{"id":"https://openalex.org/W4406856630","doi":"https://doi.org/10.1109/tcsi.2024.3522193","title":"State-of-the-Art ASCON ASIC Achieving 4.3 Gbps@0.8V and 3.5Tb/J@0.6V Outperforming AES by 25 Times","display_name":"State-of-the-Art ASCON ASIC Achieving 4.3 Gbps@0.8V and 3.5Tb/J@0.6V Outperforming AES by 25 Times","publication_year":2025,"publication_date":"2025-01-27","ids":{"openalex":"https://openalex.org/W4406856630","doi":"https://doi.org/10.1109/tcsi.2024.3522193"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2024.3522193","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3522193","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052095277","display_name":"Islam Elsadek","orcid":null},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Islam Elsadek","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"raw_orcid":"https://orcid.org/0009-0008-8565-8923","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034565515","display_name":"Elsayed Elgendy","orcid":null},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Elsayed Elgendy","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107509452","display_name":"Sherif Abouzeid","orcid":"https://orcid.org/0009-0007-9150-6902"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sherif Abouzeid","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"raw_orcid":"https://orcid.org/0009-0007-9150-6902","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5099841389","display_name":"Ahmed Zaky Ghonem","orcid":null},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ahmed Zaky Ghonem","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059644590","display_name":"John Ross Wallrabenstein","orcid":"https://orcid.org/0009-0002-9165-9961"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Ross Wallrabenstein","raw_affiliation_strings":["Analog Devices, Wilmington, MA, USA"],"raw_orcid":"https://orcid.org/0009-0002-9165-9961","affiliations":[{"raw_affiliation_string":"Analog Devices, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086586870","display_name":"Erik MacLean","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Erik MacLean","raw_affiliation_strings":["Analog Devices, Wilmington, MA, USA"],"raw_orcid":"https://orcid.org/0009-0000-0666-2855","affiliations":[{"raw_affiliation_string":"Analog Devices, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076644736","display_name":"Douglas J. Gardner","orcid":"https://orcid.org/0009-0001-4780-9312"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Douglas Gardner","raw_affiliation_strings":["Analog Devices, Wilmington, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Devices, Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008154852","display_name":"Sohrab Aftabjahani","orcid":"https://orcid.org/0000-0001-8906-2934"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sohrab Aftabjahani","raw_affiliation_strings":["Intel Labs, Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Labs, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085883266","display_name":"Rosario Cammarota","orcid":"https://orcid.org/0000-0002-2965-8987"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rosario Cammarota","raw_affiliation_strings":["Intel Labs, Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Labs, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022043428","display_name":"Eslam Yahya Tawfik","orcid":null},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eslam Yahya Tawfik","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5052095277"],"corresponding_institution_ids":["https://openalex.org/I52357470"],"apc_list":null,"apc_paid":null,"fwci":3.1996,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.90935332,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"72","issue":"8","first_page":"4021","last_page":"4030"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.837031364440918},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5016818046569824},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49338212609291077},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4815954864025116},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2869446575641632},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22970914840698242},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2147047519683838}],"concepts":[{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.837031364440918},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5016818046569824},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49338212609291077},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4815954864025116},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2869446575641632},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22970914840698242},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2147047519683838}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2024.3522193","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3522193","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1958047932","https://openalex.org/W1996182770","https://openalex.org/W2944124981","https://openalex.org/W2947881701","https://openalex.org/W2951836184","https://openalex.org/W2955982644","https://openalex.org/W2979494553","https://openalex.org/W2999869260","https://openalex.org/W3011018500","https://openalex.org/W3023559278","https://openalex.org/W3040359258","https://openalex.org/W3045281960","https://openalex.org/W3134559703","https://openalex.org/W3137938560","https://openalex.org/W3174718738","https://openalex.org/W3186403298","https://openalex.org/W4206767789","https://openalex.org/W4220798178","https://openalex.org/W4254214383","https://openalex.org/W4256465165","https://openalex.org/W4304140744","https://openalex.org/W4311224134","https://openalex.org/W4312334343","https://openalex.org/W4384996345","https://openalex.org/W4387089106","https://openalex.org/W4394848955","https://openalex.org/W4401210351","https://openalex.org/W6802179335"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2165367082","https://openalex.org/W1972641423","https://openalex.org/W611446063","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345"],"abstract_inverted_index":{"NIST":[0],"selected":[1],"ASCON":[2,35,119,138,171,223],"as":[3],"the":[4,58,74,89,113,131,135,155,163,216,225,233],"standard":[5,33,63,127],"Lightweight":[6],"Cryptography":[7],"(LWC)":[8],"algorithm":[9],"in":[10,99,112,200,238],"2023.":[11],"ASCON\u2019s":[12],"implementations":[13,65,221],"promise":[14],"bringing":[15],"lightweight":[16],"Authenticated":[17],"Encryption":[18,25],"(AEAD)":[19],"to":[20,94,151,231],"resource-constrained":[21],"devices":[22],"surpassing":[23],"Advanced":[24],"Standard":[26],"(AES)":[27],"implementations.":[28],"In":[29],"this":[30,160],"work,":[31],"a":[32,54,77,126,167,175],"compliant":[34,64],"Application":[36],"Specific":[37],"Integrated":[38],"Circuit":[39],"(ASIC)":[40],"hardware":[41,78],"(HW)":[42],"is":[43,69,76,122,162],"designed":[44],"and":[45,73,102,108,117,145,182,187,195,242],"fabricated":[46,133],"using":[47],"CMOS":[48],"GF22FDx":[49,210],"technology.":[50],"This":[51],"study":[52],"provides":[53],"quantitative":[55],"assessment":[56,84],"of":[57,66,97,130,142,157,177,190,222,235],"HW":[59,87,116,121,128],"with":[60,125],"two":[61],"other":[62,75],"ASCON.":[67],"One":[68],"software":[70],"implementation":[71,91,129,173,226],"(SW),":[72],"accelerated":[79],"(HW/SW":[80],"co-design)":[81],"implementation.":[82],"The":[83],"shows":[85],"that":[86],"outperforms":[88],"SW":[90],"by":[92,149],"up":[93,150],"three":[95],"orders":[96],"magnitude":[98],"energy":[100,109,147,188],"efficiency":[101,110,148,189],"throughput,":[103],"whereas":[104],"HW/SW":[105],"co-design":[106],"throughput":[107,176],"falls":[111],"middle":[114],"between":[115,219],"software.":[118],"ASIC":[120,172],"also":[123],"compared":[124],"AES":[132],"over":[134],"same":[136],"chip.":[137],"uses":[139],"only":[140],"39%":[141],"AES\u2019s":[143],"area":[144],"boosts":[146],"25":[152],"times.":[153],"To":[154],"best":[156],"our":[158],"knowledge,":[159],"work":[161,165],"first":[164],"providing":[166],"silicon-based":[168],"analysis":[169],"for":[170,228],"reaching":[174],"4.3":[178],"Gbps":[179,184],"@":[180,185,193,198,213],"0.8V":[181,194],"2":[183],"0.6V,":[186],"1.9":[191],"Tb/J":[192,197],"3.5":[196],"0.6V":[199],"<inline-formula":[201],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[202],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[203],"<tex-math":[204],"notation=\"LaTeX\">$2505~\\mu":[205],"$":[206],"</tex-math></inline-formula>":[207],"m2":[208],"on":[209],"at":[211],"620MHz":[212],"0.8V.":[214],"Furthermore,":[215],"comparative":[217],"assessments":[218],"different":[220],"guides":[224],"choice":[227],"specific":[229],"deployments":[230],"meet":[232],"demands":[234],"secure":[236],"processing":[237],"dust-size":[239],"sensors,":[240],"edge":[241],"IoT.":[243]},"counts_by_year":[{"year":2025,"cited_by_count":5}],"updated_date":"2026-05-03T08:25:01.440150","created_date":"2025-10-10T00:00:00"}