{"id":"https://openalex.org/W4409426097","doi":"https://doi.org/10.1109/tcsi.2025.3555325","title":"Ultra-High Efficiency TRNG IP Based on Mesh Topology of Coupled-XOR","display_name":"Ultra-High Efficiency TRNG IP Based on Mesh Topology of Coupled-XOR","publication_year":2025,"publication_date":"2025-04-14","ids":{"openalex":"https://openalex.org/W4409426097","doi":"https://doi.org/10.1109/tcsi.2025.3555325"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2025.3555325","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3555325","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051724280","display_name":"Yingchun Lu","orcid":"https://orcid.org/0000-0002-2621-0933"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingchun Lu","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-2621-0933","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114206601","display_name":"Enpu Xu","orcid":"https://orcid.org/0009-0009-1375-0509"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Enpu Xu","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0009-1375-0509","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yujie Liu","orcid":"https://orcid.org/0009-0002-6929-3027"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujie Liu","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0002-6929-3027","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067207374","display_name":"Jinlin Chen","orcid":"https://orcid.org/0000-0003-3923-8844"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinlin Chen","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100736309","display_name":"Huaguo Liang","orcid":"https://orcid.org/0000-0002-0307-7236"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaguo Liang","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-0307-7236","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073810494","display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-8695-4478","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046125484","display_name":"Liang Yao","orcid":"https://orcid.org/0000-0002-4081-6499"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Yao","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-4081-6499","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":10.4269,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.98200305,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"72","issue":"6","first_page":"2754","last_page":"2767"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.977400004863739,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.691249668598175},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.5542546510696411},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47797462344169617},{"id":"https://openalex.org/keywords/mesh-networking","display_name":"Mesh networking","score":0.4462057948112488},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.3268962502479553},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32351890206336975},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19102302193641663},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1718102991580963},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13245108723640442}],"concepts":[{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.691249668598175},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.5542546510696411},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47797462344169617},{"id":"https://openalex.org/C123691950","wikidata":"https://www.wikidata.org/wiki/Q25552104","display_name":"Mesh networking","level":3,"score":0.4462057948112488},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.3268962502479553},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32351890206336975},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19102302193641663},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1718102991580963},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13245108723640442},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3555325","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3555325","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7599999904632568,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2595105183","display_name":null,"funder_award_id":"62274052","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2747975400","display_name":null,"funder_award_id":"62027815","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8535651277","display_name":null,"funder_award_id":"62174048","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1717406790","https://openalex.org/W2002572138","https://openalex.org/W2028424369","https://openalex.org/W2036535051","https://openalex.org/W2059430635","https://openalex.org/W2168400970","https://openalex.org/W2384141716","https://openalex.org/W2538926017","https://openalex.org/W2908753693","https://openalex.org/W2947486590","https://openalex.org/W2981620980","https://openalex.org/W3040688505","https://openalex.org/W3083489465","https://openalex.org/W3117204317","https://openalex.org/W3140517496","https://openalex.org/W3148717199","https://openalex.org/W3196521403","https://openalex.org/W3207886650","https://openalex.org/W4243494487","https://openalex.org/W4281754043","https://openalex.org/W4285217408","https://openalex.org/W4293370535","https://openalex.org/W4307942653","https://openalex.org/W4312377982","https://openalex.org/W4382540653","https://openalex.org/W4385065678","https://openalex.org/W4385322820","https://openalex.org/W4386928861","https://openalex.org/W4391582695","https://openalex.org/W4391609912","https://openalex.org/W4400187671","https://openalex.org/W4401406658","https://openalex.org/W4402402663","https://openalex.org/W4402557278","https://openalex.org/W4404133693","https://openalex.org/W4404209146","https://openalex.org/W4406258251"],"related_works":["https://openalex.org/W2086397253","https://openalex.org/W2133122801","https://openalex.org/W600422426","https://openalex.org/W2007156430","https://openalex.org/W3081478936","https://openalex.org/W1993031235","https://openalex.org/W2131939389","https://openalex.org/W2153585617","https://openalex.org/W2123621339","https://openalex.org/W2096219587"],"abstract_inverted_index":{"The":[0,78],"true":[1,36,68],"random":[2,10,28,37,69,80],"number":[3,38,70],"generator":[4,71],"is":[5,48],"capable":[6],"of":[7,55,100,117,131],"generating":[8],"completely":[9],"and":[11,14,27,60,65,93,102,108,134],"unpredictable":[12],"sequences,":[13],"plays":[15],"a":[16,44,52,62],"crucial":[17],"role":[18],"in":[19,40,75,129],"various":[20],"fields":[21],"such":[22],"as":[23,57],"cryptography,":[24],"encryption":[25],"communication,":[26],"algorithms.":[29],"To":[30],"meet":[31],"the":[32,76,85,105],"demand":[33],"for":[34],"high-throughput":[35],"generators":[39],"modern":[41],"high-speed":[42],"systems,":[43],"lightweight":[45],"TRNG":[46],"design":[47,125],"proposed.":[49],"It":[50,96],"utilizes":[51],"mesh":[53],"topology":[54],"coupled-XOR":[56],"entropy":[58],"source":[59],"generates":[61],"highly":[63],"compact":[64],"high":[66],"throughput":[67,99],"by":[72],"coupling":[73],"oscillators":[74],"network.":[77],"generated":[79],"sequences":[81],"have":[82],"successfully":[83],"passed":[84],"NIST":[86,90],"SP":[87,91],"800-22,":[88],"TESTU01,":[89],"800-90B,":[92],"AIS-31":[94],"tests.":[95],"achieved":[97],"ultra-high":[98],"2.1Gbps":[101],"2.4Gbps":[103],"on":[104],"Xilinx":[106],"Artix-7":[107],"Kintex-7":[109],"series":[110],"development":[111],"boards,":[112],"respectively,":[113],"achieving":[114],"efficient":[115],"utilization":[116,133],"hardware":[118],"resources.":[119],"Compared":[120],"with":[121],"other":[122],"works,":[123],"this":[124],"has":[126],"significant":[127],"advantages":[128],"terms":[130],"resource":[132],"throughput.":[135]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}