{"id":"https://openalex.org/W4415593549","doi":"https://doi.org/10.1109/tcsi.2025.3620105","title":"Noise Modulation of a Bandgap Reference by Using a Single Resistor","display_name":"Noise Modulation of a Bandgap Reference by Using a Single Resistor","publication_year":2025,"publication_date":"2025-10-27","ids":{"openalex":"https://openalex.org/W4415593549","doi":"https://doi.org/10.1109/tcsi.2025.3620105"},"language":null,"primary_location":{"id":"doi:10.1109/tcsi.2025.3620105","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3620105","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tcsi.2025.3620105","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068001957","display_name":"Accel Abarca","orcid":"https://orcid.org/0000-0002-7201-3033"},"institutions":[{"id":"https://openalex.org/I4210141319","display_name":"International Iberian Nanotechnology Laboratory","ror":"https://ror.org/04dv3aq25","country_code":"PT","type":"facility","lineage":["https://openalex.org/I4210141319"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Accel Abarca","raw_affiliation_strings":["Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal"],"raw_orcid":"https://orcid.org/0000-0002-7201-3033","affiliations":[{"raw_affiliation_string":"Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal","institution_ids":["https://openalex.org/I4210141319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101938550","display_name":"Ricardo Silva","orcid":"https://orcid.org/0000-0003-0994-2662"},"institutions":[{"id":"https://openalex.org/I4210141319","display_name":"International Iberian Nanotechnology Laboratory","ror":"https://ror.org/04dv3aq25","country_code":"PT","type":"facility","lineage":["https://openalex.org/I4210141319"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Ricardo Silva","raw_affiliation_strings":["Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal"],"raw_orcid":"https://orcid.org/0000-0003-0994-2662","affiliations":[{"raw_affiliation_string":"Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal","institution_ids":["https://openalex.org/I4210141319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008862804","display_name":"Thiago Dar\u00f3s Fernandes","orcid":"https://orcid.org/0000-0001-9625-5881"},"institutions":[{"id":"https://openalex.org/I4210141319","display_name":"International Iberian Nanotechnology Laboratory","ror":"https://ror.org/04dv3aq25","country_code":"PT","type":"facility","lineage":["https://openalex.org/I4210141319"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Thiago Dar\u00f3s Fernandes","raw_affiliation_strings":["Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal","institution_ids":["https://openalex.org/I4210141319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057506196","display_name":"Rodrigo Wrege","orcid":"https://orcid.org/0000-0002-9789-0833"},"institutions":[{"id":"https://openalex.org/I4210141319","display_name":"International Iberian Nanotechnology Laboratory","ror":"https://ror.org/04dv3aq25","country_code":"PT","type":"facility","lineage":["https://openalex.org/I4210141319"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Rodrigo Wrege","raw_affiliation_strings":["Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal","institution_ids":["https://openalex.org/I4210141319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033232332","display_name":"C. N. Marques","orcid":"https://orcid.org/0000-0002-7429-0165"},"institutions":[{"id":"https://openalex.org/I4210141319","display_name":"International Iberian Nanotechnology Laboratory","ror":"https://ror.org/04dv3aq25","country_code":"PT","type":"facility","lineage":["https://openalex.org/I4210141319"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Carlos Marques","raw_affiliation_strings":["Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal","institution_ids":["https://openalex.org/I4210141319"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048889839","display_name":"Jo\u00e3o Piteira","orcid":"https://orcid.org/0000-0001-9481-6905"},"institutions":[{"id":"https://openalex.org/I4210141319","display_name":"International Iberian Nanotechnology Laboratory","ror":"https://ror.org/04dv3aq25","country_code":"PT","type":"facility","lineage":["https://openalex.org/I4210141319"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Jo\u00e3o Piteira","raw_affiliation_strings":["Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal"],"raw_orcid":"https://orcid.org/0000-0001-9481-6905","affiliations":[{"raw_affiliation_string":"Systems Engineering Group, International Iberian Nanotechnology Laboratory (INL), Braga, Portugal","institution_ids":["https://openalex.org/I4210141319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210141319"],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":{"value":2645,"currency":"USD","value_usd":2645},"fwci":1.1744,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.82340053,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"73","issue":"3","first_page":"1528","last_page":"1538"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9824000000953674,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9563999772071838,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.8004000186920166},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.7789999842643738},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.7423999905586243},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5720000267028809},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5544999837875366},{"id":"https://openalex.org/keywords/y-factor","display_name":"Y-factor","score":0.5199000239372253},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.5130000114440918},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.4900999963283539},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.483599990606308},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.478300005197525}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.8004000186920166},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.7789999842643738},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.7423999905586243},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5720000267028809},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5672000050544739},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5544999837875366},{"id":"https://openalex.org/C166576357","wikidata":"https://www.wikidata.org/wiki/Q8045715","display_name":"Y-factor","level":5,"score":0.5199000239372253},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.5130000114440918},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.4900999963283539},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.483599990606308},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.478300005197525},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4758000075817108},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.46860000491142273},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43309998512268066},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.4320000112056732},{"id":"https://openalex.org/C133976006","wikidata":"https://www.wikidata.org/wiki/Q3023291","display_name":"Noise spectral density","level":5,"score":0.39579999446868896},{"id":"https://openalex.org/C61818909","wikidata":"https://www.wikidata.org/wiki/Q1987617","display_name":"Pull-up resistor","level":5,"score":0.37630000710487366},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3603000044822693},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.3529999852180481},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.3224000036716461},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3199000060558319},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.29589998722076416},{"id":"https://openalex.org/C11930861","wikidata":"https://www.wikidata.org/wiki/Q181417","display_name":"Frequency modulation","level":3,"score":0.2883000075817108},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.28380000591278076},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.2808000147342682},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.27799999713897705},{"id":"https://openalex.org/C203234222","wikidata":"https://www.wikidata.org/wiki/Q2133519","display_name":"Noise power","level":3,"score":0.2736999988555908},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.267300009727478},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.26429998874664307},{"id":"https://openalex.org/C90166738","wikidata":"https://www.wikidata.org/wiki/Q7047656","display_name":"Noise-figure meter","level":5,"score":0.25920000672340393},{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.2540999948978424},{"id":"https://openalex.org/C104419016","wikidata":"https://www.wikidata.org/wiki/Q1337490","display_name":"Johnson\u2013Nyquist noise","level":3,"score":0.25270000100135803},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.2517000138759613}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3620105","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3620105","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tcsi.2025.3620105","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3620105","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1535129988","https://openalex.org/W1997811146","https://openalex.org/W2055944305","https://openalex.org/W2093236804","https://openalex.org/W2112611349","https://openalex.org/W2126442808","https://openalex.org/W2922397210","https://openalex.org/W2955282019","https://openalex.org/W2978954010","https://openalex.org/W3004015449","https://openalex.org/W3041919369","https://openalex.org/W3095491424","https://openalex.org/W3147616483","https://openalex.org/W3159467222","https://openalex.org/W3190955021","https://openalex.org/W3194718671","https://openalex.org/W3197666296","https://openalex.org/W4221049448","https://openalex.org/W4377079678","https://openalex.org/W4400236426","https://openalex.org/W4407214459","https://openalex.org/W4409659610","https://openalex.org/W4409683561"],"related_works":[],"abstract_inverted_index":{"This":[0,50],"manuscript":[1],"presents":[2],"a":[3,20,115],"low":[4],"noise":[5,15,40,45,117],"and":[6,65,104,131,136],"area":[7,107],"efficient":[8],"voltage":[9,64],"bandgap":[10],"reference":[11],"(BGR)":[12],"where":[13,98],"its":[14],"is":[16,41],"modulated":[17,42],"by":[18],"using":[19],"single":[21],"resistor":[22,51],"between":[23,134],"the":[24,28,33,36,38,44,61,66,72,76,99,122],"base":[25],"terminals":[26],"of":[27,35,57,108,125],"bipolar":[29],"core.":[30],"Depending":[31],"on":[32],"value":[34],"resistor,":[37],"flicker":[39],"above":[43],"corner":[46],"frequency":[47,123],"(thermal":[48],"noise).":[49],"also":[52],"provides":[53,101],"an":[54,106],"extra":[55],"degree":[56],"freedom":[58],"while":[59],"selecting":[60],"BGR":[62,77,100,113],"output":[63],"temperature":[67],"coefficient":[68],"(TC).":[69],"After":[70],"optimizing":[71],"design":[73],"via":[74],"simulations,":[75,97],"was":[78],"taped":[79],"out":[80],"in":[81,94],"standard$\\mathbf":[82],"{1":[83],"8":[84],"0}":[85],"\\mathbf":[86],"{n":[87],"m}$CMOS":[88],"TSMC":[89],"technology.":[90],"Experimental":[91],"results":[92],"are":[93],"accordance":[95],"with":[96],"0.9":[102],"V":[103],"occupies":[105],"only$0.009":[109],"\\mathrm":[110,120,146,150,154,161],"{mm}^{2}$.":[111],"The":[112,139,156],"has":[114],"total":[116,157],"of$14.23":[118],"\\mu":[119],"{Vrms}$over":[121],"range":[124],"0.1":[126],"Hz":[127],"to":[128],"10":[129,137],"kHz":[130],"only$2.82~\\mu":[132],"$Vrms":[133],"0.1Hz":[135],"Hz.":[138],"average":[140],"TC":[141],"is$49.05~\\mathrm":[142],"{ppm}":[143],"^{\\circ":[144,148,152],"}":[145,149,153],"{C}$between$-20":[147],"{C}$and$90":[151],"{C}$.":[155],"power":[158],"consumption":[159],"is$55.8~\\mu":[160],"{W}$at":[162],"1.8":[163],"V.":[164]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-28T00:00:00"}