{"id":"https://openalex.org/W4226238110","doi":"https://doi.org/10.1109/tcsi.2022.3156165","title":"Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture","display_name":"Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture","publication_year":2022,"publication_date":"2022-03-10","ids":{"openalex":"https://openalex.org/W4226238110","doi":"https://doi.org/10.1109/tcsi.2022.3156165"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2022.3156165","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3156165","pdf_url":"https://ieeexplore.ieee.org/ielx7/8919/9782465/09732897.pdf","source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/8919/9782465/09732897.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025566655","display_name":"Mikail Yayla","orcid":"https://orcid.org/0000-0002-4134-952X"},"institutions":[{"id":"https://openalex.org/I200332995","display_name":"TU Dortmund University","ror":"https://ror.org/01k97gp34","country_code":"DE","type":"education","lineage":["https://openalex.org/I200332995"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Mikail Yayla","raw_affiliation_strings":["Design Automation for Embedded Systems Group, TU Dortmund University, Dortmund, Germany"],"affiliations":[{"raw_affiliation_string":"Design Automation for Embedded Systems Group, TU Dortmund University, Dortmund, Germany","institution_ids":["https://openalex.org/I200332995"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054764590","display_name":"Simon Thomann","orcid":"https://orcid.org/0000-0002-7902-9353"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Simon Thomann","raw_affiliation_strings":["Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058070822","display_name":"Sebastian Buschj\u00e4ger","orcid":"https://orcid.org/0000-0002-2780-3618"},"institutions":[{"id":"https://openalex.org/I200332995","display_name":"TU Dortmund University","ror":"https://ror.org/01k97gp34","country_code":"DE","type":"education","lineage":["https://openalex.org/I200332995"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sebastian Buschjager","raw_affiliation_strings":["Artificial Intelligence Group, TU Dortmund University, Dortmund, Germany"],"affiliations":[{"raw_affiliation_string":"Artificial Intelligence Group, TU Dortmund University, Dortmund, Germany","institution_ids":["https://openalex.org/I200332995"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065328227","display_name":"Katharina Morik","orcid":"https://orcid.org/0000-0003-1153-5986"},"institutions":[{"id":"https://openalex.org/I200332995","display_name":"TU Dortmund University","ror":"https://ror.org/01k97gp34","country_code":"DE","type":"education","lineage":["https://openalex.org/I200332995"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Katharina Morik","raw_affiliation_strings":["Artificial Intelligence Group, TU Dortmund University, Dortmund, Germany"],"affiliations":[{"raw_affiliation_string":"Artificial Intelligence Group, TU Dortmund University, Dortmund, Germany","institution_ids":["https://openalex.org/I200332995"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000417436","display_name":"Jian-Jia Chen","orcid":"https://orcid.org/0000-0001-8114-9760"},"institutions":[{"id":"https://openalex.org/I200332995","display_name":"TU Dortmund University","ror":"https://ror.org/01k97gp34","country_code":"DE","type":"education","lineage":["https://openalex.org/I200332995"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jian-Jia Chen","raw_affiliation_strings":["Design Automation for Embedded Systems Group, TU Dortmund University, Dortmund, Germany"],"affiliations":[{"raw_affiliation_string":"Design Automation for Embedded Systems Group, TU Dortmund University, Dortmund, Germany","institution_ids":["https://openalex.org/I200332995"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5025566655"],"corresponding_institution_ids":["https://openalex.org/I200332995"],"apc_list":null,"apc_paid":null,"fwci":1.385,"has_fulltext":true,"cited_by_count":16,"citation_normalized_percentile":{"value":0.80047299,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"69","issue":"6","first_page":"2516","last_page":"2528"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/xnor-gate","display_name":"XNOR gate","score":0.9032509326934814},{"id":"https://openalex.org/keywords/von-neumann-architecture","display_name":"Von Neumann architecture","score":0.7572813034057617},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6649477481842041},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6593173146247864},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5894272327423096},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.5435315370559692},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.41012120246887207},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3741258978843689},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3528926968574524},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3207903504371643},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.30934393405914307},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.28485649824142456},{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.1712242066860199}],"concepts":[{"id":"https://openalex.org/C57684291","wikidata":"https://www.wikidata.org/wiki/Q1336142","display_name":"XNOR gate","level":4,"score":0.9032509326934814},{"id":"https://openalex.org/C80469333","wikidata":"https://www.wikidata.org/wiki/Q189088","display_name":"Von Neumann architecture","level":2,"score":0.7572813034057617},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6649477481842041},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6593173146247864},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5894272327423096},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.5435315370559692},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.41012120246887207},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3741258978843689},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3528926968574524},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3207903504371643},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.30934393405914307},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.28485649824142456},{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.1712242066860199},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2022.3156165","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3156165","pdf_url":"https://ieeexplore.ieee.org/ielx7/8919/9782465/09732897.pdf","source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tcsi.2022.3156165","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2022.3156165","pdf_url":"https://ieeexplore.ieee.org/ielx7/8919/9782465/09732897.pdf","source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2914956538","display_name":null,"funder_award_id":"428566201","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G3988035882","display_name":null,"funder_award_id":"124020371","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G4104976561","display_name":null,"funder_award_id":"405422836","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G5106512922","display_name":null,"funder_award_id":"Deutsche Forschungsgemeinschaft (DFG","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G5523801029","display_name":null,"funder_award_id":"SFB 876","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G5753141157","display_name":null,"funder_award_id":"12402037","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G6024419964","display_name":null,"funder_award_id":"Deutsche Forschungsgemeinschaft (DFG)","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G6052429835","display_name":null,"funder_award_id":"(DFG)","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G762232396","display_name":null,"funder_award_id":"Project","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G8563023929","display_name":null,"funder_award_id":"subproject A1","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4226238110.pdf","grobid_xml":"https://content.openalex.org/works/W4226238110.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W2068529248","https://openalex.org/W2078813375","https://openalex.org/W2108971405","https://openalex.org/W2154763313","https://openalex.org/W2775637085","https://openalex.org/W2798654995","https://openalex.org/W2800341536","https://openalex.org/W2887419953","https://openalex.org/W2932447952","https://openalex.org/W2946942415","https://openalex.org/W2979960955","https://openalex.org/W2988640543","https://openalex.org/W3009651049","https://openalex.org/W3017521908","https://openalex.org/W3019181959","https://openalex.org/W3020870837","https://openalex.org/W3024722044","https://openalex.org/W3033330790","https://openalex.org/W3038698523","https://openalex.org/W3103339143","https://openalex.org/W3104353813","https://openalex.org/W3134450385","https://openalex.org/W3137833672","https://openalex.org/W3167846368","https://openalex.org/W3185026020","https://openalex.org/W3194966730","https://openalex.org/W6637373629","https://openalex.org/W6693397755","https://openalex.org/W6766978945","https://openalex.org/W6768921883"],"related_works":["https://openalex.org/W4385413421","https://openalex.org/W4386414224","https://openalex.org/W2532170798","https://openalex.org/W2783592119","https://openalex.org/W2963244787","https://openalex.org/W2966758645","https://openalex.org/W2774773774","https://openalex.org/W2785627314","https://openalex.org/W1963739940","https://openalex.org/W2069684819"],"abstract_inverted_index":{"Specialized":[0],"hardware":[1],"accelerators":[2],"beyond":[3],"von-Neumann,":[4],"that":[5,103,117,138],"offer":[6],"processing":[7],"capability":[8],"in":[9,19,47,75,124],"where":[10],"the":[11,42,52,56,76,86,91],"data":[12],"resides":[13],"without":[14],"moving":[15],"it,":[16],"become":[17],"inevitable":[18],"data-centric":[20],"computing.":[21],"Emerging":[22],"non-volatile":[23],"memories,":[24],"like":[25],"Ferroelectric":[26],"Field-Effect":[27],"Transistor":[28],"(FeFET),":[29],"are":[30],"able":[31],"to":[32],"build":[33],"compact":[34],"Logic-in-Memory":[35],"(LiM).":[36],"In":[37],"this":[38],"work,":[39],"we":[40,64,97],"investigate":[41],"probability":[43],"of":[44,78],"error":[45],"(Perror)":[46],"FeFET-based":[48],"XNOR":[49,108,149],"LiM,":[50],"demonstrating":[51],"new":[53],"trade-off":[54,92],"between":[55,93],"speed":[57,109],"and":[58,95,107,132,141,144,146],"reliability.":[59],"Using":[60],"our":[61,130],"reliability":[62],"model,":[63],"present":[65,98],"how":[66],"Binarized":[67],"Neural":[68],"Networks":[69],"(BNNs)":[70],"can":[71],"be":[72,128],"proactively":[73],"trained":[74],"presence":[77],"XNOR-induced":[79],"errors":[80],"towards":[81],"obtaining":[82],"robust":[83],"BNNs":[84,137],"at":[85],"design":[87],"time.":[88],"Furthermore,":[89],"leveraging":[90],"Perror":[94,106],"speed,":[96],"a":[99,119],"run-time":[100,133],"adaptation":[101],"technique,":[102],"selectively":[104],"trades-off":[105],"for":[110],"every":[111],"BNN":[112],"layer.":[113],"Our":[114],"results":[115],"demonstrate":[116],"when":[118],"small":[120],"loss":[121],"(e.g.,":[122],"1%)":[123],"inference":[125],"accuracy":[126],"could":[127],"accepted,":[129],"design-time":[131],"techniques":[134],"provide":[135],"error-resilient":[136],"exhibit":[139],"75%":[140],"50%":[142],"(FashionMNIST)":[143],"38%":[145],"24%":[147],"(CIFAR10)":[148],"speedups,":[150],"respectively.":[151]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":2}],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}