{"id":"https://openalex.org/W4403758725","doi":"https://doi.org/10.1109/tcsi.2024.3447276","title":"A 1.1 V-Programmable Metal-Fuse Technology With Current-Mode Programming and Program-Guarantee Technique in 28 nm CMOS Technology","display_name":"A 1.1 V-Programmable Metal-Fuse Technology With Current-Mode Programming and Program-Guarantee Technique in 28 nm CMOS Technology","publication_year":2024,"publication_date":"2024-10-25","ids":{"openalex":"https://openalex.org/W4403758725","doi":"https://doi.org/10.1109/tcsi.2024.3447276"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2024.3447276","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3447276","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017988858","display_name":"Philex Ming-Yan Fan","orcid":"https://orcid.org/0000-0002-4454-5323"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Philex Ming-Yan Fan","raw_affiliation_strings":["Department of Electrical Engineering and the Hierarchical Green-Energy Materials (Hi-GEM) Research Center, National Cheng Kung University, Tainan, Taiwan","with the Department of Electrical Engineering and the Hierarchical Green-Energy Materials (Hi-GEM) Research Center, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-4454-5323","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and the Hierarchical Green-Energy Materials (Hi-GEM) Research Center, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"with the Department of Electrical Engineering and the Hierarchical Green-Energy Materials (Hi-GEM) Research Center, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076811089","display_name":"Chen-An Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chen-An Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":"https://orcid.org/0009-0004-7130-9248","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102979133","display_name":"Chih-Hao Wang","orcid":"https://orcid.org/0000-0002-2841-6978"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Hao Wang","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111763526","display_name":"H S Ko","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hsiang-Yu Ko","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":"https://orcid.org/0009-0002-7861-8823","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":{"value":2495,"currency":"USD","value_usd":2495},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09215887,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"72","issue":"2","first_page":"685","last_page":"693"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.770168125629425},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7653604745864868},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5591257214546204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5117151737213135},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4953716993331909},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.48444536328315735},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41479769349098206},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4054977297782898}],"concepts":[{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.770168125629425},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7653604745864868},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5591257214546204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5117151737213135},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4953716993331909},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.48444536328315735},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41479769349098206},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4054977297782898},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2024.3447276","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3447276","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1309110670","display_name":null,"funder_award_id":"MOST 111-2222-E-006-002-MY3","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"},{"id":"https://openalex.org/G3255657431","display_name":null,"funder_award_id":"MOST 111-2221-E-006-188","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"},{"id":"https://openalex.org/G6348033871","display_name":null,"funder_award_id":"NSTC 113-2640-E-006-005","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"},{"id":"https://openalex.org/G8874708594","display_name":null,"funder_award_id":"NSTC 113-2640-E-006-003","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"}],"funders":[{"id":"https://openalex.org/F4320329965","display_name":"Materials and Energy Research Center","ror":"https://ror.org/02p3y5t84"},{"id":"https://openalex.org/F4320331164","display_name":"National Science and Technology Council","ror":"https://ror.org/00wnb9798"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1591448663","https://openalex.org/W1973817620","https://openalex.org/W2030582683","https://openalex.org/W2032431045","https://openalex.org/W2071520186","https://openalex.org/W2072717808","https://openalex.org/W2099158291","https://openalex.org/W2105538647","https://openalex.org/W2145946406","https://openalex.org/W2156547464","https://openalex.org/W2331507404","https://openalex.org/W2539603835","https://openalex.org/W2543553088","https://openalex.org/W2545123322","https://openalex.org/W2578005740","https://openalex.org/W4286571960","https://openalex.org/W6666708008"],"related_works":["https://openalex.org/W3000097931","https://openalex.org/W2354322770","https://openalex.org/W4237547500","https://openalex.org/W1570848052","https://openalex.org/W2373192430","https://openalex.org/W4239268388","https://openalex.org/W1537496349","https://openalex.org/W4243305035","https://openalex.org/W2109445684","https://openalex.org/W2081082331"],"abstract_inverted_index":{"The":[0,14,31,128],"first":[1],"1.1V-programmable":[2],"metal-fuse":[3,50],"technology":[4,8],"in":[5,11,71,145],"28nm":[6],"CMOS":[7,51],"is":[9],"reported":[10],"this":[12],"work.":[13],"prototyped":[15],"1Kb-memory":[16],"array":[17],"featuring":[18],"a$12.4\\mu":[19],"$m2":[20],"1T1R":[21],"bit":[22,72],"cell":[23],"adopts":[24],"the":[25,43,80,103],"proposed":[26,81],"current-mode":[27],"programming":[28,38,44,93,101,110,118,142],"(CMP)":[29],"scheme.":[30],"CMP":[32,82,106],"scheme":[33,83],"achieves":[34,87],"a":[35,59,88,132],"record":[36],"low":[37],"voltage":[39],"of":[40,90,105,126],"1.1V,":[41],"surpassing":[42],"voltages":[45,143],"(\u22651.6V)":[46],"required":[47],"by":[48],"prior":[49,146],"and":[52,107,116,121],"FinFET":[53],"technologies.":[54],"To":[55],"ensure":[56],"successful":[57],"programming,":[58],"closed-loop":[60],"detector":[61],"(CLD)":[62],"employing":[63],"an":[64],"on-chip":[65],"hysteresis":[66],"comparator":[67],"detects":[68],"resistance":[69,113],"transition":[70],"cells":[73],"during":[74],"programming.":[75],"Preliminary":[76],"experiments":[77],"demonstrate":[78],"that":[79],"along":[84],"with":[85,112,140],"CLD":[86,108],"100%":[89],"yield":[91],"after":[92,117],"960":[94],"bits":[95],"at":[96],"room":[97],"temperature.":[98],"Under":[99],"various":[100],"conditions,":[102],"combination":[104],"demonstrates":[109],"robustness,":[111],"ratios":[114],"before":[115],"equal":[119],"to":[120],"greater":[122],"than":[123],"three":[124],"orders":[125],"magnitude.":[127],"measured":[129],"results":[130],"suggest":[131],"promising":[133],"method":[134],"for":[135],"mitigating":[136],"over-stress":[137],"issues":[138],"associated":[139],"high":[141],"used":[144],"art.":[147]},"counts_by_year":[],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}