{"id":"https://openalex.org/W4414080148","doi":"https://doi.org/10.1109/tcsi.2025.3604256","title":"Digitally Self-Calibrated RC Oscillator Utilizing Farey Search Algorithm Under ASIL-D Conditions Within AEC-Q100 Grade 0 Temperature Range","display_name":"Digitally Self-Calibrated RC Oscillator Utilizing Farey Search Algorithm Under ASIL-D Conditions Within AEC-Q100 Grade 0 Temperature Range","publication_year":2025,"publication_date":"2025-09-08","ids":{"openalex":"https://openalex.org/W4414080148","doi":"https://doi.org/10.1109/tcsi.2025.3604256"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2025.3604256","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3604256","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053634834","display_name":"Jeongwon Han","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeongwon Han","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0004-4844-4169","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024449964","display_name":"Won-Jong Choi","orcid":"https://orcid.org/0000-0002-8019-4778"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Won-Jong Choi","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-8019-4778","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053636327","display_name":"Sang\u2010Gug Lee","orcid":"https://orcid.org/0000-0001-8074-4090"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang-Gug Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-8074-4090","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014995955","display_name":"Kyeongha Kwon","orcid":"https://orcid.org/0000-0002-2373-7799"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyeongha Kwon","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-2373-7799","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15274716,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"3","first_page":"1721","last_page":"1730"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.968999981880188,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9660999774932861,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trimming","display_name":"Trimming","score":0.9606000185012817},{"id":"https://openalex.org/keywords/farey-sequence","display_name":"Farey sequence","score":0.567799985408783},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46000000834465027},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.451200008392334},{"id":"https://openalex.org/keywords/permutation","display_name":"Permutation (music)","score":0.4503999948501587},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4129999876022339},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.3743000030517578},{"id":"https://openalex.org/keywords/search-algorithm","display_name":"Search algorithm","score":0.33169999718666077}],"concepts":[{"id":"https://openalex.org/C56951928","wikidata":"https://www.wikidata.org/wiki/Q3539213","display_name":"Trimming","level":2,"score":0.9606000185012817},{"id":"https://openalex.org/C93157843","wikidata":"https://www.wikidata.org/wiki/Q1396592","display_name":"Farey sequence","level":2,"score":0.567799985408783},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.49079999327659607},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4814999997615814},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46000000834465027},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.451200008392334},{"id":"https://openalex.org/C21308566","wikidata":"https://www.wikidata.org/wiki/Q7169365","display_name":"Permutation (music)","level":2,"score":0.4503999948501587},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4408000111579895},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4129999876022339},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.3743000030517578},{"id":"https://openalex.org/C125583679","wikidata":"https://www.wikidata.org/wiki/Q755673","display_name":"Search algorithm","level":2,"score":0.33169999718666077},{"id":"https://openalex.org/C184670325","wikidata":"https://www.wikidata.org/wiki/Q512604","display_name":"Loop (graph theory)","level":2,"score":0.32670000195503235},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.32199999690055847},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31459999084472656},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2978000044822693},{"id":"https://openalex.org/C77366373","wikidata":"https://www.wikidata.org/wiki/Q255596","display_name":"RC oscillator","level":5,"score":0.29280000925064087},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.2904999852180481},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.28519999980926514},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27810001373291016},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.2743000090122223},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.2705000042915344},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.2703000009059906},{"id":"https://openalex.org/C39394816","wikidata":"https://www.wikidata.org/wiki/Q939318","display_name":"RC circuit","level":4,"score":0.2669999897480011},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2615000009536743},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.25529998540878296}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3604256","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3604256","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1873480687","display_name":null,"funder_award_id":"RS-2023-00278995","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2173425234","https://openalex.org/W2548357881","https://openalex.org/W2756566646","https://openalex.org/W2941215636","https://openalex.org/W3211036016","https://openalex.org/W4200596515","https://openalex.org/W4206592536","https://openalex.org/W4210581110","https://openalex.org/W4220667298","https://openalex.org/W4312924853","https://openalex.org/W4360605798","https://openalex.org/W4387546424","https://openalex.org/W4388288416","https://openalex.org/W4388469844","https://openalex.org/W4388936763","https://openalex.org/W4396918013","https://openalex.org/W4402436630","https://openalex.org/W4406110440","https://openalex.org/W4407403645","https://openalex.org/W4408183402"],"related_works":["https://openalex.org/W4405994202","https://openalex.org/W2106237085","https://openalex.org/W2133730998","https://openalex.org/W2010667816","https://openalex.org/W4365450697","https://openalex.org/W1794819749","https://openalex.org/W2769350095","https://openalex.org/W4394838866","https://openalex.org/W2788410081","https://openalex.org/W2951111714"],"abstract_inverted_index":{"High-safety":[0],"automotive":[1],"applications":[2],"demand":[3],"extensive":[4],"trimming":[5,22,55,126],"over":[6],"a":[7,27,41,47,58],"wide":[8],"temperature":[9,121],"range":[10,122],"due":[11],"to":[12,114],"AEC-Q100":[13,118],"Grade":[14,119],"0":[15,120],"and":[16,46,77,83,107,127],"ASIL-D":[17,130],"requirements.":[18],"To":[19],"mitigate":[20],"the":[21,34,62,65,72,75,117,129],"burden,":[23],"this":[24],"paper":[25],"introduces":[26],"digitally":[28],"self-calibrated":[29],"RC":[30],"oscillator":[31],"(RCO)":[32],"leveraging":[33],"Farey":[35],"search":[36],"algorithm":[37],"(FSA)":[38],"coupled":[39],"with":[40],"fractional":[42],"current-steering":[43],"DAC":[44],"(FIDAC)":[45],"loop":[48],"break":[49],"(LB).":[50],"The":[51,68,91],"FIDAC":[52,66],"generates":[53],"denser":[54],"currents":[56],"in":[57,95],"reduced":[59],"area,":[60],"while":[61],"FSA":[63],"optimizes":[64],"settings.":[67],"dynamic":[69],"LB":[70],"ensures":[71],"connection":[73],"between":[74],"RCO":[76,93],"its":[78],"reference":[79],"during":[80,85],"calibration":[81],"phases,":[82],"isolation":[84,131],"normal":[86],"operational":[87],"states":[88],"for":[89,104],"cross-validation.":[90],"prototype":[92],"fabricated":[94],"180nm":[96],"CMOS":[97],"process":[98,105],"achieves":[99],"0.55%$3\\sigma":[100],"$-inaccuracy":[101,109],"(280":[102],"samples)":[103,111],"variations":[106],"0.56%$3\\sigma":[108],"(56":[110],"across":[112],"\u221240\u00b0C":[113],"150\u00b0C,":[115],"meeting":[116],"requirement":[123],"without":[124],"manual":[125],"fulfilling":[128],"criteria.":[132]},"counts_by_year":[],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}