{"id":"https://openalex.org/W4322727946","doi":"https://doi.org/10.1109/tcsi.2023.3249472","title":"A 50-V 50-MHz High-Noise-Immunity Capacitive-Coupled Level Shifter With Digital Noise Blanker for GaN Drivers","display_name":"A 50-V 50-MHz High-Noise-Immunity Capacitive-Coupled Level Shifter With Digital Noise Blanker for GaN Drivers","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4322727946","doi":"https://doi.org/10.1109/tcsi.2023.3249472"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2023.3249472","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3249472","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044487582","display_name":"Yao Qin","orcid":"https://orcid.org/0000-0003-2692-4917"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yao Qin","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007973739","display_name":"Xin Ming","orcid":"https://orcid.org/0000-0002-9238-5950"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Ming","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028204149","display_name":"Zhi-Yi Lin","orcid":"https://orcid.org/0000-0003-1307-5733"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyi Lin","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087063244","display_name":"Zi-Kai Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zikai Ye","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046347577","display_name":"Jiawei Shi","orcid":"https://orcid.org/0009-0008-6483-1571"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Shi","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058105215","display_name":"Chun-wang Zhuang","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunwang Zhuang","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002790754","display_name":"Zhaoji Li","orcid":"https://orcid.org/0000-0001-8653-5396"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaoji Li","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100320398","display_name":"Bo Zhang","orcid":"https://orcid.org/0000-0003-1288-1549"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]},{"id":"https://openalex.org/I4210124847","display_name":"National Engineering Research Center of Electromagnetic Radiation Control Materials","ror":"https://ror.org/02k4dcs46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210124847"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Zhang","raw_affiliation_strings":["State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I4210124847","https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5044487582"],"corresponding_institution_ids":["https://openalex.org/I150229711","https://openalex.org/I4210124847"],"apc_list":null,"apc_paid":null,"fwci":2.0697,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.86121341,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"70","issue":"5","first_page":"2215","last_page":"2227"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6219661235809326},{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.4980647563934326},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38094425201416016},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33844003081321716},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.337749183177948},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3234047293663025},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.2942328155040741},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21219518780708313},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13892978429794312}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6219661235809326},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.4980647563934326},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38094425201416016},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33844003081321716},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.337749183177948},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3234047293663025},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.2942328155040741},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21219518780708313},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13892978429794312},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2023.3249472","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2023.3249472","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6678964399","display_name":null,"funder_award_id":"2020YFJ0002","funder_id":"https://openalex.org/F4320333335","funder_display_name":"Sichuan Province Science and Technology Support Program"},{"id":"https://openalex.org/G6984204303","display_name":null,"funder_award_id":"61974019","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8741653139","display_name":null,"funder_award_id":"2022YFB3604204","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320333335","display_name":"Sichuan Province Science and Technology Support Program","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1977095606","https://openalex.org/W2023020162","https://openalex.org/W2076870618","https://openalex.org/W2100151841","https://openalex.org/W2150601509","https://openalex.org/W2241950898","https://openalex.org/W2342399920","https://openalex.org/W2408403486","https://openalex.org/W2597341942","https://openalex.org/W2760290419","https://openalex.org/W2789272543","https://openalex.org/W2898727978","https://openalex.org/W2901196756","https://openalex.org/W2957622564","https://openalex.org/W2990712124","https://openalex.org/W3041377097","https://openalex.org/W3052620455","https://openalex.org/W3062748179","https://openalex.org/W3133448347","https://openalex.org/W3159172770","https://openalex.org/W3166984035","https://openalex.org/W3193015806","https://openalex.org/W3204359706","https://openalex.org/W4280615744","https://openalex.org/W6690291639","https://openalex.org/W6838453346"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W4245490552","https://openalex.org/W4225152035","https://openalex.org/W2504004674","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W1587224694"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,81,97,141,182],"high-noise-immunity":[4],"capacitive-coupled":[5],"level":[6,136,166],"shifter":[7,137,167],"with":[8,181],"digital":[9],"noise":[10,35,50],"blanker":[11],"(DNB)":[12],"is":[13,138,210],"presented":[14],"for":[15,113],"GaN":[16],"drivers.":[17],"During":[18],"and":[19,45,72,109,122,152,177],"after":[20],"<inline-formula":[21,38,62,100,143,188,196,214,225],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[22,39,63,101,144,189,197,215,226],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[23,40,64,102,145,190,198,216,227],"<tex-math":[24,41,65,103,146,191,199,217,228],"notation=\"LaTeX\">$\\text{d}V$":[25,42,66,104,218],"</tex-math></inline-formula>":[26,43,67,105,149,194,203,219,231],"/dt":[27,44,68,106,220],"transitions,":[28],"the":[29,32,47,92,164,208],"DNB":[30],"blanks":[31],"common":[33,56],"mode":[34,49,57],"induced":[36],"by":[37],"converts":[46],"differential":[48],"due":[51],"to":[52,55,124],"mismatch":[53,74],"effect":[54,206],"noise.":[58],"This":[59],"enables":[60],"high":[61,73,114],"immunity":[69],"of":[70,158,175,185,207,223],"200V/ns":[71],"tolerance":[75,130],"not":[76],"less":[77],"than":[78],"15%.":[79],"Moreover,":[80],"dynamic":[82],"discharge":[83],"control":[84],"(DDC)":[85],"circuit":[86],"prevents":[87],"coupling":[88],"capacitor":[89],"from":[90],"charging":[91],"floating":[93,127],"power":[94,120,128,173],"rail":[95,129],"within":[96,212],"wide":[98],"negative":[99,126,213],"transition":[107,221],"range":[108,222],"achieves":[110],"fast":[111],"reset":[112],"frequency":[115],"operation.":[116],"High":[117],"speed,":[118],"low":[119],"consumption":[121,174],"down":[123],"\u22125V":[125],"are":[131],"also":[132],"achieved.":[133],"The":[134,205],"proposed":[135,165],"fabricated":[139],"in":[140],"0.5-":[142],"notation=\"LaTeX\">$\\mu":[147,200],"\\text{m}$":[148],"BCD":[150],"process":[151],"occupies":[153],"an":[154],"active":[155],"chip":[156],"area":[157],"0.051mm2.":[159],"Experimental":[160],"results":[161],"confirm":[162],"that":[163],"works":[168],"at":[169],"50V":[170],"50MHz,":[171],"achieving":[172],"27.3pJ/transition":[176],"1.26ns":[178],"average":[179],"delay":[180],"small":[183],"figure":[184],"merit":[186],"(5.5(pJ":[187],"notation=\"LaTeX\">$\\cdot":[192],"$":[193],"ns)/(":[195],"\\text{m}^{3}\\cdot":[201],"\\text{V}$":[202],")).":[204],"DDC":[209],"confirmed":[211],"\u22125V/ns":[224],"notation=\"LaTeX\">$\\sim":[229],"-50\\text{V}$":[230],"/ns.":[232]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}