{"id":"https://openalex.org/W4391853731","doi":"https://doi.org/10.1109/tcsi.2024.3362253","title":"Calculation of the Worst-Case Voltage Noise for a Power Distribution Network Based on Ramp Current","display_name":"Calculation of the Worst-Case Voltage Noise for a Power Distribution Network Based on Ramp Current","publication_year":2024,"publication_date":"2024-02-15","ids":{"openalex":"https://openalex.org/W4391853731","doi":"https://doi.org/10.1109/tcsi.2024.3362253"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2024.3362253","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3362253","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025066189","display_name":"Yuhuan Luo","orcid":"https://orcid.org/0000-0002-1934-6453"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhuan Luo","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-1934-6453","affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100625139","display_name":"Jun Wang","orcid":"https://orcid.org/0000-0002-3910-438X"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Wang","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-3910-438X","affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001627689","display_name":"Haiyue Yuan","orcid":"https://orcid.org/0000-0001-6084-6719"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiyue Yuan","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058421415","display_name":"Tao Wei","orcid":"https://orcid.org/0009-0009-2480-084X"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Wei","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039281268","display_name":"Yuhao Huang","orcid":"https://orcid.org/0000-0002-0798-1273"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhao Huang","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109926363","display_name":"Feng Wu","orcid":"https://orcid.org/0009-0000-9574-5432"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Wu","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054820415","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0002-3069-642X"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Liu","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-3069-642X","affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012198483","display_name":"Xiuqin Chu","orcid":"https://orcid.org/0000-0001-5860-2002"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuqin Chu","raw_affiliation_strings":["Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-5860-2002","affiliations":[{"raw_affiliation_string":"Key Laboratory of High-Speed Circuit Design and EMC, Ministry of Education, Xidian University, Xi’an, China","institution_ids":["https://openalex.org/I149594827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5569,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.63516085,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"71","issue":"6","first_page":"2797","last_page":"2809"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6313295364379883},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.5970757007598877},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5730715990066528},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5473300814628601},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5044542551040649},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.47521620988845825},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4402579665184021},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43995413184165955},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35529133677482605}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6313295364379883},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.5970757007598877},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5730715990066528},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5473300814628601},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5044542551040649},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47521620988845825},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4402579665184021},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43995413184165955},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35529133677482605},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2024.3362253","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2024.3362253","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8399999737739563}],"awards":[{"id":"https://openalex.org/G1106345602","display_name":null,"funder_award_id":"XJS210203","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G2332027","display_name":null,"funder_award_id":"62171338","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1967193715","https://openalex.org/W2014223528","https://openalex.org/W2064194170","https://openalex.org/W2096844335","https://openalex.org/W2102763958","https://openalex.org/W2109258578","https://openalex.org/W2116954639","https://openalex.org/W2125671371","https://openalex.org/W2153756269","https://openalex.org/W2543638875","https://openalex.org/W2971531823","https://openalex.org/W3013870600","https://openalex.org/W3014520412","https://openalex.org/W3033174886","https://openalex.org/W3035229408","https://openalex.org/W3091820258","https://openalex.org/W3133472676","https://openalex.org/W3165965934","https://openalex.org/W3176281669","https://openalex.org/W3199896046","https://openalex.org/W3200419572","https://openalex.org/W4294167329","https://openalex.org/W4323065166","https://openalex.org/W4384129979","https://openalex.org/W4388671649","https://openalex.org/W6670109756","https://openalex.org/W6757319442"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2037276323","https://openalex.org/W3095633856","https://openalex.org/W2058044441"],"abstract_inverted_index":{"With":[0],"the":[1,41,45,50,62,68,72,78,81,95,128,150,162],"continuous":[2],"reduction":[3],"of":[4,20,44,52,71],"integrated":[5],"circuit":[6],"processing":[7],"size":[8],"and":[9,30,49,116,133,164],"increasing":[10],"integration":[11],"density,":[12],"power":[13,46,107,152],"supply":[14,35,65,153],"noise":[15,36,132],"seriously":[16],"threatens":[17],"further":[18],"improvement":[19],"high-speed":[21],"digital":[22],"system":[23,32],"performance,":[24],"which":[25,89],"can":[26,85,90],"cause":[27],"jitter,":[28],"latency,":[29],"even":[31],"malfunction.":[33],"Power":[34],"is":[37,75,113,140,157],"strongly":[38],"related":[39],"to":[40,93,126],"design":[42,103],"quality":[43],"distribution":[47,108],"network":[48],"activity":[51,84],"transient":[53,73],"currents.":[54],"In":[55],"this":[56],"paper,":[57],"a":[58,105],"method":[59,139],"for":[60,104],"estimating":[61,149],"worst-case":[63,82,129,134,151],"voltage":[64,131],"based":[66],"on":[67],"ramp":[69,111],"time":[70],"current":[74,83,112,135],"proposed.":[76],"At":[77],"same":[79],"time,":[80],"also":[86,158],"be":[87,91],"obtained":[88],"used":[92,125],"guide":[94],"core":[96],"or":[97],"field":[98],"programmable":[99],"gate":[100],"array":[101],"(FPGA)":[102],"given":[106],"network.":[109],"The":[110,137],"first":[114],"encoded":[115],"divided":[117],"into":[118],"segments.":[119],"Then,":[120],"two":[121],"dynamic":[122],"matrices":[123],"are":[124],"track":[127],"accumulated":[130],"activities.":[136],"proposed":[138],"compared":[141],"with":[142],"state-of-the-art":[143],"approaches":[144],"showing":[145],"consistent":[146],"advantages":[147],"in":[148],"noise.":[154],"Its":[155],"accuracy":[156],"validated":[159],"by":[160],"comparing":[161],"simulated":[163],"measured":[165],"data.":[166]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}