{"id":"https://openalex.org/W4387042049","doi":"https://doi.org/10.1109/tcsi.2023.3315282","title":"28-nm CMOS Ultrasound AFE With Split Attenuation for Optimizing Gain-Range, Noise, and Area","display_name":"28-nm CMOS Ultrasound AFE With Split Attenuation for Optimizing Gain-Range, Noise, and Area","publication_year":2023,"publication_date":"2023-09-26","ids":{"openalex":"https://openalex.org/W4387042049","doi":"https://doi.org/10.1109/tcsi.2023.3315282"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2023.3315282","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3315282","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002757653","display_name":"Xinwei Yu","orcid":"https://orcid.org/0009-0009-5923-8463"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xinwei Yu","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102012026","display_name":"Zhi Chen","orcid":"https://orcid.org/0009-0002-9063-2564"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhi Chen","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103007206","display_name":"Siqing Wu","orcid":"https://orcid.org/0009-0006-2179-987X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siqing Wu","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102709026","display_name":"Lulu Liu","orcid":"https://orcid.org/0009-0006-4404-7291"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lulu Liu","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045010059","display_name":"Hao Chi","orcid":"https://orcid.org/0009-0002-6912-8021"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Chi","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025053306","display_name":"Fan Ye","orcid":"https://orcid.org/0000-0002-1089-1498"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Ye","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016448886","display_name":"Junyan Ren","orcid":"https://orcid.org/0000-0002-7799-6251"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junyan Ren","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5002757653"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":1.5095,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.79115946,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"70","issue":"12","first_page":"4742","last_page":"4754"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10727","display_name":"Ultrasound Imaging and Elastography","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-gain-control","display_name":"Automatic gain control","score":0.8038487434387207},{"id":"https://openalex.org/keywords/attenuator","display_name":"Attenuator (electronics)","score":0.7553609609603882},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5806753039360046},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.5574319362640381},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5268850326538086},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.5078309178352356},{"id":"https://openalex.org/keywords/variable-gain-amplifier","display_name":"Variable-gain amplifier","score":0.5043920278549194},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5034567713737488},{"id":"https://openalex.org/keywords/open-loop-gain","display_name":"Open-loop gain","score":0.44925907254219055},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4447312653064728},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4388570785522461},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4256644546985626},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.4183664321899414},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3950970470905304},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.34948134422302246},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2621220350265503},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2610401511192322},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.24552711844444275}],"concepts":[{"id":"https://openalex.org/C177502760","wikidata":"https://www.wikidata.org/wiki/Q782524","display_name":"Automatic gain control","level":4,"score":0.8038487434387207},{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.7553609609603882},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5806753039360046},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.5574319362640381},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5268850326538086},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.5078309178352356},{"id":"https://openalex.org/C91541141","wikidata":"https://www.wikidata.org/wiki/Q1894933","display_name":"Variable-gain amplifier","level":5,"score":0.5043920278549194},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5034567713737488},{"id":"https://openalex.org/C143931264","wikidata":"https://www.wikidata.org/wiki/Q5932986","display_name":"Open-loop gain","level":5,"score":0.44925907254219055},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4447312653064728},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4388570785522461},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4256644546985626},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.4183664321899414},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3950970470905304},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.34948134422302246},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2621220350265503},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2610401511192322},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.24552711844444275}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2023.3315282","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3315282","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5994711700","display_name":null,"funder_award_id":"2020YFC0122101","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G8516228580","display_name":null,"funder_award_id":"2020YFC0122100","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2003158557","https://openalex.org/W2133818035","https://openalex.org/W2163883564","https://openalex.org/W2344684067","https://openalex.org/W2411091265","https://openalex.org/W2472395416","https://openalex.org/W2562121608","https://openalex.org/W2569264893","https://openalex.org/W2593985839","https://openalex.org/W2609625076","https://openalex.org/W2792380342","https://openalex.org/W2886583350","https://openalex.org/W2889595172","https://openalex.org/W2902108344","https://openalex.org/W2910864630","https://openalex.org/W2920876983","https://openalex.org/W2944738781","https://openalex.org/W2995958784","https://openalex.org/W3003890930","https://openalex.org/W3033422764","https://openalex.org/W3080597829","https://openalex.org/W3133542079","https://openalex.org/W3176092241","https://openalex.org/W3206543090","https://openalex.org/W4200392969","https://openalex.org/W4300993850"],"related_works":["https://openalex.org/W2360549081","https://openalex.org/W1585165462","https://openalex.org/W4377235202","https://openalex.org/W2361632208","https://openalex.org/W2784081185","https://openalex.org/W2357914858","https://openalex.org/W2167184694","https://openalex.org/W1973951761","https://openalex.org/W2014339237","https://openalex.org/W1875776856"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"split":[3,51],"attenuators":[4,78],"combined":[5],"with":[6,45,215],"adjustable":[7,177],"gain":[8,22,39,43,104,178,190],"amplifiers":[9],"as":[10,93,202],"a":[11,86,155,168,174,182],"two-stage":[12,52],"time-gain":[13],"compensation":[14],"(TGC),":[15],"such":[16],"that":[17,75,120],"it":[18],"can":[19],"extend":[20],"the":[21,25,50,62,77,80,91,94,99,103,121,129,133,138,198,216,219],"range":[23,105,112,179],"of":[24,85,141,197],"Analog":[26],"Front-end":[27],"(AFE)":[28],"for":[29,188],"ultrasound":[30],"image":[31],"systems.":[32],"To":[33],"avoid":[34],"artifacts":[35],"caused":[36],"by":[37,49,61,145,154],"discrete":[38],"control,":[40],"continuous":[41],"dB-linear":[42],"varying":[44],"time":[46],"is":[47,59,66,113,125,135],"achieved":[48],"resistive":[53],"voltage-divider":[54],"attenuator":[55],"whose":[56],"attenuation":[57,111],"value":[58],"decided":[60],"MOSFET":[63],"resistance":[64,143],"which":[65],"inversely":[67],"proportional":[68],"to":[69],"area.":[70,108],"Rigorous":[71],"theoretical":[72],"analysis":[73],"proves":[74],"placing":[76],"in":[79,90],"front":[81],"and":[82,106,127,164],"back":[83],"stages":[84,118],"programmable-gain":[87],"amplifier":[88],"(PGA)":[89],"AFE":[92,150],"proposed":[95,149],"architecture":[96],"demonstrated":[97],"solves":[98],"contradiction":[100],"between":[101],"extending":[102],"saving":[107],"The":[109,148,192],"total":[110],"broken":[114],"down":[115],"into":[116],"two":[117],"so":[119],"system":[122,199],"noise":[123,195],"performance":[124],"optimized":[126],"unlike":[128],"prior":[130],"single-stage-attenuator":[131],"work,":[132],"dB-linearity":[134],"free":[136],"from":[137,167],"negative":[139],"impact":[140],"parasitic":[142],"introduced":[144],"area":[146,163],"expansion.":[147],"has":[151],"been":[152],"fabricated":[153],"28-nm":[156],"CMOS":[157],"process,":[158],"occupying":[159],"0.145":[160],"mm2":[161],"active":[162],"consuming":[165],"75mW":[166],"2.5":[169],"V":[170],"supply.":[171],"It":[172],"achieves":[173],"74.7":[175],"dB":[176],"while":[180],"providing":[181],"15":[183],"MHz/30":[184],"MHz":[185],"switchable":[186],"bandwidth":[187],"all":[189],"modes.":[191],"lowest":[193],"input-referred":[194],"(IRN)":[196],"was":[200],"measured":[201],"2.38":[203],"nV/":[204],"<inline-formula":[205],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[206],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[207],"<tex-math":[208],"notation=\"LaTeX\">$\\sqrt":[209],"{\\mathrm":[210],"{Hz}}$":[211],"</tex-math></inline-formula>":[212],"at":[213],"5MHz":[214],"TGC":[217],"reaching":[218],"highest":[220],"gain.":[221]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}