/W4415593623","doi":"https://doi.org/10.1109/tcsi.2025.3620879","title":"Performance Evaluation and Enhancement Scheme for RRAM-Based In-Memory Computing Circuits by Signal Integrity Analysis With Consideration of Electro-Thermal and Parasitic Effects","display_name":"Performance Evaluation and Enhancement Scheme for RRAM-Based In-Memory Computing Circuits by Signal Integrity Analysis With Consideration of Electro-Thermal and Parasitic Effects","publication_year":2025,"publication_date":"2025-10-27","ids":{"openalex":"https://openalex.org/W4415593623","doi":"https://doi.org/10.1109/tcsi.2025.3620879"},"language":null,"primary_location":{"id":"doi:10.1109/tcsi.2025.3620879","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3620879","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100350686","display_name":"Wenbo Wang","orcid":"https://orcid.org/0009-0008-0074-3740"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenbo Wang","raw_affiliation_strings":["College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0008-0074-3740","affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010741339","display_name":"Xingyu Zhai","orcid":"https://orcid.org/0000-0002-3035-9407"},"institutions":[{"id":"https://openalex.org/I4210108177","display_name":"Zhejiang Police College","ror":"https://ror.org/01rxaf991","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210108177"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingyu Zhai","raw_affiliation_strings":["School of Criminal Investigation, Zhejiang Police College, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3035-9407","affiliations":[{"raw_affiliation_string":"School of Criminal Investigation, Zhejiang Police College, Hangzhou, China","institution_ids":["https://openalex.org/I4210108177"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054834839","display_name":"Jiarui Qiu","orcid":"https://orcid.org/0009-0006-9596-2326"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiarui Qiu","raw_affiliation_strings":["College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0006-9596-2326","affiliations":[{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023619721","display_name":"Hao Xie","orcid":"https://orcid.org/0000-0002-1183-8090"},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Xie","raw_affiliation_strings":["School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-1183-8090","affiliations":[{"raw_affiliation_string":"School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, China","institution_ids":["https://openalex.org/I4400573310"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037201336","display_name":"Lunyao Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I109935558","display_name":"Ningbo University","ror":"https://ror.org/03et85d35","country_code":"CN","type":"education","lineage":["https://openalex.org/I109935558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lunyao Wang","raw_affiliation_strings":["College of Information Science and Engineering, Ningbo University, Ningbo, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Ningbo University, Ningbo, China","institution_ids":["https://openalex.org/I109935558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070614875","display_name":"Yinshui Xia","orcid":"https://orcid.org/0000-0002-3831-3876"},"institutions":[{"id":"https://openalex.org/I109935558","display_name":"Ningbo University","ror":"https://ror.org/03et85d35","country_code":"CN","type":"education","lineage":["https://openalex.org/I109935558"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinshui Xia","raw_affiliation_strings":["College of Information Science and Engineering, Ningbo University, Ningbo, China"],"raw_orcid":"https://orcid.org/0000-0002-3831-3876","affiliations":[{"raw_affiliation_string":"College of Information Science and Engineering, Ningbo University, Ningbo, China","institution_ids":["https://openalex.org/I109935558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100651075","display_name":"Wenchao Chen","orcid":"https://orcid.org/0000-0001-7613-1734"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenchao Chen","raw_affiliation_strings":["School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-7613-1734","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5100350686"],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.29011476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"3","first_page":"1981","last_page":"1989"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5570999979972839},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47040000557899475},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.46720001101493835},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4661000072956085},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.4449000060558319},{"id":"https://openalex.org/keywords/parasitic-element","display_name":"Parasitic element","score":0.4000000059604645},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.38029998540878296},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.37700000405311584},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.3628999888896942}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6263999938964844},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5570999979972839},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.534500002861023},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47040000557899475},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.46720001101493835},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4661000072956085},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.4449000060558319},{"id":"https://openalex.org/C71367568","wikidata":"https://www.wikidata.org/wiki/Q3363655","display_name":"Parasitic element","level":2,"score":0.4000000059604645},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.38029998540878296},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.37700000405311584},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3628999888896942},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.35830000042915344},{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.3411000072956085},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.3271999955177307},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.32580000162124634},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.30570000410079956},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.27459999918937683},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.26919999718666077},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.26919999718666077},{"id":"https://openalex.org/C33762810","wikidata":"https://www.wikidata.org/wiki/Q461671","display_name":"Data integrity","level":2,"score":0.2653999924659729},{"id":"https://openalex.org/C123671423","wikidata":"https://www.wikidata.org/wiki/Q332329","display_name":"Contact resistance","level":3,"score":0.2556999921798706},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.2535000145435333},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.2513999938964844},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.25099998712539673}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3620879","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3620879","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1550082337","display_name":null,"funder_award_id":"LDT23F0402","funder_id":"https://openalex.org/F4320317779","funder_display_name":"Zhejiang\u00a0Provincial\u00a0Postdoctoral\u00a0Science\u00a0Foundation"},{"id":"https://openalex.org/G4749324214","display_name":null,"funder_award_id":"U23A20351","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8822146676","display_name":null,"funder_award_id":"LDT23F04021F04","funder_id":"https://openalex.org/F4320317779","funder_display_name":"Zhejiang\u00a0Provincial\u00a0Postdoctoral\u00a0Science\u00a0Foundation"}],"funders":[{"id":"https://openalex.org/F4320317779","display_name":"Zhejiang\u00a0Provincial\u00a0Postdoctoral\u00a0Science\u00a0Foundation","ror":null},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"The":[0,68],"non-ideal":[1],"effects":[2,37,43],"in":[3],"resistive":[4],"random-access":[5],"memory":[6],"(RRAM)":[7],"crossbar":[8],"arrays":[9],"have":[10],"become":[11],"a":[12,29,56,114],"critical":[13],"factor":[14],"limiting":[15],"the":[16,35,41,47,80,109,128,133,142,161,170],"computational":[17],"accuracy":[18,83],"of":[19,38,44,71,84,88,98,112,175],"in-memory":[20],"computing":[21,54],"(IMC)":[22],"circuits.":[23],"In":[24],"this":[25],"work,":[26],"we":[27],"develop":[28],"comprehensive":[30],"circuit":[31],"model":[32,48,135],"that":[33],"integrates":[34],"electro-thermal":[36,72],"devices":[39],"and":[40,46,76,90,119,173],"parasitic":[42,77],"interconnects,":[45,113],"is":[49,101,122,149],"utilized":[50],"to":[51,140,151],"implement":[52],"parallel":[53],"for":[55,169],"two-layer":[57],"<inline-formula":[58],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[59],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[60],"<tex-math":[61],"notation=\"LaTeX\">$197\\times":[62],"40\\times":[63],"20$</tex-math>":[64],"</inline-formula>":[65],"neural":[66],"network.":[67],"combined":[69],"impact":[70],"effect,":[73],"IR":[74],"drop,":[75],"crosstalk":[78],"on":[79,132],"image":[81],"recognition":[82],"Modified":[85],"National":[86],"Institute":[87],"Standards":[89],"Technology":[91],"database":[92],"(MNIST)":[93],"dataset":[94],"under":[95],"different":[96],"numbers":[97],"resistance":[99,111,129,158],"states":[100],"evaluated.":[102],"To":[103],"address":[104],"voltage":[105,116,153],"attenuation":[106],"caused":[107,156],"by":[108,137,157],"line":[110],"position-aware":[115],"loss":[117],"prediction":[118,134],"correction":[120,162],"scheme":[121,125,148],"proposed.":[123],"This":[124],"dynamically":[126],"adjusts":[127],"distribution":[130],"based":[131],"determined":[136],"test":[138],"data":[139],"calibrate":[141],"output":[143],"current.":[144],"Finally,":[145],"an":[146,166],"improvement":[147],"proposed":[150],"reduce":[152],"trend":[154],"errors":[155],"degradation":[159],"during":[160],"process,":[163],"which":[164],"provides":[165],"effective":[167],"solution":[168],"performance":[171],"simulation":[172],"optimization":[174],"high-precision":[176],"IMC":[177],"systems.":[178]},"counts_by_year":[],"updated_date":"2026-02-27T14:28:36.762950","created_date":"2025-10-28T00:00:00"}