{"id":"https://openalex.org/W4365790297","doi":"https://doi.org/10.1109/tcsi.2023.3256860","title":"A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC","display_name":"A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC","publication_year":2023,"publication_date":"2023-04-13","ids":{"openalex":"https://openalex.org/W4365790297","doi":"https://doi.org/10.1109/tcsi.2023.3256860"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2023.3256860","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tcsi.2023.3256860","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/servlets/purl/1971811","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016446242","display_name":"Fabricio Alcalde Bessia","orcid":"https://orcid.org/0000-0001-6273-5246"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I2802473995","display_name":"Balseiro Institute","ror":"https://ror.org/00sx0cd23","country_code":"AR","type":"education","lineage":["https://openalex.org/I2802473995","https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Fabricio Alcalde Bessia","raw_affiliation_strings":["Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina"],"raw_orcid":"https://orcid.org/0000-0001-6273-5246","affiliations":[{"raw_affiliation_string":"Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina","institution_ids":["https://openalex.org/I2802473995","https://openalex.org/I151201029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007713230","display_name":"Troy England","orcid":"https://orcid.org/0000-0001-5440-5255"},"institutions":[{"id":"https://openalex.org/I1314696892","display_name":"Fermi National Accelerator Laboratory","ror":"https://ror.org/020hgte69","country_code":"US","type":"facility","lineage":["https://openalex.org/I1314696892","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210114836"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Troy England","raw_affiliation_strings":["Fermi National Accelerator Laboratory, Batavia, IL, USA"],"raw_orcid":"https://orcid.org/0000-0001-5440-5255","affiliations":[{"raw_affiliation_string":"Fermi National Accelerator Laboratory, Batavia, IL, USA","institution_ids":["https://openalex.org/I1314696892"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100552674","display_name":"Hongzhi Sun","orcid":"https://orcid.org/0009-0004-4484-4843"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I2802473995","display_name":"Balseiro Institute","ror":"https://ror.org/00sx0cd23","country_code":"AR","type":"education","lineage":["https://openalex.org/I2802473995","https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Hongzhi Sun","raw_affiliation_strings":["Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina","institution_ids":["https://openalex.org/I2802473995","https://openalex.org/I151201029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018903433","display_name":"Leandro Stefanazzi","orcid":"https://orcid.org/0000-0001-9990-1981"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I2802473995","display_name":"Balseiro Institute","ror":"https://ror.org/00sx0cd23","country_code":"AR","type":"education","lineage":["https://openalex.org/I2802473995","https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Leandro Stefanazzi","raw_affiliation_strings":["Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina","institution_ids":["https://openalex.org/I2802473995","https://openalex.org/I151201029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076143143","display_name":"D. Braga","orcid":"https://orcid.org/0000-0003-0907-480X"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I2802473995","display_name":"Balseiro Institute","ror":"https://ror.org/00sx0cd23","country_code":"AR","type":"education","lineage":["https://openalex.org/I2802473995","https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Davide Braga","raw_affiliation_strings":["Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina"],"raw_orcid":"https://orcid.org/0000-0003-0907-480X","affiliations":[{"raw_affiliation_string":"Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina","institution_ids":["https://openalex.org/I2802473995","https://openalex.org/I151201029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112333331","display_name":"Miguel Sofo Haro","orcid":null},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I9340077","display_name":"Comisi\u00f3n Nacional de Energ\u00eda At\u00f3mica","ror":"https://ror.org/01xz39a70","country_code":"AR","type":"government","lineage":["https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Miguel Sofo Haro","raw_affiliation_strings":["Comisi&#x00F3;n Nacional de Energ&#x00ED;a At&#x00F3;mica (CNEA) and CONICET, Universidad Nacional de C&#x00F3;rdoba, C&#x00F3;rdoba, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Comisi&#x00F3;n Nacional de Energ&#x00ED;a At&#x00F3;mica (CNEA) and CONICET, Universidad Nacional de C&#x00F3;rdoba, C&#x00F3;rdoba, Argentina","institution_ids":["https://openalex.org/I9340077","https://openalex.org/I151201029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040339942","display_name":"Shaorui Li","orcid":null},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I2802473995","display_name":"Balseiro Institute","ror":"https://ror.org/00sx0cd23","country_code":"AR","type":"education","lineage":["https://openalex.org/I2802473995","https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Shaorui Li","raw_affiliation_strings":["Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina","institution_ids":["https://openalex.org/I2802473995","https://openalex.org/I151201029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035128843","display_name":"Juan Estrada","orcid":"https://orcid.org/0000-0002-1527-7956"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I2802473995","display_name":"Balseiro Institute","ror":"https://ror.org/00sx0cd23","country_code":"AR","type":"education","lineage":["https://openalex.org/I2802473995","https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Juan Estrada","raw_affiliation_strings":["Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina"],"raw_orcid":"https://orcid.org/0000-0002-1527-7956","affiliations":[{"raw_affiliation_string":"Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina","institution_ids":["https://openalex.org/I2802473995","https://openalex.org/I151201029"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040566876","display_name":"Farah Fahim","orcid":"https://orcid.org/0000-0003-1252-1447"},"institutions":[{"id":"https://openalex.org/I151201029","display_name":"Consejo Nacional de Investigaciones Cient\u00edficas y T\u00e9cnicas","ror":"https://ror.org/03cqe8w59","country_code":"AR","type":"government","lineage":["https://openalex.org/I151201029","https://openalex.org/I4210123736","https://openalex.org/I4387155568"]},{"id":"https://openalex.org/I2802473995","display_name":"Balseiro Institute","ror":"https://ror.org/00sx0cd23","country_code":"AR","type":"education","lineage":["https://openalex.org/I2802473995","https://openalex.org/I9340077"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Farah Fahim","raw_affiliation_strings":["Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina"],"raw_orcid":"https://orcid.org/0000-0003-1252-1447","affiliations":[{"raw_affiliation_string":"Instituto Balseiro and Instituto de Nanociencia y Nanotecnolog&#x00ED;a INN (CNEA-CONICET), San Carlos de Bariloche, Argentina","institution_ids":["https://openalex.org/I2802473995","https://openalex.org/I151201029"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2454,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.50531841,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"70","issue":"6","first_page":"2306","last_page":"2316"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.7580270767211914},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.6176011562347412},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6165735721588135},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5904988050460815},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5074819922447205},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.48883479833602905},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.46664977073669434},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.45405203104019165},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3872695565223694},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34500741958618164},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3333381116390228},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.261901319026947},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.246872216463089},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23186689615249634},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12062859535217285},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10415273904800415}],"concepts":[{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.7580270767211914},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.6176011562347412},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6165735721588135},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5904988050460815},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5074819922447205},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.48883479833602905},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.46664977073669434},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.45405203104019165},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3872695565223694},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34500741958618164},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3333381116390228},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.261901319026947},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.246872216463089},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23186689615249634},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12062859535217285},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10415273904800415},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2023.3256860","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/tcsi.2023.3256860","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:osti.gov:1971811","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1971811","pdf_url":"https://www.osti.gov/servlets/purl/1971811","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:osti.gov:1971811","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1971811","pdf_url":"https://www.osti.gov/servlets/purl/1971811","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4365790297.pdf"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W1975793277","https://openalex.org/W2060709554","https://openalex.org/W2066878319","https://openalex.org/W2067589847","https://openalex.org/W2088956413","https://openalex.org/W2113025650","https://openalex.org/W2131064713","https://openalex.org/W2155493420","https://openalex.org/W2172125529","https://openalex.org/W2341310925","https://openalex.org/W2540823086","https://openalex.org/W2620726271","https://openalex.org/W2966533892","https://openalex.org/W3018554973","https://openalex.org/W3019442891","https://openalex.org/W3048431371","https://openalex.org/W3103164479","https://openalex.org/W3122668367","https://openalex.org/W3176021655","https://openalex.org/W3195847246","https://openalex.org/W3212379038","https://openalex.org/W4210764419","https://openalex.org/W4285585791","https://openalex.org/W6800258338"],"related_works":["https://openalex.org/W2366352762","https://openalex.org/W2613964090","https://openalex.org/W2380425739","https://openalex.org/W2081322886","https://openalex.org/W2349324463","https://openalex.org/W1988313539","https://openalex.org/W2029980887","https://openalex.org/W2027541371","https://openalex.org/W2380535488","https://openalex.org/W2368609622"],"abstract_inverted_index":{"The":[0,26,64,155,161],"MIDNA":[1,179],"application":[2],"specific":[3],"integrated":[4],"circuit":[5],"(ASIC)":[6],"is":[7,19,67,89,126,148,158],"a":[8,14,42,52,54,58,68,136],"skipper-CCD":[9,35,137],"readout":[10,49,162],"chip":[11,27],"fabricated":[12],"in":[13,73,150],"65nm":[15],"LP-CMOS":[16],"process":[17,33],"that":[18,32],"capable":[20],"of":[21,79,101,114,140,143],"working":[22],"at":[23,181,185],"cryogenic":[24],"temperatures.":[25],"integrates":[28],"four":[29],"front-end":[30],"channels":[31],"the":[34,77,84],"signal":[36,156],"and":[37,57,87,108,184],"performs":[38],"differential":[39],"averaging":[40,141,175],"using":[41],"dual":[43],"slope":[44],"integration":[45],"(DSI)":[46],"circuit.":[47],"Each":[48,96],"channel":[50,97],"contains":[51],"pre-amplifier,":[53],"DC":[55],"restorer,":[56],"dual-slope":[59],"integrator":[60,65,85],"with":[61,93,135,178],"chopping":[62,66],"capability.":[63],"key":[69],"system":[70,163],"design":[71],"element":[72],"order":[74],"to":[75,129],"mitigate":[76],"effect":[78],"low-frequency":[80],"noise":[81,113,132,147],"produced":[82],"by":[83,138,174],"itself,":[86],"it":[88],"not":[90],"often":[91],"required":[92],"standard":[94],"CCDs.":[95],"consumes":[98],"4.5":[99],"mW":[100],"power,":[102],"occupies":[103],"0.156":[104],"mm":[105],"2":[106],"area":[107],"has":[109],"an":[110],"input":[111],"referred":[112],"2.7":[115],"<inline-formula":[116,166],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[117,167],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[118,168],"<tex-math":[119,169],"notation=\"LaTeX\">$\\mu":[120],"\\text":[121],"{V}_{\\text":[122],"{rms}}$":[123],"</tex-math></inline-formula>.":[124],"It":[125],"demonstrated":[127],"experimentally":[128],"achieve":[130],"sub-electron":[131],"when":[133],"coupled":[134],"means":[139],"samples":[142,177],"each":[144],"pixel.":[145],"Sub-electron":[146],"shown":[149],"three":[151],"different":[152],"acquisition":[153],"approaches.":[154],"range":[157],"6000":[159],"electrons.":[160],"achieves":[164],"0.2":[165],"notation=\"LaTeX\">${\\text":[170],"{e}^{-}}$":[171],"</tex-math></inline-formula>":[172],"RMS":[173],"1000":[176],"both":[180],"room":[182],"temperature":[183],"180Kelvin.":[186]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}
