{"id":"https://openalex.org/W4312414103","doi":"https://doi.org/10.1109/tcsi.2022.3227582","title":"Double-Ended Superposition Anti-Noise Resistance Monitoring Write Termination Scheme for Reliable Write Operation in STT-MRAM","display_name":"Double-Ended Superposition Anti-Noise Resistance Monitoring Write Termination Scheme for Reliable Write Operation in STT-MRAM","publication_year":2022,"publication_date":"2022-12-20","ids":{"openalex":"https://openalex.org/W4312414103","doi":"https://doi.org/10.1109/tcsi.2022.3227582"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2022.3227582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3227582","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003760272","display_name":"An Yang","orcid":"https://orcid.org/0000-0002-1067-5349"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"An Yang","raw_affiliation_strings":["Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China"],"raw_orcid":"https://orcid.org/0000-0002-1067-5349","affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022875298","display_name":"Zhilin Jiang","orcid":"https://orcid.org/0000-0002-6452-1986"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhilin Jiang","raw_affiliation_strings":["Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China"],"raw_orcid":"https://orcid.org/0000-0002-6452-1986","affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111943026","display_name":"Zheng Huang","orcid":"https://orcid.org/0009-0003-3517-1512"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Huang","raw_affiliation_strings":["Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010103605","display_name":"Zitong Zhang","orcid":"https://orcid.org/0000-0002-4802-156X"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zitong Zhang","raw_affiliation_strings":["Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China"],"raw_orcid":"https://orcid.org/0000-0002-4802-156X","affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063128754","display_name":"Yanfeng Jiang","orcid":"https://orcid.org/0000-0002-5006-5190"},"institutions":[{"id":"https://openalex.org/I111599522","display_name":"Jiangnan University","ror":"https://ror.org/04mkzax54","country_code":"CN","type":"education","lineage":["https://openalex.org/I111599522"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanfeng Jiang","raw_affiliation_strings":["Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China"],"raw_orcid":"https://orcid.org/0000-0002-5006-5190","affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Internet of Things (IoT) Engineering College, Institute of Advanced Technology, Jiangnan University, Wuxi, China","institution_ids":["https://openalex.org/I111599522"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111599522"],"apc_list":null,"apc_paid":null,"fwci":0.5301,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.63279806,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"70","issue":"3","first_page":"1147","last_page":"1160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.5433273315429688},{"id":"https://openalex.org/keywords/superposition-principle","display_name":"Superposition principle","score":0.5317935347557068},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.525477945804596},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.5139393210411072},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5027904510498047},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5014100074768066},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46675682067871094},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.46430283784866333},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.45866858959198},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4482361674308777},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.438533216714859},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4300311803817749},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3573535084724426},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3544045090675354},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32813531160354614},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21391454339027405},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.177381694316864},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.16244232654571533},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11108982563018799},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.10397255420684814},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.0964576005935669}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.5433273315429688},{"id":"https://openalex.org/C27753989","wikidata":"https://www.wikidata.org/wiki/Q284885","display_name":"Superposition principle","level":2,"score":0.5317935347557068},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.525477945804596},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.5139393210411072},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5027904510498047},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5014100074768066},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46675682067871094},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.46430283784866333},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.45866858959198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4482361674308777},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.438533216714859},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4300311803817749},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3573535084724426},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3544045090675354},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32813531160354614},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21391454339027405},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.177381694316864},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.16244232654571533},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11108982563018799},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.10397255420684814},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0964576005935669},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2022.3227582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3227582","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[{"id":"https://openalex.org/G7855882657","display_name":null,"funder_award_id":"61774078","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":61,"referenced_works":["https://openalex.org/W1963704246","https://openalex.org/W1964242651","https://openalex.org/W1978910126","https://openalex.org/W1984380471","https://openalex.org/W1985330137","https://openalex.org/W2009059573","https://openalex.org/W2010202670","https://openalex.org/W2029967745","https://openalex.org/W2035257891","https://openalex.org/W2035925590","https://openalex.org/W2040579068","https://openalex.org/W2048303158","https://openalex.org/W2052515107","https://openalex.org/W2060225205","https://openalex.org/W2065245972","https://openalex.org/W2067005125","https://openalex.org/W2096518574","https://openalex.org/W2106486935","https://openalex.org/W2114027796","https://openalex.org/W2120247972","https://openalex.org/W2122214001","https://openalex.org/W2122287325","https://openalex.org/W2129416463","https://openalex.org/W2136728320","https://openalex.org/W2138384063","https://openalex.org/W2139052244","https://openalex.org/W2147657366","https://openalex.org/W2161976002","https://openalex.org/W2166535941","https://openalex.org/W2210241002","https://openalex.org/W2237390331","https://openalex.org/W2255015856","https://openalex.org/W2303314981","https://openalex.org/W2309003810","https://openalex.org/W2483773999","https://openalex.org/W2525037638","https://openalex.org/W2559761086","https://openalex.org/W2757632807","https://openalex.org/W2787664620","https://openalex.org/W2796129752","https://openalex.org/W2901476964","https://openalex.org/W2944557803","https://openalex.org/W2946532083","https://openalex.org/W2957872112","https://openalex.org/W2971174442","https://openalex.org/W3037275235","https://openalex.org/W3090694869","https://openalex.org/W3111262097","https://openalex.org/W3142458602","https://openalex.org/W3210883640","https://openalex.org/W4205612678","https://openalex.org/W4205947134","https://openalex.org/W4212978797","https://openalex.org/W4225905133","https://openalex.org/W4232270958","https://openalex.org/W4235183299","https://openalex.org/W4235904384","https://openalex.org/W6650614452","https://openalex.org/W6675050829","https://openalex.org/W6683132901","https://openalex.org/W6811148076"],"related_works":["https://openalex.org/W2154145758","https://openalex.org/W2110839220","https://openalex.org/W4310296159","https://openalex.org/W3090694869","https://openalex.org/W2325040699","https://openalex.org/W2949071089","https://openalex.org/W2138539187","https://openalex.org/W2775062502","https://openalex.org/W2082176851","https://openalex.org/W2053154428"],"abstract_inverted_index":{"Although":[0],"resistance":[1],"monitoring":[2],"write":[3,12,49,135],"termination":[4,50],"(RM-WT)":[5],"scheme":[6,52,110,155],"for":[7,99],"STT-MRAM":[8],"can":[9,67],"reduce":[10],"the":[11,14,36,39,59,82,85,89,107,130,140,150],"energy,":[13],"degradation":[15],"of":[16,28,38,84],"read":[17,125],"margin":[18,73,115],"due":[19],"to":[20,70,80,96,149],"low":[21],"tunnel":[22],"magnetoresistance":[23],"ratio":[24],"(TMR)":[25],"and":[26,55,65,121,139,145],"intrusion":[27],"noise":[29],"with":[30,129],"process":[31],"variation":[32],"still":[33],"seriously":[34],"deteriorates":[35],"stability":[37,100],"WT":[40,91,132],"operation.":[41],"In":[42],"this":[43],"paper,":[44],"a":[45],"double-ended":[46],"superposition":[47],"anti-noise":[48],"(DSA-WT)":[51],"is":[53,78,94],"proposed":[54,108],"implemented,":[56],"in":[57,88],"which":[58,93],"voltage":[60],"changes":[61],"on":[62,103],"both":[63],"BL":[64],"SL":[66],"be":[68,97],"superimposed":[69],"boost":[71],"sensing":[72,114],"(SM).":[74],"Schmitt":[75],"trigger":[76],"(ST)":[77],"adopted":[79],"take":[81],"place":[83],"inverter":[86],"(INV)":[87],"traditional":[90],"scheme,":[92],"demonstrated":[95],"helpful":[98],"improvement.":[101],"Based":[102],"65-nm":[104],"CMOS":[105],"technology,":[106],"DSA-WT":[109],"shows":[111],"15%":[112],"~33%":[113],"boosting":[116],"under":[117],"various":[118],"PVT":[119],"conditions":[120],"1000":[122],"times":[123],"lower":[124],"bit-error-rate":[126],"(BER)":[127],"compared":[128,148],"other":[131],"schemes.":[133],"The":[134],"done":[136],"(WD)":[137],"delay":[138],"energy-delay-product":[141],"(EDP)":[142],"achieve":[143],"49.6%":[144],"47.2%":[146],"improvements":[147],"state-of-art":[151],"self-referenced":[152],"single-ended":[153],"RM-WT":[154],"(SS-RM-WT),":[156],"respectively.":[157]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":3},{"year":2023,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}