{"id":"https://openalex.org/W4412536655","doi":"https://doi.org/10.1109/tcsi.2025.3589727","title":"Statistical Eye and BER Analysis for PAM3 Simultaneous Switching Outputs With Non-Identical On-Chip VDD and VSS Fluctuations","display_name":"Statistical Eye and BER Analysis for PAM3 Simultaneous Switching Outputs With Non-Identical On-Chip VDD and VSS Fluctuations","publication_year":2025,"publication_date":"2025-07-21","ids":{"openalex":"https://openalex.org/W4412536655","doi":"https://doi.org/10.1109/tcsi.2025.3589727"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2025.3589727","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3589727","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078697961","display_name":"Young Seop Kwon","orcid":null},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Young-Sung Kwon","raw_affiliation_strings":["Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0009-0008-5053-746X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085562709","display_name":"Jingook Kim","orcid":"https://orcid.org/0000-0001-6570-7785"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jingook Kim","raw_affiliation_strings":["Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-6570-7785","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea","institution_ids":["https://openalex.org/I48566637"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5078697961"],"corresponding_institution_ids":["https://openalex.org/I48566637"],"apc_list":null,"apc_paid":null,"fwci":0.6531,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.72211437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"73","issue":"1","first_page":"502","last_page":"512"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9731000065803528,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9638000130653381,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5180044770240784},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.4594794511795044},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3925207853317261},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3876439332962036},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3587687015533447},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2933143377304077},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.22591105103492737}],"concepts":[{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5180044770240784},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.4594794511795044},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3925207853317261},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3876439332962036},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3587687015533447},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2933143377304077},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.22591105103492737}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3589727","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3589727","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1655922156","display_name":null,"funder_award_id":"62403387","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G172774376","display_name":null,"funder_award_id":"62373305","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2213204840","display_name":null,"funder_award_id":"62422316","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3279440012","display_name":null,"funder_award_id":"2024JC-YBMS-481","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G4166784896","display_name":null,"funder_award_id":"RS-2023-00219443","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G5471145226","display_name":null,"funder_award_id":"2024JJ4014","funder_id":"https://openalex.org/F4320322843","funder_display_name":"Natural Science Foundation of\u00a0Hunan Province"},{"id":"https://openalex.org/G5561553714","display_name":null,"funder_award_id":"D5000220468","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G6717148252","display_name":null,"funder_award_id":"2024A1515010172","funder_id":"https://openalex.org/F4320337111","funder_display_name":"Basic and Applied Basic Research Foundation of Guangdong Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322843","display_name":"Natural Science Foundation of\u00a0Hunan Province","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null},{"id":"https://openalex.org/F4320337111","display_name":"Basic and Applied Basic Research Foundation of Guangdong Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1492718429","https://openalex.org/W2058723459","https://openalex.org/W2098969636","https://openalex.org/W2099571807","https://openalex.org/W2110836823","https://openalex.org/W2129153627","https://openalex.org/W2221779175","https://openalex.org/W2534187409","https://openalex.org/W2543638875","https://openalex.org/W2905687955","https://openalex.org/W2996806983","https://openalex.org/W3009425635","https://openalex.org/W3043373922","https://openalex.org/W3216159862","https://openalex.org/W4312294050","https://openalex.org/W4386634568","https://openalex.org/W4403422387"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4391375266","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885"],"abstract_inverted_index":{"Power-supply-induced":[0],"(PSI)":[1],"noise":[2,39,50],"generated":[3],"by":[4,79],"simultaneous":[5],"switching":[6],"outputs":[7],"(SSO)":[8],"is":[9,44,61,76],"a":[10,25,52,69,84],"critical":[11],"concern":[12],"in":[13,40,51],"modern":[14],"memory":[15],"systems":[16],"with":[17,68],"numerous":[18],"of":[19],"I/O":[20],"pins.":[21],"This":[22],"paper":[23],"proposes":[24],"new":[26],"statistical":[27,92],"analysis":[28,96],"method":[29,60,75],"that":[30],"accounts":[31],"for":[32,64],"both":[33],"inter-symbol-interference":[34],"(ISI)":[35],"and":[36,48,81,88,94],"SSO":[37],"PSI":[38],"scenarios":[41],"where":[42],"there":[43],"non-identical":[45],"on-chip":[46],"VDD":[47],"VSS":[49],"general":[53],"power":[54],"distribution":[55],"network":[56],"(PDN).":[57],"The":[58,74,90],"proposed":[59,91],"specifically":[62],"formulated":[63],"pulse":[65],"amplitude":[66],"modulation":[67],"three-level":[70],"(PAM3)":[71],"signaling":[72],"scheme.":[73],"rigorously":[77],"validated":[78],"measurement":[80],"simulation":[82],"using":[83],"dedicated":[85],"test":[86],"IC":[87],"PCB.":[89],"eye":[93],"BER":[95],"takes":[97],"drastically":[98],"less":[99],"computational":[100],"time":[101],"compared":[102],"to":[103],"circuit":[104],"simulations.":[105]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}