{"id":"https://openalex.org/W4410540209","doi":"https://doi.org/10.1109/tcsi.2025.3569624","title":"A 0.88 e\u203e <sub>rms</sub> 8-Mpixel 3D-Stacked Low Temporal-Noise CMOS Image Sensor With Auto-Zero Single-Slope ADC, Fast Correlated Multi-Sampling, Row-Wise Noise Reduction, and Dark Current Non-Uniformity Calibration Techniques","display_name":"A 0.88 e\u203e <sub>rms</sub> 8-Mpixel 3D-Stacked Low Temporal-Noise CMOS Image Sensor With Auto-Zero Single-Slope ADC, Fast Correlated Multi-Sampling, Row-Wise Noise Reduction, and Dark Current Non-Uniformity Calibration Techniques","publication_year":2025,"publication_date":"2025-05-20","ids":{"openalex":"https://openalex.org/W4410540209","doi":"https://doi.org/10.1109/tcsi.2025.3569624"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2025.3569624","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3569624","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049342097","display_name":"Jianxin Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianxin Wu","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100408970","display_name":"Wenjie Li","orcid":"https://orcid.org/0000-0001-7427-1688"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjie Li","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100381646","display_name":"Wang Kang","orcid":"https://orcid.org/0000-0002-3169-6034"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Kang","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020603132","display_name":"Jiaxin Kou","orcid":"https://orcid.org/0000-0002-7947-8212"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Kou","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100425191","display_name":"Liang Zhang","orcid":"https://orcid.org/0000-0002-2694-1779"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Zhang","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101647095","display_name":"Liangchen Li","orcid":"https://orcid.org/0009-0006-5698-5103"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liangchen Li","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100420104","display_name":"He Zhang","orcid":"https://orcid.org/0000-0001-9262-3106"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Zhang","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066473925","display_name":"Weisheng Zhao","orcid":"https://orcid.org/0000-0001-8088-0404"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"National Key Laboratory of Spintronics, Hangzhou International Innovation Institute, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hangzhou International Innovation Institute, National Key Laboratory of Spintronics, Beihang University, Hangzhou, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5049342097"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08841021,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"72","issue":"11","first_page":"6900","last_page":"6913"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5823087096214294},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5513920783996582},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.48484838008880615},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4533197581768036},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3859802484512329},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3356289267539978},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32406407594680786},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.29896727204322815},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.20634189248085022},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20197919011116028},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1842082142829895},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.17981967329978943},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.14646747708320618},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13900303840637207}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5823087096214294},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5513920783996582},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.48484838008880615},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4533197581768036},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3859802484512329},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3356289267539978},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32406407594680786},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.29896727204322815},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.20634189248085022},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20197919011116028},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1842082142829895},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17981967329978943},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.14646747708320618},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13900303840637207}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3569624","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3569624","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G619999071","display_name":null,"funder_award_id":"62274008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6222042852","display_name":null,"funder_award_id":"L223004","funder_id":"https://openalex.org/F4320334977","funder_display_name":"Beijing Municipal Natural Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334977","display_name":"Beijing Municipal Natural Science Foundation","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1981553874","https://openalex.org/W1985693990","https://openalex.org/W1989434712","https://openalex.org/W2011593284","https://openalex.org/W2012696426","https://openalex.org/W2021383456","https://openalex.org/W2025818514","https://openalex.org/W2051224264","https://openalex.org/W2113444870","https://openalex.org/W2140548613","https://openalex.org/W2144536291","https://openalex.org/W2144872215","https://openalex.org/W2175009324","https://openalex.org/W2197399834","https://openalex.org/W2289218194","https://openalex.org/W2409529399","https://openalex.org/W2551094164","https://openalex.org/W2591148427","https://openalex.org/W2626161432","https://openalex.org/W2767841607","https://openalex.org/W2790617964","https://openalex.org/W2891387140","https://openalex.org/W2906002075","https://openalex.org/W2958690781","https://openalex.org/W2966341337","https://openalex.org/W2968638280","https://openalex.org/W3012438093","https://openalex.org/W3015483471","https://openalex.org/W3016228989","https://openalex.org/W3090895351","https://openalex.org/W3118607677","https://openalex.org/W3133854994","https://openalex.org/W3134599322","https://openalex.org/W3135718922","https://openalex.org/W3139408821","https://openalex.org/W3158025188","https://openalex.org/W3185169430","https://openalex.org/W4212825335","https://openalex.org/W4285280748","https://openalex.org/W4323914189","https://openalex.org/W4388635705"],"related_works":["https://openalex.org/W2349576212","https://openalex.org/W1981776476","https://openalex.org/W2352535872","https://openalex.org/W1590693222","https://openalex.org/W2382967348","https://openalex.org/W2334823507","https://openalex.org/W2329660408","https://openalex.org/W2107073676","https://openalex.org/W2565551736","https://openalex.org/W2109445684"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,63,68,82,120,126,157,161,167,212],"low":[4,77],"temporal":[5,25,168],"noise,":[6],"low-power,":[7],"8-Mpixel,":[8],"rolling-shutter":[9],"(RS)-type,":[10],"back-illuminated":[11],"CMOS":[12],"image":[13,74,112],"sensor":[14],"(CIS)":[15],"employing":[16],"through":[17],"silicon":[18],"via":[19],"(TSV)":[20],"3D-stack":[21],"technology.":[22],"To":[23,72],"achieve":[24],"noise":[26,97,109,169,182,189],"less":[27],"than":[28],"1":[29],"<roman":[30,173,202],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[31,33,35,140,143,174,176,178,186,192,203,205,207,209],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">e</roman><sub":[32,175,204],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><i>rms</i></sub><sup":[34,177,206],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-</sup>,":[36,179],"we":[37,80],"explored":[38],"auto-zero":[39],"(AZ)":[40],"column":[41,84],"single-slope":[42],"(SS)":[43],"ADC":[44],"and":[45,91,94,100,110,125,149,160,194],"fast":[46],"correlated":[47],"multi-sampling":[48],"(CMS)":[49],"techniques.":[50],"The":[51,135,164],"pixel":[52,147],"signal":[53],"was":[54,117],"sampled":[55],"two":[56],"times":[57],"by":[58],"the":[59,150],"readout":[60],"circuits":[61],"using":[62,119],"9-bits":[64],"ADC,":[65],"resulting":[66],"in":[67,76],"10-bits":[69],"digital":[70],"output.":[71],"enhance":[73],"quality":[75],"light":[78],"conditions,":[79],"adopted":[81],"parity":[83],"counter":[85],"(PCC)":[86],"for":[87,106],"power":[88],"supply":[89],"stabilization":[90],"H-banding":[92],"elimination,":[93],"employed":[95],"row-wise":[96,108,188],"reduction":[98],"(RWNR)":[99],"dark-current":[101],"non-uniformity":[102],"calibration":[103],"(DCNUC)":[104],"techniques":[105],"reducing":[107],"improving":[111],"uniformity.":[113],"Our":[114],"CIS":[115,131],"chip":[116,165],"fabricated":[118],"55nm":[121,127],"1P4M":[122],"(pixel":[123],"substrate)":[124,130],"1P5M":[128],"(logic":[129],"3D":[132],"stacked":[133],"process.":[134],"die":[136],"area":[137],"is":[138,154],"~3.99<sup":[139],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">*</sup>3.45":[141],"mm<sup":[142],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[144],"with":[145],"1.008-\u03bcm":[146],"pitch":[148],"total":[151],"energy":[152,196],"consumption":[153],"170mW":[155],"under":[156],"2.8V":[158],"analog-VDD":[159],"1.2V":[162],"digital-VDD.":[163],"achieves":[166],"of":[170,184,190,200,215],"only":[171],"~0.88":[172],"fixed":[180],"pattern":[181],"(FPN)":[183],"~25.08\u03bcV<sub":[185],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><roman>rms</roman></sub>,":[187],"~5.5\u03bcV<sub":[191],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><roman>rms</roman></sub>":[193],"an":[195],"efficiency":[197],"figure-of-merit":[198],"(FoM)":[199],"~0.6":[201],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-</sup><sup":[208],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">*</sup>nJ/step":[210],"at":[211],"frame":[213],"rate":[214],"60":[216],"frames":[217],"per":[218],"second":[219],"(FPS).":[220]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}