{"id":"https://openalex.org/W4285192130","doi":"https://doi.org/10.1109/tcsi.2022.3187068","title":"An Active EMI Cancellation Technique Achieving a 25-dB Reduction in Conducted EMI of LIN Drivers","display_name":"An Active EMI Cancellation Technique Achieving a 25-dB Reduction in Conducted EMI of LIN Drivers","publication_year":2022,"publication_date":"2022-07-08","ids":{"openalex":"https://openalex.org/W4285192130","doi":"https://doi.org/10.1109/tcsi.2022.3187068"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2022.3187068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3187068","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086999541","display_name":"Abhishek Ray","orcid":"https://orcid.org/0000-0003-0587-1828"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Abhishek Ray","raw_affiliation_strings":["School of Electrical and Computer Engineering, Arizona State University, Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024940586","display_name":"Raveesh Magod","orcid":"https://orcid.org/0000-0003-1014-8802"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raveesh Magod","raw_affiliation_strings":["Texas Instruments Inc., Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028899416","display_name":"Bhushan Talele","orcid":"https://orcid.org/0000-0002-5367-9577"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bhushan Talele","raw_affiliation_strings":["Qualcomm Technologies, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Qualcomm Technologies, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066797388","display_name":"Shashank Alevoor","orcid":"https://orcid.org/0000-0001-6766-5638"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shashank Alevoor","raw_affiliation_strings":["School of Electrical and Computer Engineering, Arizona State University, Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060369113","display_name":"T. Mayhugh","orcid":"https://orcid.org/0000-0002-5768-2829"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Terry Mayhugh","raw_affiliation_strings":["Texas Instruments Inc., Dallas, TX, USA"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024809556","display_name":"Bertan Bakkalo\u011flu","orcid":"https://orcid.org/0000-0003-4135-7367"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bertan Bakkaloglu","raw_affiliation_strings":["School of Electrical and Computer Engineering, Arizona State University, Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Arizona State University, Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5086999541"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":0.366,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.56457152,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"69","issue":"9","first_page":"3829","last_page":"3840"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.8168763518333435},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.6413106918334961},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5960354804992676},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5607950687408447},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.47708114981651306},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4645412266254425},{"id":"https://openalex.org/keywords/active-noise-control","display_name":"Active noise control","score":0.4489554166793823},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4299916625022888},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.32610270380973816},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2734631597995758}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.8168763518333435},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.6413106918334961},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5960354804992676},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5607950687408447},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.47708114981651306},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4645412266254425},{"id":"https://openalex.org/C100342000","wikidata":"https://www.wikidata.org/wiki/Q583234","display_name":"Active noise control","level":3,"score":0.4489554166793823},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4299916625022888},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.32610270380973816},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2734631597995758},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2022.3187068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3187068","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7900000214576721,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2004293843","https://openalex.org/W2071746043","https://openalex.org/W2100534912","https://openalex.org/W2100952010","https://openalex.org/W2131744673","https://openalex.org/W2134641862","https://openalex.org/W2137264617","https://openalex.org/W2160916000","https://openalex.org/W2180333551","https://openalex.org/W2204128128","https://openalex.org/W2219134508","https://openalex.org/W2765996723","https://openalex.org/W2791338777","https://openalex.org/W2810199523","https://openalex.org/W3019884332","https://openalex.org/W6634435279"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W2018141764","https://openalex.org/W4385545073","https://openalex.org/W2163032211","https://openalex.org/W2947603830"],"abstract_inverted_index":{"Robustness":[0],"to":[1,81,95,129],"electromagnetic":[2,97],"interference":[3],"(EMI)":[4],"is":[5,56,100,115,171,218],"one":[6],"of":[7,12,14,29,41,45,69,86,149,162,186,195,210,222,234,241],"the":[8,15,37,42,49,65,70,83,87,91,119,131,163,223,245,252],"primary":[9,43],"design":[10],"aspects":[11],"state":[13],"art":[16],"automotive":[17,200],"ICs":[18],"like":[19],"System":[20],"Basis":[21],"Chips":[22],"(SBCs)":[23],"which":[24,114,217],"provide":[25],"a":[26,109,176,187,192,227],"wide":[27],"range":[28],"analog,":[30],"power":[31,184,235,249],"regulation":[32],"and":[33,144,152,159,173,230,236,255],"digital":[34],"functions":[35],"on":[36,48,90,175],"same":[38],"die.":[39],"One":[40],"sources":[44],"conducted":[46,242],"EMI":[47,78,105,139,168,204,243],"Local":[50],"Interconnect":[51],"Network":[52],"(LIN)":[53],"driver":[54,93,121,247],"output":[55,94,122],"an":[57,75,124,182,199,208],"integrated":[58,183],"switching":[59,84,132,165,193,253],"DC-DC":[60,88,164,188],"regulator":[61,89,190],"noise":[62,85,133,147],"coupling":[63],"through":[64],"parasitic":[66],"substrate":[67,146],"capacitance":[68],"SBC.":[71],"In":[72],"this":[73],"paper":[74],"adaptive":[76],"active":[77,104],"cancellation":[79,106,112,169,205],"technique":[80,141],"cancel":[82,130,145],"LIN":[92,120,201,246],"ensure":[96],"compatibility":[98],"(EMC)":[99],"presented.":[101],"The":[102,137,167,203],"proposed":[103,138],"circuit":[107,206],"synthesizes":[108],"phase":[110],"synchronized":[111],"pulse":[113],"then":[116],"injected":[117,134],"onto":[118],"using":[123],"on-chip":[125],"tunable":[126],"capacitor":[127],"array":[128],"via":[135],"substrate.":[136],"reduction":[140,240],"can":[142],"track":[143],"independent":[148],"process":[150,180],"technology":[151],"device":[153],"parasitics,":[154],"input":[155],"voltage,":[156],"duty":[157],"cycle":[158],"loading":[160],"conditions":[161],"regulator.":[166],"system":[170],"designed":[172],"fabricated":[174],"180nm":[177],"Bipolar-CMOS-DMOS":[178],"(BCD)":[179],"with":[181,198],"stage":[185],"buck":[189],"at":[191,251],"frequency":[194,254],"2MHz":[196],"along":[197],"driver.":[202],"occupies":[207],"area":[209,225],"0.7":[211],"mm":[212],"<sup":[213],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[214],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[215],",":[216],"less":[219],"than":[220],"3%":[221],"overall":[224],"in":[226,244],"standard":[228],"SBC":[229],"consumes":[231],"12.5":[232],"mW":[233],"achieves":[237],"25":[238],"dB":[239],"output\u2019s":[248],"spectrum":[250],"its":[256],"harmonics.":[257]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}