{"id":"https://openalex.org/W4405907026","doi":"https://doi.org/10.1109/tcsi.2024.3506999","title":"FACET: On-the-Fly Activation Compression for Efficient Transformer Training","display_name":"FACET: On-the-Fly Activation Compression for Efficient Transformer Training","publication_year":2024,"publication_date":"2024-12-30","ids":{"openalex":"https://openalex.org/W4405907026","doi":"https://doi.org/10.1109/tcsi.2024.3506999"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2024.3506999","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3506999","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Seungyong Lee","orcid":"https://orcid.org/0009-0001-5461-9234"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungyong Lee","raw_affiliation_strings":["Inter-University of Semiconductor Research Center (ISRC), Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0009-0001-5461-9234","affiliations":[{"raw_affiliation_string":"Inter-University of Semiconductor Research Center (ISRC), Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104140397","display_name":"Geonu Yun","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Geonu Yun","raw_affiliation_strings":["Inter-University of Semiconductor Research Center (ISRC), Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","Department of Electrical and Computer Engineering, Inter-University of Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inter-University of Semiconductor Research Center (ISRC), Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Inter-University of Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014900695","display_name":"Xuan Truong Nguyen","orcid":"https://orcid.org/0000-0002-7527-6971"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]},{"id":"https://openalex.org/I4210089054","display_name":"Seoul Semiconductor (South Korea)","ror":"https://ror.org/007vmjm88","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210089054"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Xuan Truong Nguyen","raw_affiliation_strings":["Department of Next-Generation Semiconductor Convergence and Open Sharing System (COSS) and the System Semiconductor for AI Engineering (SSAI) Program, the Department of Electrical Engineering, Seoul National University, Seoul, South Korea","the Department of Electrical Engineering, Department of Next-Generation Semiconductor Convergence and Open Sharing System (COSS) and the System Semiconductor for AI Engineering (SSAI) Program, Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7527-6971","affiliations":[{"raw_affiliation_string":"Department of Next-Generation Semiconductor Convergence and Open Sharing System (COSS) and the System Semiconductor for AI Engineering (SSAI) Program, the Department of Electrical Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I4210089054"]},{"raw_affiliation_string":"the Department of Electrical Engineering, Department of Next-Generation Semiconductor Convergence and Open Sharing System (COSS) and the System Semiconductor for AI Engineering (SSAI) Program, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024723558","display_name":"Hyuk\u2010Jae Lee","orcid":"https://orcid.org/0000-0001-6811-9647"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyuk-Jae Lee","raw_affiliation_strings":["Inter-University of Semiconductor Research Center (ISRC), Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","Department of Electrical and Computer Engineering, Inter-University of Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-6811-9647","affiliations":[{"raw_affiliation_string":"Inter-University of Semiconductor Research Center (ISRC), Department of Electrical and Computer Engineering, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Inter-University of Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1864,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49755615,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"72","issue":"8","first_page":"4091","last_page":"4102"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9706000089645386,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.574303388595581},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4694520831108093},{"id":"https://openalex.org/keywords/on-the-fly","display_name":"On the fly","score":0.42626166343688965},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4033915102481842},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37469106912612915},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.257367879152298},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18697649240493774}],"concepts":[{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.574303388595581},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4694520831108093},{"id":"https://openalex.org/C2781020372","wikidata":"https://www.wikidata.org/wiki/Q533093","display_name":"On the fly","level":2,"score":0.42626166343688965},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4033915102481842},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37469106912612915},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.257367879152298},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18697649240493774},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2024.3506999","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3506999","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W2052440657","https://openalex.org/W2060108852","https://openalex.org/W2114668191","https://openalex.org/W2338908902","https://openalex.org/W2486202470","https://openalex.org/W2516109628","https://openalex.org/W2896457183","https://openalex.org/W2962821792","https://openalex.org/W2982317364","https://openalex.org/W3000623753","https://openalex.org/W3034999214","https://openalex.org/W3139163275","https://openalex.org/W3158338328","https://openalex.org/W3189166979","https://openalex.org/W3205827906","https://openalex.org/W3216308415","https://openalex.org/W4229005866","https://openalex.org/W4280611847","https://openalex.org/W4288089799","https://openalex.org/W4288346545","https://openalex.org/W4297812065","https://openalex.org/W4307079201","https://openalex.org/W4322718191","https://openalex.org/W4383501753","https://openalex.org/W4384918448","https://openalex.org/W4385245566","https://openalex.org/W4387725429","https://openalex.org/W4389664586","https://openalex.org/W4390871466","https://openalex.org/W4393407138","https://openalex.org/W4401863489","https://openalex.org/W6703652217","https://openalex.org/W6755207826","https://openalex.org/W6763653508","https://openalex.org/W6769311223","https://openalex.org/W6769627184","https://openalex.org/W6799372109","https://openalex.org/W6804415461","https://openalex.org/W6811340617","https://openalex.org/W6838632916","https://openalex.org/W6840918055","https://openalex.org/W6843734122","https://openalex.org/W6847076894","https://openalex.org/W6850625674","https://openalex.org/W6854866820","https://openalex.org/W6856450038","https://openalex.org/W6857944484","https://openalex.org/W6865118152"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2864363823"],"abstract_inverted_index":{"Training":[0],"Transformer":[1,68,86,140],"models,":[2],"known":[3],"for":[4,39,48],"their":[5],"outstanding":[6],"performance":[7],"in":[8,168],"various":[9],"tasks,":[10],"can":[11],"be":[12],"challenging":[13],"due":[14],"to":[15,26,72,127,202],"extensive":[16],"training":[17,33],"times":[18],"and":[19,31,89,101,109,120,124,144,170,181,185],"substantial":[20],"memory":[21,29,46,151,215],"requirements.":[22],"One":[23],"promising":[24],"approach":[25],"minimize":[27],"the":[28,44,64,107,174,221,225],"footprint":[30],"accelerate":[32],"is":[34],"compressing":[35],"activations,":[36,69],"which":[37],"account":[38],"more":[40],"than":[41],"half":[42],"of":[43,67,111,224],"total":[45],"usage":[47],"large":[49],"batch":[50],"sizes.":[51],"However,":[52],"conventional":[53],"compression":[54,99,104],"schemes,":[55],"such":[56],"as":[57],"FP8":[58],"quantization,":[59],"may":[60],"not":[61],"adequately":[62],"represent":[63],"dynamic":[65],"range":[66],"potentially":[70],"leading":[71],"unsatisfactory":[73],"accuracy.":[74],"To":[75],"address":[76],"this":[77],"issue,":[78],"we":[79],"propose":[80,207],"FACET,":[81],"a":[82,97,102,128,191,208],"lightweight":[83],"yet":[84],"effective":[85],"activation":[87,112,150],"compressor":[88,95,167,213],"its":[90],"corresponding":[91],"hardware":[92,169],"design.":[93],"This":[94],"comprises":[96],"base-delta":[98],"(BDC)":[100],"bit-plane":[103],"(BPC),":[105],"targeting":[106],"exponent":[108],"sign/mantissa":[110],"data,":[113],"respectively.":[114],"The":[115,179],"bitstreams":[116],"generated":[117],"by":[118,152],"BDC":[119],"BPC":[121],"are":[122],"concatenated":[123],"then":[125],"truncated":[126],"target":[129],"size,":[130],"e.g.,":[131],"8":[132],"bits":[133],"per":[134],"data.":[135],"Experimental":[136],"results":[137],"with":[138,160,216],"popular":[139],"models":[141],"(BERT,":[142],"GPT-2,":[143],"T5)":[145],"indicate":[146],"that":[147,210],"FACET":[148],"reduces":[149],"2-<inline-formula":[153],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[154,193],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[155,194],"<tex-math":[156,195],"notation=\"LaTeX\">$4\\times":[157],"$":[158,197],"</tex-math></inline-formula>,":[159],"negligible":[161],"accuracy":[162],"degradation.":[163],"We":[164,205],"implemented":[165],"our":[166,212],"synthesized":[171],"it":[172],"using":[173],"45nm":[175],"TSMC":[176],"process":[177],"library.":[178],"encoder":[180],"decoder":[182],"require":[183],"16K":[184],"12K":[186],"gate":[187],"counts,":[188],"respectively,":[189],"exhibiting":[190],"2.2-<inline-formula":[192],"notation=\"LaTeX\">$3.8\\times":[196],"</tex-math></inline-formula>":[198],"smaller":[199],"overhead":[200,223],"compared":[201],"other":[203],"compressors.":[204],"also":[206],"system":[209,218],"integrates":[211],"within":[214],"minimal":[217],"modifications,":[219],"leveraging":[220],"small":[222],"compressor.":[226]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}