{"id":"https://openalex.org/W4394711361","doi":"https://doi.org/10.1109/tcsi.2024.3383450","title":"Quantification of Cascading Failure Propagation in Power Systems","display_name":"Quantification of Cascading Failure Propagation in Power Systems","publication_year":2024,"publication_date":"2024-04-11","ids":{"openalex":"https://openalex.org/W4394711361","doi":"https://doi.org/10.1109/tcsi.2024.3383450"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2024.3383450","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3383450","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020872843","display_name":"Meixuan Jade Li","orcid":"https://orcid.org/0000-0002-1569-6210"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"Meixuan Jade Li","raw_affiliation_strings":["Department of Electrical Engineering, City University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021923917","display_name":"Chi K. Tse","orcid":"https://orcid.org/0000-0002-0462-3999"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Chi K. Tse","raw_affiliation_strings":["Department of Electrical Engineering, City University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5020872843"],"corresponding_institution_ids":["https://openalex.org/I168719708"],"apc_list":null,"apc_paid":null,"fwci":4.7912,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.95116468,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"71","issue":"8","first_page":"3717","last_page":"3725"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cascading-failure","display_name":"Cascading failure","score":0.6686372756958008},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.5161577463150024},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4684073328971863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4390442371368408},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41874635219573975},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36899861693382263},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3567271828651428},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3333086669445038},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3095874488353729},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.25656068325042725}],"concepts":[{"id":"https://openalex.org/C119323957","wikidata":"https://www.wikidata.org/wiki/Q5048226","display_name":"Cascading failure","level":4,"score":0.6686372756958008},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.5161577463150024},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4684073328971863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4390442371368408},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41874635219573975},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36899861693382263},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3567271828651428},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3333086669445038},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3095874488353729},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25656068325042725},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2024.3383450","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3383450","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"},{"score":0.4399999976158142,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[{"id":"https://openalex.org/G710080125","display_name":null,"funder_award_id":"9380114","funder_id":"https://openalex.org/F4320309893","funder_display_name":"City University of Hong Kong"},{"id":"https://openalex.org/G8941578488","display_name":null,"funder_award_id":"GRF CityU11207121E","funder_id":"https://openalex.org/F4320321592","funder_display_name":"Research Grants Council, University Grants Committee"},{"id":"https://openalex.org/G96181474","display_name":null,"funder_award_id":"9610515","funder_id":"https://openalex.org/F4320309893","funder_display_name":"City University of Hong Kong"}],"funders":[{"id":"https://openalex.org/F4320309893","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23"},{"id":"https://openalex.org/F4320321592","display_name":"Research Grants Council, University Grants Committee","ror":"https://ror.org/00djwmt25"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1791071580","https://openalex.org/W1909467347","https://openalex.org/W1972716516","https://openalex.org/W2027496629","https://openalex.org/W2028932385","https://openalex.org/W2060142650","https://openalex.org/W2107489482","https://openalex.org/W2120747200","https://openalex.org/W2140813422","https://openalex.org/W2171137858","https://openalex.org/W2343473715","https://openalex.org/W2381162371","https://openalex.org/W2409704060","https://openalex.org/W2467645488","https://openalex.org/W2537472522","https://openalex.org/W2766383586","https://openalex.org/W2901577110","https://openalex.org/W3046610531","https://openalex.org/W3083322460","https://openalex.org/W3088031088","https://openalex.org/W3094137245","https://openalex.org/W3100116198","https://openalex.org/W3112390817","https://openalex.org/W3159364476","https://openalex.org/W4322576648","https://openalex.org/W4323896853","https://openalex.org/W4385187403","https://openalex.org/W4387917986"],"related_works":["https://openalex.org/W2355051428","https://openalex.org/W2373141077","https://openalex.org/W3159334627","https://openalex.org/W2608186352","https://openalex.org/W2168347047","https://openalex.org/W2038278056","https://openalex.org/W2378097750","https://openalex.org/W2532099551","https://openalex.org/W2155742919","https://openalex.org/W1914681266"],"abstract_inverted_index":{"This":[0,31,96],"paper":[1,68],"studies":[2],"cascading":[3,26,56,77,140],"failure":[4,19,27,57,78,124],"propagation":[5,28,91,138],"in":[6,55],"power":[7,74],"systems":[8],"and":[9,89,107,118,162],"presents":[10],"methods":[11],"for":[12,159],"the":[13,22,36,45,51,67,70,82,86,90,104,120,127,137,154],"quantification":[14],"of":[15,18,25,35,48,53,72,85,93,102,122,139,156],"important":[16],"properties":[17,24],"propagation.":[20],"First,":[21],"topological":[23,64,83],"are":[29],"examined.":[30],"includes":[32],"an":[33],"analysis":[34,97],"electrical":[37],"distance":[38],"between":[39],"consecutive":[40],"failures,":[41,141],"shedding":[42],"light":[43],"on":[44],"spatial":[46],"spread":[47],"failures.":[49],"Additionally,":[50],"formation":[52],"islands":[54],"processes":[58],"is":[59],"explored":[60],"to":[61,126,143],"understand":[62],"their":[63],"characteristics.":[65],"Second,":[66],"measures":[69],"evolution":[71],"a":[73,99],"system":[75,88,94,105,116,129],"during":[76],"processes,":[79],"considering":[80],"both":[81],"changes":[84],"overall":[87,128],"rates":[92],"loss.":[95,130],"provides":[98],"measurable":[100],"comprehension":[101],"how":[103],"evolves":[106],"adapts":[108],"as":[109],"failures":[110],"propagate.":[111],"Third,":[112],"this":[113,150],"study":[114],"investigates":[115],"loss":[117],"analyzes":[119],"contributions":[121],"various":[123],"mechanisms":[125],"Numerical":[131],"experiments":[132],"yield":[133],"valuable":[134],"insights":[135],"into":[136],"leading":[142],"several":[144],"significant":[145],"conclusions.":[146],"The":[147],"findings":[148],"from":[149],"research":[151],"can":[152],"inform":[153],"development":[155],"effective":[157],"strategies":[158],"resilience":[160],"enhancement":[161],"risk":[163],"mitigation.":[164]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":4}],"updated_date":"2026-03-25T14:56:36.534964","created_date":"2025-10-10T00:00:00"}