{"id":"https://openalex.org/W4226395151","doi":"https://doi.org/10.1109/tcsi.2022.3168082","title":"A Low-Cost Error-Tolerant Flip-Flop Against SET and SEU for Dependable Designs","display_name":"A Low-Cost Error-Tolerant Flip-Flop Against SET and SEU for Dependable Designs","publication_year":2022,"publication_date":"2022-04-27","ids":{"openalex":"https://openalex.org/W4226395151","doi":"https://doi.org/10.1109/tcsi.2022.3168082"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2022.3168082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3168082","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066052627","display_name":"Jie Li","orcid":"https://orcid.org/0000-0001-9359-3586"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jie Li","raw_affiliation_strings":["Microelectronic Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronic Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100651217","display_name":"Liyi Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyi Xiao","raw_affiliation_strings":["Microelectronic Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronic Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050920606","display_name":"Linzhe Li","orcid":"https://orcid.org/0000-0002-4941-3127"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linzhe Li","raw_affiliation_strings":["Microelectronic Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronic Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101665493","display_name":"Hongchen Li","orcid":"https://orcid.org/0000-0001-8593-7182"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongchen Li","raw_affiliation_strings":["Microelectronic Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronic Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101915942","display_name":"He Liu","orcid":"https://orcid.org/0000-0002-9196-4213"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Liu","raw_affiliation_strings":["Microelectronic Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronic Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087342788","display_name":"C.P. Wang","orcid":"https://orcid.org/0000-0003-1820-1583"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenxu Wang","raw_affiliation_strings":["Microelectronic Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronic Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5066052627"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":2.1037,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.87000908,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"69","issue":"7","first_page":"2721","last_page":"2729"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7062740921974182},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6502953171730042},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.6345669627189636},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.547217607498169},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5197470188140869},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5190489888191223},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4913863241672516},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.43764370679855347},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39293134212493896},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.390217125415802},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36937442421913147},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3581458628177643},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35408490896224976},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2502235174179077},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.13295519351959229}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7062740921974182},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6502953171730042},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.6345669627189636},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.547217607498169},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5197470188140869},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5190489888191223},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4913863241672516},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.43764370679855347},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39293134212493896},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.390217125415802},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36937442421913147},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3581458628177643},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35408490896224976},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2502235174179077},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.13295519351959229},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2022.3168082","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3168082","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1482110916","https://openalex.org/W1712657869","https://openalex.org/W1971670074","https://openalex.org/W1979004402","https://openalex.org/W1997082362","https://openalex.org/W2033101262","https://openalex.org/W2033453286","https://openalex.org/W2048751700","https://openalex.org/W2050431855","https://openalex.org/W2062980181","https://openalex.org/W2100250713","https://openalex.org/W2102085167","https://openalex.org/W2113810691","https://openalex.org/W2120185818","https://openalex.org/W2126481660","https://openalex.org/W2141068710","https://openalex.org/W2144207655","https://openalex.org/W2153953229","https://openalex.org/W2159575344","https://openalex.org/W2167002145","https://openalex.org/W2519196746","https://openalex.org/W2560787762","https://openalex.org/W2789313053","https://openalex.org/W2894057114","https://openalex.org/W2898009658","https://openalex.org/W2908947028","https://openalex.org/W2944852501","https://openalex.org/W2945088394","https://openalex.org/W2953246255","https://openalex.org/W2972617630","https://openalex.org/W2994746163","https://openalex.org/W2998784970","https://openalex.org/W2999045053","https://openalex.org/W3022287786","https://openalex.org/W3092381027","https://openalex.org/W3104812533","https://openalex.org/W3130547687","https://openalex.org/W3162498735","https://openalex.org/W3173945545","https://openalex.org/W3175109752","https://openalex.org/W3199932465","https://openalex.org/W4236432903"],"related_works":["https://openalex.org/W2149051075","https://openalex.org/W2791974206","https://openalex.org/W2153922221","https://openalex.org/W2119299082","https://openalex.org/W2071076777","https://openalex.org/W2027828053","https://openalex.org/W2294537163","https://openalex.org/W2783649485","https://openalex.org/W2017486119","https://openalex.org/W2018408080"],"abstract_inverted_index":{"Computing":[0],"systems":[1],"working":[2],"in":[3,101,158],"harsh":[4],"environment":[5],"is":[6,74],"prone":[7],"to":[8,63,126],"suffer":[9],"from":[10,88],"radiation-induced":[11],"soft":[12],"errors;":[13],"for":[14,30,76,144,168],"example,":[15],"Single":[16,21],"Event":[17,22],"Upsets":[18],"(SEUs)":[19],"and":[20,45,71,155,166],"Transients":[23],"(SETs)":[24],"are":[25,61],"the":[26,53,65,77,82,89,93,97,119,123,145],"major":[27],"reliability":[28],"issue":[29],"circuits":[31],"fabricated":[32],"with":[33,96,109,147],"nanoscale":[34],"technology":[35],"nodes.":[36],"In":[37],"this":[38],"paper,":[39],"we":[40],"proposed":[41],"a":[42,72,128],"low-cost":[43],"SET":[44],"SEU":[46],"error":[47],"tolerant":[48,107],"flip-flop":[49],"(SETU-TOFF).":[50],"Based":[51],"on":[52],"traditional":[54],"flip-flop,":[55],"two":[56],"high-level":[57],"sensitive":[58],"redundant":[59],"latches":[60],"added":[62],"latch":[64],"input":[66],"data":[67],"at":[68],"different":[69],"times,":[70],"voter":[73],"designed":[75],"correct":[78,156],"output.":[79],"It":[80],"removes":[81],"timing":[83],"overhead":[84],"of":[85,92,118,130],"temporal":[86],"redundancy":[87],"critical":[90],"path":[91],"systems.":[94],"Comparing":[95],"existing":[98],"designs":[99],"presented":[100],"literatures,":[102],"SETU-TOFF":[103,124,139],"has":[104],"comprehensive":[105],"fault":[106],"capability":[108],"lower":[110],"overheads;":[111],"moreover,":[112],"it":[113,152],"doesn\u2019t":[114],"increase":[115],"significant":[116],"latency":[117],"flip-flops.":[120],"We":[121],"use":[122],"cells":[125],"protect":[127],"pipeline":[129,146],"an":[131],"OpenRISC":[132],"microprocessor.":[133],"Fault":[134],"injection":[135],"simulations":[136],"show":[137],"that":[138],"can":[140,153],"achieve":[141],"100%":[142],"protection":[143],"negligible":[148],"performance":[149],"loss;":[150],"additionally,":[151],"detect":[154],"errors":[157,169],"real":[159],"time":[160],"without":[161],"extra":[162],"system":[163],"control":[164],"logic":[165],"clocks":[167],"recovery.":[170]},"counts_by_year":[{"year":2025,"cited_by_count":12},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}