{"id":"https://openalex.org/W4406258823","doi":"https://doi.org/10.1109/tcsi.2024.3525387","title":"Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations","display_name":"Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations","publication_year":2025,"publication_date":"2025-01-10","ids":{"openalex":"https://openalex.org/W4406258823","doi":"https://doi.org/10.1109/tcsi.2024.3525387"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2024.3525387","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3525387","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/2078.1/299513","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047738832","display_name":"L\u00e9opold Van Brandt","orcid":"https://orcid.org/0000-0003-4361-6537"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"L\u00e9opold Van Brandt","raw_affiliation_strings":["Institute for Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université catholique de Louvain (UCLouvain), Ottignies-Louvain-la-Neuve, Belgium"],"raw_orcid":"https://orcid.org/0000-0003-4361-6537","affiliations":[{"raw_affiliation_string":"Institute for Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université catholique de Louvain (UCLouvain), Ottignies-Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053494231","display_name":"Michele Bonnin","orcid":"https://orcid.org/0000-0002-9106-563X"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Michele Bonnin","raw_affiliation_strings":["Department of Electronics and Telecommunications, Politecnico di Torino, Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0002-9106-563X","affiliations":[{"raw_affiliation_string":"Department of Electronics and Telecommunications, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003461144","display_name":"Maur\u00edcio Banaszeski da Silva","orcid":"https://orcid.org/0000-0001-7434-6432"},"institutions":[{"id":"https://openalex.org/I33501960","display_name":"Universidade Federal de Santa Maria","ror":"https://ror.org/01b78mz79","country_code":"BR","type":"education","lineage":["https://openalex.org/I33501960"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Mauricio Banaszeski da Silva","raw_affiliation_strings":["Department of Electronics and Computing, Universidade Federal de Santa Maria, Santa Maria, Brazil"],"raw_orcid":"https://orcid.org/0000-0001-7434-6432","affiliations":[{"raw_affiliation_string":"Department of Electronics and Computing, Universidade Federal de Santa Maria, Santa Maria, Brazil","institution_ids":["https://openalex.org/I33501960"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080398625","display_name":"P. Bolcato","orcid":"https://orcid.org/0000-0002-1594-2485"},"institutions":[{"id":"https://openalex.org/I4210138743","display_name":"Siemens (France)","ror":"https://ror.org/04q9w3z30","country_code":"FR","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210138743"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Pascal Bolcato","raw_affiliation_strings":["Siemens DISW-ICS-CICV, Meylan, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens DISW-ICS-CICV, Meylan, France","institution_ids":["https://openalex.org/I4210138743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022015482","display_name":"Gilson Wirth","orcid":"https://orcid.org/0000-0002-4990-5113"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Gilson I. Wirth","raw_affiliation_strings":["Electrical Engineering Department, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil"],"raw_orcid":"https://orcid.org/0000-0002-4990-5113","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064026729","display_name":"Denis Flandre","orcid":"https://orcid.org/0000-0001-5298-5196"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Denis Flandre","raw_affiliation_strings":["Institute for Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université catholique de Louvain (UCLouvain), Ottignies-Louvain-la-Neuve, Belgium"],"raw_orcid":"https://orcid.org/0000-0001-5298-5196","affiliations":[{"raw_affiliation_string":"Institute for Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université catholique de Louvain (UCLouvain), Ottignies-Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006354562","display_name":"Jean\u2010Charles Delvenne","orcid":"https://orcid.org/0000-0003-2356-7790"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jean-Charles Delvenne","raw_affiliation_strings":["Institute for Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université catholique de Louvain (UCLouvain), Ottignies-Louvain-la-Neuve, Belgium"],"raw_orcid":"https://orcid.org/0000-0003-2356-7790","affiliations":[{"raw_affiliation_string":"Institute for Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université catholique de Louvain (UCLouvain), Ottignies-Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.7011,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.92651902,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"72","issue":"3","first_page":"989","last_page":"1002"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.8124948740005493},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.651174008846283},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5983172059059143},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5304015874862671},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4902806580066681},{"id":"https://openalex.org/keywords/leverage","display_name":"Leverage (statistics)","score":0.4882080852985382},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.48774152994155884},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4633171558380127},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44731199741363525},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.43561381101608276},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2540554106235504},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10911825299263},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10654720664024353}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.8124948740005493},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.651174008846283},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5983172059059143},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5304015874862671},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4902806580066681},{"id":"https://openalex.org/C153083717","wikidata":"https://www.wikidata.org/wiki/Q6535263","display_name":"Leverage (statistics)","level":2,"score":0.4882080852985382},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.48774152994155884},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4633171558380127},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44731199741363525},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.43561381101608276},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2540554106235504},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10911825299263},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10654720664024353},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2024.3525387","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3525387","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:dial.uclouvain.be:boreal:299513","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/299513","pdf_url":null,"source":{"id":"https://openalex.org/S4306400166","display_name":"Digital Access to Libraries","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2800384882","host_organization_name":"Harris County Public Library","host_organization_lineage":["https://openalex.org/I2800384882"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Circuits and Systems Part 1: Regular Papers, Vol. 72, no.34, p. 989-1002 (2025)","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:dial.uclouvain.be:boreal:299513","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/299513","pdf_url":null,"source":{"id":"https://openalex.org/S4306400166","display_name":"Digital Access to Libraries","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2800384882","host_organization_name":"Harris County Public Library","host_organization_lineage":["https://openalex.org/I2800384882"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Circuits and Systems Part 1: Regular Papers, Vol. 72, no.34, p. 989-1002 (2025)","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W1966298615","https://openalex.org/W1972573758","https://openalex.org/W1974982221","https://openalex.org/W1993141951","https://openalex.org/W1998525920","https://openalex.org/W2002612140","https://openalex.org/W2017195664","https://openalex.org/W2067168777","https://openalex.org/W2070078286","https://openalex.org/W2085266415","https://openalex.org/W2089876099","https://openalex.org/W2095816496","https://openalex.org/W2097579177","https://openalex.org/W2101187147","https://openalex.org/W2106339466","https://openalex.org/W2108324407","https://openalex.org/W2115599792","https://openalex.org/W2124586558","https://openalex.org/W2128150161","https://openalex.org/W2144289559","https://openalex.org/W2145137020","https://openalex.org/W2148987260","https://openalex.org/W2164877040","https://openalex.org/W2324260467","https://openalex.org/W2325583317","https://openalex.org/W2615230521","https://openalex.org/W2663676378","https://openalex.org/W2783948492","https://openalex.org/W2942228371","https://openalex.org/W2950226693","https://openalex.org/W3026362849","https://openalex.org/W3111970305","https://openalex.org/W3133079566","https://openalex.org/W3135258029","https://openalex.org/W4225827639","https://openalex.org/W4238757113","https://openalex.org/W4254168948","https://openalex.org/W4255246482","https://openalex.org/W4285106596","https://openalex.org/W4362596727","https://openalex.org/W4382396365","https://openalex.org/W4385337440","https://openalex.org/W4388240490","https://openalex.org/W4395661976","https://openalex.org/W4396710839","https://openalex.org/W4396941588","https://openalex.org/W6681624446"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W57337972","https://openalex.org/W2313216219","https://openalex.org/W1561306903","https://openalex.org/W2563702065"],"abstract_inverted_index":{"Stability":[0],"of":[1,13,52,64,183],"ultra-low-voltage":[2],"SRAM":[3,140],"bitcells":[4,31],"in":[5,29,41,56,83],"retention":[6,94],"mode":[7],"is":[8,114,126,154],"threatened":[9],"by":[10],"two":[11],"types":[12],"uncertainty:":[14],"process":[15,53],"variability":[16,21],"and":[17,77,116,162],"intrinsic":[18],"noise.":[19],"While":[20],"dominates":[22],"the":[23,62,84,122,134,165,180],"failure":[24,119,169],"probability,":[25],"noise-induced":[26],"bit":[27],"flips":[28],"weakened":[30],"lead":[32],"to":[33,89,98,160,168,177],"dynamic":[34,118,135],"instability.":[35],"We":[36,128,156],"study":[37],"both":[38],"effects":[39],"jointly":[40],"a":[42,49,57,75,91,102,117,143],"unified":[43],"SPICE":[44,152],"simulation":[45],"framework.":[46],"Starting":[47],"from":[48,149],"synthetic":[50],"representation":[51],"variations":[54],"introduced":[55],"previous":[58],"work,":[59],"we":[60,80],"identify":[61],"cases":[63],"poor":[65],"noise":[66,71,136],"immunity":[67],"that":[68],"require":[69],"thorough":[70],"analyses.":[72],"Relying":[73],"on":[74],"rigorous":[76],"systematic":[78],"methodology,":[79],"simulate":[81],"them":[82],"time":[85,167],"domain":[86],"so":[87],"as":[88],"emulate":[90],"true":[92],"data":[93],"operation.":[95],"Short":[96],"times":[97],"failure,":[99],"unacceptable":[100],"for":[101,179],"practical":[103],"ultra-low-power":[104],"memory":[105],"system":[106],"application,":[107],"are":[108],"recorded.":[109],"The":[110],"transient":[111],"bit-flip":[112],"mechanism":[113],"analyzed":[115],"criterion":[120],"involving":[121],"unstable":[123],"steady":[124],"state":[125],"established.":[127],"conclude":[129],"that,":[130],"beyond":[131],"static":[132],"variability,":[133],"inflates":[137],"defectiveness":[138],"among":[139],"bitcells.":[141],"Then,":[142],"stochastic":[144],"nonlinear":[145,184],"model,":[146],"fully":[147],"characterizable":[148],"conventional":[150],"deterministic":[151],"simulations,":[153],"presented.":[155],"then":[157],"leverage":[158],"it":[159],"efficiently":[161],"accurately":[163],"predict":[164],"mean":[166],"with":[170],"an":[171],"analytical":[172],"Eyring-Kramers":[173],"formula,":[174],"recently":[175],"extended":[176],"account":[178],"varying-noise":[181],"behavior":[182],"systems.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}