{"id":"https://openalex.org/W4404520272","doi":"https://doi.org/10.1109/tcsi.2024.3493760","title":"An 88.5 fs<sub>rms</sub> Integrated Jitter and \u221276.2 dBc Reference Spur mmW PLL Utilizing a Ripple Compensation Phase/Frequency Detector","display_name":"An 88.5 fs<sub>rms</sub> Integrated Jitter and \u221276.2 dBc Reference Spur mmW PLL Utilizing a Ripple Compensation Phase/Frequency Detector","publication_year":2024,"publication_date":"2024-11-19","ids":{"openalex":"https://openalex.org/W4404520272","doi":"https://doi.org/10.1109/tcsi.2024.3493760"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2024.3493760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3493760","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062214970","display_name":"Yuan Liang","orcid":"https://orcid.org/0000-0003-0640-8544"},"institutions":[{"id":"https://openalex.org/I37987034","display_name":"Guangzhou University","ror":"https://ror.org/05ar8rn06","country_code":"CN","type":"education","lineage":["https://openalex.org/I37987034"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Liang","raw_affiliation_strings":["School of Electronics and Communication Engineering, Guangzhou University, Guangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Communication Engineering, Guangzhou University, Guangzhou, China","institution_ids":["https://openalex.org/I37987034"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Wen Jin","orcid":"https://orcid.org/0009-0007-7453-1380"},"institutions":[{"id":"https://openalex.org/I37987034","display_name":"Guangzhou University","ror":"https://ror.org/05ar8rn06","country_code":"CN","type":"education","lineage":["https://openalex.org/I37987034"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen Jin","raw_affiliation_strings":["School of Electronics and Communication Engineering, Guangzhou University, Guangzhou, China"],"raw_orcid":"https://orcid.org/0009-0007-7453-1380","affiliations":[{"raw_affiliation_string":"School of Electronics and Communication Engineering, Guangzhou University, Guangzhou, China","institution_ids":["https://openalex.org/I37987034"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057484459","display_name":"Zhongyuan Fang","orcid":"https://orcid.org/0000-0002-6499-4353"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongyuan Fang","raw_affiliation_strings":["School of Integrated Circuits, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-6499-4353","affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046207386","display_name":"Quan Cheng","orcid":"https://orcid.org/0000-0001-5519-3258"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Quan Cheng","raw_affiliation_strings":["Department of Informatics, Kyoto University, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0000-0001-5519-3258","affiliations":[{"raw_affiliation_string":"Department of Informatics, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Department of Informatics, Kyoto University, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0000-0002-0377-2108","affiliations":[{"raw_affiliation_string":"Department of Informatics, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1731,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.50543502,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"72","issue":"9","first_page":"4570","last_page":"4583"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.8305968046188354},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.7691670656204224},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.7405096292495728},{"id":"https://openalex.org/keywords/spur","display_name":"Spur","score":0.7062596678733826},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6489444971084595},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.6068291068077087},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.5430024266242981},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4907184839248657},{"id":"https://openalex.org/keywords/phase-compensation","display_name":"Phase compensation","score":0.49056094884872437},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.4871980547904968},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.45371824502944946},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3963070511817932},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3851016163825989},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.34859317541122437},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34056851267814636},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33897513151168823},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3389347493648529},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16809183359146118},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08068618178367615}],"concepts":[{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.8305968046188354},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.7691670656204224},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.7405096292495728},{"id":"https://openalex.org/C2779821383","wikidata":"https://www.wikidata.org/wiki/Q7581537","display_name":"Spur","level":2,"score":0.7062596678733826},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6489444971084595},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.6068291068077087},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.5430024266242981},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4907184839248657},{"id":"https://openalex.org/C2984249346","wikidata":"https://www.wikidata.org/wiki/Q185553","display_name":"Phase compensation","level":3,"score":0.49056094884872437},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.4871980547904968},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.45371824502944946},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3963070511817932},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3851016163825989},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.34859317541122437},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34056851267814636},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33897513151168823},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3389347493648529},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16809183359146118},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08068618178367615},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2024.3493760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3493760","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7099999785423279}],"awards":[{"id":"https://openalex.org/G2505473677","display_name":null,"funder_award_id":"62301176","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5130374821","display_name":null,"funder_award_id":"2024A1515010236","funder_id":"https://openalex.org/F4320337111","funder_display_name":"Basic and Applied Basic Research Foundation of Guangdong Province"},{"id":"https://openalex.org/G522892186","display_name":"Development of foundational technology for reliability assessment of next-generation integrated systems to overcome cosmic ray-induced malfunctions","funder_award_id":"24H00073","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G6550208139","display_name":null,"funder_award_id":"JP19H05664","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"},{"id":"https://openalex.org/F4320337111","display_name":"Basic and Applied Basic Research Foundation of Guangdong Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1991437976","https://openalex.org/W2045931267","https://openalex.org/W2051032039","https://openalex.org/W2097406868","https://openalex.org/W2142738044","https://openalex.org/W2154331325","https://openalex.org/W2292034224","https://openalex.org/W2295656041","https://openalex.org/W2593363175","https://openalex.org/W2615495734","https://openalex.org/W2791440917","https://openalex.org/W2792808087","https://openalex.org/W2793607050","https://openalex.org/W2800076889","https://openalex.org/W2898268564","https://openalex.org/W2915710085","https://openalex.org/W2921046765","https://openalex.org/W2991104809","https://openalex.org/W3015425606","https://openalex.org/W3015426490","https://openalex.org/W3015749170","https://openalex.org/W3081194669","https://openalex.org/W3092160120","https://openalex.org/W3159671219","https://openalex.org/W3198525795","https://openalex.org/W4214735590","https://openalex.org/W4220669729","https://openalex.org/W4310055006","https://openalex.org/W4312261872","https://openalex.org/W4360606992"],"related_works":["https://openalex.org/W2776212486","https://openalex.org/W4404353518","https://openalex.org/W2049525097","https://openalex.org/W2964943829","https://openalex.org/W2516063142","https://openalex.org/W2372909716","https://openalex.org/W2326560183","https://openalex.org/W2295601265","https://openalex.org/W2148370333","https://openalex.org/W2936029881"],"abstract_inverted_index":{"Millimeter-wave":[0],"(mmW)":[1],"phase-locked":[2],"loops":[3],"(PLLs)":[4],"typically":[5],"favor":[6],"a":[7,20,40,65,84,142],"wide":[8],"loop":[9,49],"bandwidth":[10,50],"for":[11,46],"stronger":[12],"suppression":[13,54],"of":[14,30,64,67,129,145],"the":[15,28,33,80,98,101],"out-of-band":[16],"phase":[17,43,52],"noise":[18,53],"from":[19,117],"voltage-controlled":[21],"oscillator":[22],"(VCO).":[23],"Unfortunately,":[24],"doing":[25],"so":[26],"lowers":[27],"degree":[29],"attenuation":[31],"to":[32,93,119,134],"PLL":[34,48,104,115],"reference":[35,57,127],"spurs.":[36],"This":[37],"paper":[38],"proposes":[39],"ripple":[41,72,77],"compensation":[42],"detector":[44],"(RCPD)":[45],"extending":[47],"and":[51,126,137],"without":[55],"sacrificing":[56],"spur":[58,128],"performance.":[59],"The":[60,113],"RCPD":[61,86],"inherently":[62],"consists":[63],"pair":[66],"PDs":[68],"that":[69],"generate":[70],"respective":[71],"simultaneously,":[73],"with":[74,141],"each":[75],"PD\u2019s":[76],"current":[78],"compensating":[79],"other,":[81],"resulting":[82],"in":[83],"glitch-free":[85],"output.":[87],"A":[88],"calibrator":[89],"is":[90],"also":[91],"introduced":[92],"reduce":[94],"device":[95],"mismatches.":[96],"With":[97],"proposed":[99,102],"techniques,":[100],"mmW":[103,114],"was":[105],"implemented":[106],"using":[107],"22":[108],"nm":[109],"bulk":[110],"CMOS":[111],"technology.":[112],"operates":[116],"32.7":[118],"39.4":[120],"GHz,":[121],"achieving":[122],"an":[123],"integrated":[124],"jitter":[125],"88.5":[130],"fsrms":[131],"(1":[132],"kHz":[133],"100":[135],"MHz)":[136],"\u201376.2":[138],"dBc,":[139],"respectively,":[140],"figure-of-merit":[143],"(FoM)":[144],"\u2013247.5":[146],"dB.":[147]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2024-11-20T00:00:00"}