{"id":"https://openalex.org/W4408913892","doi":"https://doi.org/10.1109/tcsi.2025.3552953","title":"The Impact of Distorted Signals on the Resistance of the Current Path in a Mechanical Connector","display_name":"The Impact of Distorted Signals on the Resistance of the Current Path in a Mechanical Connector","publication_year":2025,"publication_date":"2025-03-26","ids":{"openalex":"https://openalex.org/W4408913892","doi":"https://doi.org/10.1109/tcsi.2025.3552953"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2025.3552953","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3552953","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tcsi.2025.3552953","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000304830","display_name":"\u0141ukasz Dru\u017cy\u0144ski","orcid":"https://orcid.org/0000-0001-7050-6400"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"\u0141ukasz Dru\u017cy\u0144ski","raw_affiliation_strings":["Institute of Electric Power Engineering, Poznan University of Technology, Poznań, Poland"],"raw_orcid":"https://orcid.org/0000-0001-7050-6400","affiliations":[{"raw_affiliation_string":"Institute of Electric Power Engineering, Poznan University of Technology, Poznań, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033612554","display_name":"Grzegorz Dombek","orcid":"https://orcid.org/0000-0003-3021-6024"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Grzegorz Dombek","raw_affiliation_strings":["Institute of Electric Power Engineering, Poznan University of Technology, Poznań, Poland"],"raw_orcid":"https://orcid.org/0000-0003-3021-6024","affiliations":[{"raw_affiliation_string":"Institute of Electric Power Engineering, Poznan University of Technology, Poznań, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051461880","display_name":"Andrzej Ksi\u0105\u017ckiewicz","orcid":"https://orcid.org/0000-0003-0175-6566"},"institutions":[{"id":"https://openalex.org/I4210118437","display_name":"Instytut Technik Telekomunikacyjnych i Informatycznych (Poland)","ror":"https://ror.org/02r65gs06","country_code":"PL","type":"company","lineage":["https://openalex.org/I4210118437"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Andrzej Ksi\u0105\u017ckiewicz","raw_affiliation_strings":["ASTAT Sp. z o. o., Poznań, Poland","ASTAT Sp. z o. o, Poznań, Poland"],"raw_orcid":"https://orcid.org/0000-0003-0175-6566","affiliations":[{"raw_affiliation_string":"ASTAT Sp. z o. o., Poznań, Poland","institution_ids":["https://openalex.org/I4210118437"]},{"raw_affiliation_string":"ASTAT Sp. z o. o, Poznań, Poland","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034949633","display_name":"Krzysztof Dziarski","orcid":"https://orcid.org/0000-0002-7877-4116"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Krzysztof Dziarski","raw_affiliation_strings":["Institute of Electric Power Engineering, Poznan University of Technology, Poznań, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electric Power Engineering, Poznan University of Technology, Poznań, Poland","institution_ids":["https://openalex.org/I46597724"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5182,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58654133,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"72","issue":"10","first_page":"5970","last_page":"5983"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cable-gland","display_name":"Cable gland","score":0.7624626159667969},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6605586409568787},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5952448844909668},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49720385670661926},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.46043911576271057},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4416050612926483},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3957659602165222},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3496093153953552},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34710562229156494},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.27169644832611084},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.11116835474967957}],"concepts":[{"id":"https://openalex.org/C110925319","wikidata":"https://www.wikidata.org/wiki/Q12855","display_name":"Cable gland","level":2,"score":0.7624626159667969},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6605586409568787},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5952448844909668},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49720385670661926},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.46043911576271057},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4416050612926483},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3957659602165222},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3496093153953552},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34710562229156494},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27169644832611084},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.11116835474967957}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2025.3552953","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3552953","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tcsi.2025.3552953","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2025.3552953","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.75,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1976698529","https://openalex.org/W2054254307","https://openalex.org/W2072698610","https://openalex.org/W2104348905","https://openalex.org/W2159041274","https://openalex.org/W2958589708","https://openalex.org/W3014184862","https://openalex.org/W3025777625","https://openalex.org/W3033903273","https://openalex.org/W3043160991","https://openalex.org/W3092126910","https://openalex.org/W3093974694","https://openalex.org/W3095336452","https://openalex.org/W3120024740","https://openalex.org/W3128829363","https://openalex.org/W3133443728","https://openalex.org/W3143949042","https://openalex.org/W3175644833","https://openalex.org/W3201871195","https://openalex.org/W3213078574","https://openalex.org/W3217002501","https://openalex.org/W4220976555","https://openalex.org/W4237716869","https://openalex.org/W4360584195","https://openalex.org/W4388125642","https://openalex.org/W4389945954","https://openalex.org/W4389945968","https://openalex.org/W4389980638","https://openalex.org/W4391351231","https://openalex.org/W4400448647","https://openalex.org/W4407316944"],"related_works":["https://openalex.org/W832519947","https://openalex.org/W3150514178","https://openalex.org/W2388088702","https://openalex.org/W2215963656","https://openalex.org/W2359908285","https://openalex.org/W2892897409","https://openalex.org/W1997449612","https://openalex.org/W2223366068","https://openalex.org/W1995735372","https://openalex.org/W2389972243"],"abstract_inverted_index":{"The":[0,51],"contact":[1,62],"resistance":[2,54],"of":[3,30,81,103],"the":[4,18,23,28,31,61,65,76,82,104,108],"current":[5,14,24,42,67,106],"path":[6],"in":[7,38,46,53,107,112,120],"a":[8,74,95],"mechanical":[9,109],"connector":[10,83],"increases":[11],"with":[12,40,48],"rising":[13],"frequency":[15],"due":[16],"to":[17,25,56,70],"skin":[19],"effect,":[20],"which":[21],"causes":[22],"concentrate":[26],"near":[27],"surface":[29],"conductor.":[32],"This":[33],"phenomenon":[34],"is":[35],"particularly":[36],"significant":[37],"circuits":[39],"distorted":[41],"waveforms,":[43],"often":[44],"found":[45],"systems":[47],"non-linear":[49],"loads.":[50],"increase":[52],"leads":[55],"higher":[57],"power":[58],"losses":[59],"within":[60],"system":[63],"and":[64,79,118],"entire":[66],"path,":[68],"contributing":[69],"excessive":[71],"heating.":[72],"As":[73],"result,":[75],"operational":[77],"reliability":[78],"lifespan":[80],"can":[84],"be":[85],"significantly":[86],"reduced.":[87],"To":[88],"address":[89],"this":[90,92],"issue,":[91],"study":[93],"determines":[94],"correction":[96],"factor":[97],"that":[98],"allows":[99],"for":[100],"proper":[101],"adjustment":[102],"rated":[105],"connectors":[110],"used":[111],"such":[113],"conditions,":[114],"ensuring":[115],"improved":[116],"performance":[117],"durability":[119],"practical":[121],"applications.":[122]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}