{"id":"https://openalex.org/W4388469760","doi":"https://doi.org/10.1109/tcsi.2023.3327461","title":"A CFMB STT-MRAM-Based Computing-in-Memory Proposal With Cascade Computing Unit for Edge AI Devices","display_name":"A CFMB STT-MRAM-Based Computing-in-Memory Proposal With Cascade Computing Unit for Edge AI Devices","publication_year":2023,"publication_date":"2023-11-07","ids":{"openalex":"https://openalex.org/W4388469760","doi":"https://doi.org/10.1109/tcsi.2023.3327461"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2023.3327461","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3327461","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085770846","display_name":"Yongliang Zhou","orcid":"https://orcid.org/0000-0002-7327-6759"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yongliang Zhou","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","Anhui Anxin Electronic Technology Company Ltd, Chuzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]},{"raw_affiliation_string":"Anhui Anxin Electronic Technology Company Ltd, Chuzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066336906","display_name":"Zixuan Zhou","orcid":"https://orcid.org/0009-0006-9124-7245"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zixuan Zhou","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101660804","display_name":"Yiming Wei","orcid":"https://orcid.org/0000-0001-7261-2952"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiming Wei","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101906745","display_name":"Zhen Yang","orcid":"https://orcid.org/0000-0001-7656-9912"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Yang","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100450510","display_name":"Xiao Lin","orcid":"https://orcid.org/0000-0001-8518-2293"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Lin","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019993200","display_name":"Chenghu Dai","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenghu Dai","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082970785","display_name":"Licai Hao","orcid":"https://orcid.org/0000-0002-0637-5132"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Licai Hao","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075966974","display_name":"Chunyu Peng","orcid":"https://orcid.org/0000-0003-2408-5048"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunyu Peng","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079498326","display_name":"Hao Cai","orcid":"https://orcid.org/0000-0001-9794-8049"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Cai","raw_affiliation_strings":["National ASIC System Engineering Center, School of Electronic Science and Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, School of Electronic Science and Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037391840","display_name":"Xiulong Wu","orcid":"https://orcid.org/0000-0002-5012-2570"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiulong Wu","raw_affiliation_strings":["School of Integrated Circuits, Anhui University, Hefei, China","Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"Anhui Provincial High-Performance Integrated Circuit Engineering Research Center, Hefei, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5085770846"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":null,"apc_paid":null,"fwci":1.6978,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.84619745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"71","issue":"1","first_page":"187","last_page":"200"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.7993930578231812},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6238545179367065},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6197218894958496},{"id":"https://openalex.org/keywords/cascade","display_name":"Cascade","score":0.5112833976745605},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.5002405643463135},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.4775967597961426},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.4483441710472107},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4109361171722412},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.38225674629211426},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3350335955619812},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25860875844955444},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18476548790931702},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.17187067866325378}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.7993930578231812},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6238545179367065},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6197218894958496},{"id":"https://openalex.org/C34146451","wikidata":"https://www.wikidata.org/wiki/Q5048094","display_name":"Cascade","level":2,"score":0.5112833976745605},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.5002405643463135},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.4775967597961426},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.4483441710472107},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4109361171722412},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.38225674629211426},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3350335955619812},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25860875844955444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18476548790931702},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.17187067866325378},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2023.3327461","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3327461","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2970710660","display_name":null,"funder_award_id":"U19A2074","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4271637611","display_name":null,"funder_award_id":"2108085J35","funder_id":"https://openalex.org/F4320317137","funder_display_name":"Natural Science Foundation for Distinguished Young Scholars of Anhui Province"},{"id":"https://openalex.org/G4734890220","display_name":null,"funder_award_id":"2308085QF214","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"}],"funders":[{"id":"https://openalex.org/F4320317137","display_name":"Natural Science Foundation for Distinguished Young Scholars of Anhui Province","ror":null},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334897","display_name":"Natural Science Foundation of Anhui Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":56,"referenced_works":["https://openalex.org/W1566916904","https://openalex.org/W1901149441","https://openalex.org/W1906827922","https://openalex.org/W1916668514","https://openalex.org/W1964242651","https://openalex.org/W1977463470","https://openalex.org/W1996356878","https://openalex.org/W1999085092","https://openalex.org/W2010795939","https://openalex.org/W2097117768","https://openalex.org/W2130436742","https://openalex.org/W2143848280","https://openalex.org/W2303314981","https://openalex.org/W2333032139","https://openalex.org/W2334805829","https://openalex.org/W2539008933","https://openalex.org/W2593172471","https://openalex.org/W2594883689","https://openalex.org/W2740455604","https://openalex.org/W2757632807","https://openalex.org/W2785141883","https://openalex.org/W2789899229","https://openalex.org/W2796625795","https://openalex.org/W2812853021","https://openalex.org/W2886146119","https://openalex.org/W2887116090","https://openalex.org/W2895842071","https://openalex.org/W2899269873","https://openalex.org/W2919115771","https://openalex.org/W2921013323","https://openalex.org/W2922487710","https://openalex.org/W2943669549","https://openalex.org/W2966524683","https://openalex.org/W2966878541","https://openalex.org/W3004895589","https://openalex.org/W3011948113","https://openalex.org/W3015982917","https://openalex.org/W3043783230","https://openalex.org/W3044192339","https://openalex.org/W3109556898","https://openalex.org/W3127994335","https://openalex.org/W3134195144","https://openalex.org/W3159353913","https://openalex.org/W3207552913","https://openalex.org/W4205230840","https://openalex.org/W4212888381","https://openalex.org/W4220673325","https://openalex.org/W4220702691","https://openalex.org/W4221039638","https://openalex.org/W4286571786","https://openalex.org/W4292826036","https://openalex.org/W4308089758","https://openalex.org/W4360607286","https://openalex.org/W4386361495","https://openalex.org/W6681218413","https://openalex.org/W6684191040"],"related_works":["https://openalex.org/W2160372845","https://openalex.org/W1545438037","https://openalex.org/W1977755618","https://openalex.org/W2131964951","https://openalex.org/W2897770615","https://openalex.org/W4214681414","https://openalex.org/W1890124164","https://openalex.org/W2032117939","https://openalex.org/W2034593071","https://openalex.org/W4226197542"],"abstract_inverted_index":{"The":[0,97,105],"application":[1],"of":[2,113],"non-volatile":[3],"memory":[4,31],"technology":[5],"is":[6],"increasingly":[7],"attractive":[8],"for":[9,71],"Computing-in-memory":[10],"(CIM)":[11],"owing":[12],"to":[13,46,90,122],"high":[14],"integration":[15],"density":[16],"and":[17,49,56,67,73,79,85,94,127],"negligible":[18],"standby":[19],"power":[20],"consumption.":[21],"This":[22],"study":[23],"proposes":[24],"an":[25],"spin-transfer-torque":[26],"(STT)":[27],"magnetic":[28],"random":[29],"access":[30],"(MRAM)":[32],"based":[33],"CIM":[34],"macro":[35],"which":[36],"incorporates":[37],"following":[38],"innovative":[39],"features:":[40],"1)":[41],"cross-feedback":[42],"margin-boost":[43],"(CFMB)":[44],"scheme":[45,84],"enable":[47],"robust":[48],"fast":[50],"reading":[51],"operations":[52,119],"against":[53],"process":[54],"variation":[55],"limited":[57],"Tunneling":[58],"Magnetoresistance":[59],"Ratio":[60],"(TMR);":[61],"2)":[62],"cascade":[63],"computing":[64,82],"units":[65],"(CCU)":[66],"related":[68],"design":[69],"method":[70],"efficient":[72],"stable":[74],"multi-bit":[75],"multiply-and-accumulate":[76],"(MAC)":[77],"operation;":[78],"3)":[80],"dual":[81],"mode":[83],"resolution":[86],"adjustable":[87],"quantization":[88],"module":[89],"optimize":[91],"energy":[92,111],"efficiency":[93,112],"operating":[95],"speed.":[96],"post-simulations":[98],"are":[99],"performed":[100],"under":[101],"28nm":[102],"CMOS&MTJ":[103],"technology.":[104],"results":[106],"demonstrate":[107],"the":[108],"achievement":[109],"in":[110],"36.4":[114],"TOPS/W":[115],"while":[116],"performing":[117],"MAC":[118],"with":[120],"up":[121],"16-bit":[123],"weights,":[124],"4-bit":[125],"inputs,":[126],"22-bit":[128],"outputs.":[129]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}