{"id":"https://openalex.org/W4413966886","doi":"https://doi.org/10.1109/tcsi.2025.3601227","title":"A Cross-Cycle Dynamic Active Gate Driver to Minimize Turn-Off Loss With Reduced Spike and <i>dv</i> / <i>dt</i> for SiC MOSFETs","display_name":"A Cross-Cycle Dynamic Active Gate Driver to Minimize Turn-Off Loss With Reduced Spike and <i>dv</i> / <i>dt</i> for SiC MOSFETs","publication_year":2025,"publication_date":"2025-09-03","ids":{"openalex":"https://openalex.org/W4413966886","doi":"https://doi.org/10.1109/tcsi.2025.3601227"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2025.3601227","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3601227","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078145814","display_name":"Chang Liu","orcid":"https://orcid.org/0009-0008-6420-3591"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chang Liu","raw_affiliation_strings":["School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100450421","display_name":"Shuo Zhang","orcid":"https://orcid.org/0009-0003-3070-3954"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuo Zhang","raw_affiliation_strings":["School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008698084","display_name":"Zhengyang Liu","orcid":"https://orcid.org/0000-0002-6114-8629"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zeyang Liu","raw_affiliation_strings":["School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103178606","display_name":"Jianming Lei","orcid":"https://orcid.org/0000-0001-9123-9129"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianming Lei","raw_affiliation_strings":["School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044077427","display_name":"Run Min","orcid":"https://orcid.org/0000-0003-3365-6260"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Run Min","raw_affiliation_strings":["School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100603761","display_name":"Desheng Zhang","orcid":"https://orcid.org/0000-0001-9174-8011"},"institutions":[{"id":"https://openalex.org/I196699116","display_name":"Wuhan University of Technology","ror":"https://ror.org/03fe7t173","country_code":"CN","type":"education","lineage":["https://openalex.org/I196699116"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Desheng Zhang","raw_affiliation_strings":["School of Automation, Wuhan University of Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Wuhan University of Technology, Wuhan, China","institution_ids":["https://openalex.org/I196699116"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064612882","display_name":"Qiaoling Tong","orcid":"https://orcid.org/0000-0002-9888-0426"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiaoling Tong","raw_affiliation_strings":["School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuit, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085930715","display_name":"Han Peng","orcid":"https://orcid.org/0000-0001-5063-2995"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Han Peng","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5078145814"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28274006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"73","issue":"2","first_page":"1474","last_page":"1485"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/turn","display_name":"Turn (biochemistry)","score":0.6522277593612671},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5699959397315979},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.49901437759399414},{"id":"https://openalex.org/keywords/spike","display_name":"Spike (software development)","score":0.4404185116291046},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4069575071334839},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4046650528907776},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3827987313270569},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.362150639295578},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.35411518812179565},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3310166895389557},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27400821447372437},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21508866548538208},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.21047091484069824}],"concepts":[{"id":"https://openalex.org/C85641259","wikidata":"https://www.wikidata.org/wiki/Q290042","display_name":"Turn (biochemistry)","level":2,"score":0.6522277593612671},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5699959397315979},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.49901437759399414},{"id":"https://openalex.org/C2781390188","wikidata":"https://www.wikidata.org/wiki/Q25203449","display_name":"Spike (software development)","level":2,"score":0.4404185116291046},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4069575071334839},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4046650528907776},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3827987313270569},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.362150639295578},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.35411518812179565},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3310166895389557},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27400821447372437},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21508866548538208},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.21047091484069824},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3601227","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3601227","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1259929071","display_name":null,"funder_award_id":"62374067","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1717891563","https://openalex.org/W2461936611","https://openalex.org/W2588734524","https://openalex.org/W2899335200","https://openalex.org/W2949088235","https://openalex.org/W2950223864","https://openalex.org/W2996740215","https://openalex.org/W3028105162","https://openalex.org/W3049646307","https://openalex.org/W3094784621","https://openalex.org/W3176402009","https://openalex.org/W4214892205","https://openalex.org/W4294310811","https://openalex.org/W4296916339","https://openalex.org/W4310502900","https://openalex.org/W4312231327","https://openalex.org/W4312794129","https://openalex.org/W4313887233","https://openalex.org/W4321021192","https://openalex.org/W4386825115","https://openalex.org/W4390416568","https://openalex.org/W4393372121","https://openalex.org/W4396576556","https://openalex.org/W4399346551","https://openalex.org/W4399526694","https://openalex.org/W4404469657","https://openalex.org/W4405755230"],"related_works":["https://openalex.org/W4412839308","https://openalex.org/W4231070408","https://openalex.org/W943151747","https://openalex.org/W2048981943","https://openalex.org/W2174331923","https://openalex.org/W2753901553","https://openalex.org/W2804368879","https://openalex.org/W4413241937","https://openalex.org/W2050175337","https://openalex.org/W4245567755"],"abstract_inverted_index":{"Forsilicon":[0],"carbide":[1],"(SiC)":[2],"MOSFET":[3],"applications,":[4],"it":[5],"has":[6],"been":[7],"a":[8,69,148,164,208,223],"constant":[9,78],"challenge":[10],"to":[11,154,170],"address":[12,63],"the":[13,47,105,109,134,145,156,172,176,179,182,186,219,235,256],"trade-off":[14],"among":[15,108],"drain-source":[16,32],"voltage":[17,33,60,132],"slew":[18],"rate":[19],"(<italic":[20,79,113],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[21,24,30,80,83,89,91,114,117,123,125,194,197,203,210],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dv</i>":[22,81,115,195],"<inline-formula":[23,82,116,196,209],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[25,84,92,118,126,198,211],"<tex-math":[26,85,93,119,127,199,212],"notation=\"LaTeX\">${}_{\\mathbf":[27,86,94,120,128,200],"{ds}}$</tex-math>":[28,87,121,201],"</inline-formula>/<italic":[29,88,122,202],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dt</i>),":[31],"spike,":[34,133],"and":[35,59,97,131,163,205,231,240],"turn-off":[36,57,187,227,250],"loss.":[37],"The":[38],"existing":[39],"active":[40,72],"gate":[41,73,110,136,150,158,184,237,258],"drivers":[42],"(AGDs)":[43],"have":[44],"not":[45],"considered":[46],"influence":[48],"of":[49,175,229],"dynamically":[50],"varying":[51,243],"drain":[52,101,244],"current,":[53,112,185],"resulting":[54],"in":[55,138,160,207,226,249],"increased":[56],"loss":[58,188,228],"spike.":[61],"To":[62],"this":[64,66],"issue,":[65],"paper":[67],"proposes":[68],"cross-cycle":[70,149],"dynamic":[71,100,165],"driver":[74,238],"(CDAGD)":[75],"that":[76],"features":[77],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dt</i>)<inline-formula":[90,124],"{max}}$</tex-math>":[95,129],"</inline-formula>":[96,215],"spike":[98],"under":[99,242],"current.":[102,245],"By":[103],"deriving":[104],"quantitative":[106],"relationship":[107],"current,drain":[111],"</inline-formula>,":[130],"optimal":[135,173,183],"currents":[137,159],"different":[139,161],"switching":[140,166],"stages":[141],"are":[142],"determined.":[143],"Furthermore,":[144],"CDAGD":[146,180,220],"incorporates":[147],"current":[151],"regulator":[152],"(CCGCR)":[153],"generate":[155],"required":[157],"stages,":[162],"timing":[167,174],"controller":[168],"(DSTC)":[169],"locate":[171],"stages.":[177],"With":[178],"providing":[181],"is":[189,252],"minimized":[190],"with":[191,234,255],"reduced":[192],"<italic":[193],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dt</i>":[204],"spike.Fabricated":[206],"notation=\"LaTeX\">$0.18\\mu":[213],"$</tex-math>":[214],"m":[216],"BCD":[217],"process,":[218],"chip":[221],"achieves":[222],"maximum":[224],"reduction":[225,248],"72.2%":[230],"37.9%":[232],"compared":[233],"conventional":[236],"(CGD)":[239],"AGD":[241],"A":[246],"45.9%":[247],"time":[251],"also":[253],"achieved":[254],"proposed":[257],"driver.":[259]},"counts_by_year":[],"updated_date":"2026-02-02T03:55:41.653505","created_date":"2025-10-10T00:00:00"}