{"id":"https://openalex.org/W4366967796","doi":"https://doi.org/10.1109/tcsi.2023.3267837","title":"FDSOI-Based Analog Computing for Ultra-Efficient Hamming Distance Similarity Calculation","display_name":"FDSOI-Based Analog Computing for Ultra-Efficient Hamming Distance Similarity Calculation","publication_year":2023,"publication_date":"2023-04-24","ids":{"openalex":"https://openalex.org/W4366967796","doi":"https://doi.org/10.1109/tcsi.2023.3267837"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2023.3267837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3267837","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066812660","display_name":"Albi Mema","orcid":"https://orcid.org/0000-0001-7841-1975"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Albi Mema","raw_affiliation_strings":["Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054764590","display_name":"Simon Thomann","orcid":"https://orcid.org/0000-0002-7902-9353"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Simon Thomann","raw_affiliation_strings":["Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064095385","display_name":"Paul R. Gen\u00dfler","orcid":"https://orcid.org/0000-0002-7175-7284"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Paul R. Genssler","raw_affiliation_strings":["Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]},{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","Chair of AI Processor Design, Technical University of Munich (TUM), Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Chair of Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Chair of AI Processor Design, Technical University of Munich (TUM), Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5066812660"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":0.5355,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.6346848,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"70","issue":"7","first_page":"2679","last_page":"2688"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hamming-distance","display_name":"Hamming distance","score":0.7588390111923218},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.5120937824249268},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.4978928565979004},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49000731110572815},{"id":"https://openalex.org/keywords/hamming-code","display_name":"Hamming code","score":0.48006758093833923},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.45509621500968933},{"id":"https://openalex.org/keywords/boolean-function","display_name":"Boolean function","score":0.4294368624687195},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36859703063964844},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3581348955631256},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.33146074414253235},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.2907320559024811},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16574522852897644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15289238095283508},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.1284984052181244}],"concepts":[{"id":"https://openalex.org/C193319292","wikidata":"https://www.wikidata.org/wiki/Q272172","display_name":"Hamming distance","level":2,"score":0.7588390111923218},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.5120937824249268},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.4978928565979004},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49000731110572815},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.48006758093833923},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.45509621500968933},{"id":"https://openalex.org/C187455244","wikidata":"https://www.wikidata.org/wiki/Q942353","display_name":"Boolean function","level":2,"score":0.4294368624687195},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36859703063964844},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3581348955631256},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.33146074414253235},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.2907320559024811},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16574522852897644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15289238095283508},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.1284984052181244},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2023.3267837","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3267837","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:mediatum.ub.tum.de:node/1709265","is_oa":false,"landing_page_url":"https://mediatum.ub.tum.de/1709265","pdf_url":null,"source":{"id":"https://openalex.org/S4377196330","display_name":"mediaTUM  (Technical University of Munich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I62916508","host_organization_name":"Technical University of Munich","host_organization_lineage":["https://openalex.org/I62916508"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6100000143051147}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1889226263","https://openalex.org/W1902934009","https://openalex.org/W2017926762","https://openalex.org/W2026940159","https://openalex.org/W2070862086","https://openalex.org/W2106607114","https://openalex.org/W2106941563","https://openalex.org/W2114644969","https://openalex.org/W2139620825","https://openalex.org/W2203405836","https://openalex.org/W2528196685","https://openalex.org/W2568815538","https://openalex.org/W2743991054","https://openalex.org/W2791549056","https://openalex.org/W2896122000","https://openalex.org/W2946585648","https://openalex.org/W2974585810","https://openalex.org/W3006330715","https://openalex.org/W3012413943","https://openalex.org/W3030383331","https://openalex.org/W3032819016","https://openalex.org/W3035768999","https://openalex.org/W3061567197","https://openalex.org/W3090694869","https://openalex.org/W3121649706","https://openalex.org/W3137500779","https://openalex.org/W3137833672","https://openalex.org/W3200367387","https://openalex.org/W3200424126","https://openalex.org/W4212816501","https://openalex.org/W4226199505","https://openalex.org/W4321608116","https://openalex.org/W6639680632","https://openalex.org/W6639703010","https://openalex.org/W6654990117","https://openalex.org/W6773716180"],"related_works":["https://openalex.org/W2943247777","https://openalex.org/W2740543340","https://openalex.org/W2371167013","https://openalex.org/W1582340598","https://openalex.org/W1541021634","https://openalex.org/W2779867339","https://openalex.org/W2794545997","https://openalex.org/W2584980534","https://openalex.org/W2182731056","https://openalex.org/W66917582"],"abstract_inverted_index":{"Computing":[0],"the":[1,44,49,70,79,83,86,94,98,106,116,124,147,191],"similarity":[2,29,112],"between":[3],"two":[4],"binary":[5,38],"strings":[6,40],"is":[7,22,34,53,66,91,103,144,160,174,194],"a":[8,23,62],"frequently":[9],"used":[10],"operation":[11],"in":[12,73,82,121],"cryptography,":[13],"machine":[14],"learning,":[15],"and":[16,41,190],"other":[17],"areas.":[18],"The":[19,158,171],"Hamming":[20,71],"distance":[21,72],"simple":[24],"yet":[25],"costly":[26],"to":[27,35,68,78,109,115],"compute":[28,69],"metric.":[30],"A":[31],"common":[32],"way":[33],"XOR":[36],"both":[37],"input":[39],"then":[42],"count":[43,193],"number":[45],"of":[46,85,97],"1s.":[47],"Especially":[48],"latter":[50],"popcount":[51,150],"part":[52],"inefficient":[54,148],"with":[55,162,168],"purely":[56,187],"digital":[57,149,188],"circuits.":[58],"In":[59],"this":[60,122,137],"paper,":[61],"novel":[63],"analog":[64,142],"circuit":[65],"proposed":[67],"an":[74,140,163],"ultra-efficient":[75,141],"way.":[76],"Contrary":[77],"major":[80],"trend":[81],"state":[84],"art,":[87],"no":[88],"emerging":[89],"technology":[90,102],"required.":[92],"Instead,":[93],"unique":[95],"feature":[96],"mature":[99],"FDSOI":[100,164],"transistor":[101,165,192],"exploited":[104],"for":[105],"first":[107],"time":[108],"perform":[110],"analog-based":[111],"calculation.":[113],"Thanks":[114],"additional":[117],"back":[118],"gate":[119],"available":[120],"technology,":[123],"transistor\u2019s":[125],"threshold":[126],"voltage":[127],"can":[128],"be":[129],"modulated":[130],"by":[131,196],"more":[132],"than":[133,186],"1":[134],"V.":[135],"Through":[136],"key":[138],"feature,":[139],"computing":[143],"realized,":[145],"replacing":[146],"traditionally":[151],"built":[152],"from":[153],"expensive":[154],"adder":[155],"tree":[156],"structures.":[157],"design":[159],"evaluated":[161],"model":[166],"calibrated":[167],"industrial":[169],"measurements.":[170],"energy-delay":[172],"product":[173],"at":[175],"least":[176],"24":[177],"<inline-formula":[178,199],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[179,200],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[180,201],"<tex-math":[181,202],"notation=\"LaTeX\">$\\times":[182,203],"$":[183,204],"</tex-math></inline-formula>":[184,205],"smaller":[185],"implementations":[189],"reduced":[195],"over":[197],"2.6":[198],".":[206]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}