{"id":"https://openalex.org/W3198613190","doi":"https://doi.org/10.1109/tcsi.2021.3106149","title":"Automated Design Approximation to Overcome Circuit Aging","display_name":"Automated Design Approximation to Overcome Circuit Aging","publication_year":2021,"publication_date":"2021-09-01","ids":{"openalex":"https://openalex.org/W3198613190","doi":"https://doi.org/10.1109/tcsi.2021.3106149","mag":"3198613190"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2021.3106149","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2021.3106149","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2203.07962","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006315507","display_name":"Konstantinos Balaskas","orcid":"https://orcid.org/0000-0003-2886-6896"},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Konstantinos Balaskas","raw_affiliation_strings":["Department of Physics, Aristotle University of Thessaloniki, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Physics, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051495057","display_name":"Georgios Zervakis","orcid":"https://orcid.org/0000-0001-8110-7122"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Georgios Zervakis","raw_affiliation_strings":["Chair for Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063508488","display_name":"J\u00f6rg Henkel","orcid":"https://orcid.org/0000-0001-9602-2922"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jorg Henkel","raw_affiliation_strings":["Chair for Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Chair for Embedded Systems, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072486756","display_name":"Kostas Siozios","orcid":"https://orcid.org/0000-0002-0285-2202"},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Kostas Siozios","raw_affiliation_strings":["Department of Physics, Aristotle University of Thessaloniki, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Physics, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5006315507"],"corresponding_institution_ids":["https://openalex.org/I21370196"],"apc_list":null,"apc_paid":null,"fwci":0.8096,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.72172026,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"68","issue":"11","first_page":"4710","last_page":"4721"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6156314015388489},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6028438806533813},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.5948498249053955},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.41477546095848083},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3923141062259674},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.36391109228134155},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28254345059394836},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.22897574305534363},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14652973413467407},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10793942213058472}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6156314015388489},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6028438806533813},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.5948498249053955},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.41477546095848083},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3923141062259674},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.36391109228134155},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28254345059394836},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22897574305534363},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14652973413467407},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10793942213058472}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2021.3106149","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2021.3106149","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2203.07962","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2203.07962","pdf_url":"https://arxiv.org/pdf/2203.07962","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2203.07962","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2203.07962","pdf_url":"https://arxiv.org/pdf/2203.07962","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":58,"referenced_works":["https://openalex.org/W324409780","https://openalex.org/W1970845025","https://openalex.org/W1982780415","https://openalex.org/W2013135496","https://openalex.org/W2015424449","https://openalex.org/W2020217519","https://openalex.org/W2034349555","https://openalex.org/W2035378788","https://openalex.org/W2044694954","https://openalex.org/W2047663435","https://openalex.org/W2069345435","https://openalex.org/W2082973036","https://openalex.org/W2106075707","https://openalex.org/W2115016937","https://openalex.org/W2140145164","https://openalex.org/W2167021379","https://openalex.org/W2323130283","https://openalex.org/W2342766585","https://openalex.org/W2346021534","https://openalex.org/W2396345169","https://openalex.org/W2495023379","https://openalex.org/W2587701905","https://openalex.org/W2607445385","https://openalex.org/W2612139336","https://openalex.org/W2621017693","https://openalex.org/W2625439172","https://openalex.org/W2775114336","https://openalex.org/W2884983013","https://openalex.org/W2898581147","https://openalex.org/W2902661604","https://openalex.org/W2908807758","https://openalex.org/W2912921810","https://openalex.org/W2921026389","https://openalex.org/W2922461735","https://openalex.org/W2958306322","https://openalex.org/W2971844763","https://openalex.org/W2972778739","https://openalex.org/W2979792834","https://openalex.org/W2979925167","https://openalex.org/W3008930998","https://openalex.org/W3011748007","https://openalex.org/W3021587158","https://openalex.org/W3024722044","https://openalex.org/W3081792356","https://openalex.org/W3083485280","https://openalex.org/W3110814181","https://openalex.org/W3133966460","https://openalex.org/W3142835241","https://openalex.org/W3184673655","https://openalex.org/W4205623694","https://openalex.org/W4229947305","https://openalex.org/W4235991875","https://openalex.org/W4243410967","https://openalex.org/W4244112173","https://openalex.org/W4253089598","https://openalex.org/W4254991892","https://openalex.org/W6642899326","https://openalex.org/W6680702329"],"related_works":["https://openalex.org/W2170314243","https://openalex.org/W2119179026","https://openalex.org/W2794947590","https://openalex.org/W2114971758","https://openalex.org/W2109932036","https://openalex.org/W2093081283","https://openalex.org/W4386694274","https://openalex.org/W3146543203","https://openalex.org/W2795180100","https://openalex.org/W2099346120"],"abstract_inverted_index":{"Transistor":[0],"aging":[1,85],"phenomena":[2],"manifest":[3],"themselves":[4],"as":[5,39,83],"degradations":[6],"in":[7,18],"the":[8,34,40,60,63,67,93,120,173,183,186],"main":[9],"electrical":[10],"characteristics":[11],"of":[12,22,62,71,75,141,154,185],"transistors.":[13],"Over":[14],"time,":[15],"they":[16],"result":[17],"a":[19,72,114,127,139],"significant":[20],"increase":[21],"cell":[23],"propagation":[24],"delay,":[25],"leading":[26],"to":[27,30,48,55,124,172],"errors":[28],"due":[29,123],"timing":[31,46,134,169,178],"violations,":[32],"since":[33],"operating":[35],"frequency":[36],"becomes":[37],"unsustainable":[38],"circuit":[41],"ages.":[42],"Conventional":[43],"techniques":[44],"employ":[45],"guardbands":[47,179],"mitigate":[49],"aging-induced":[50,133,168],"delay":[51,121],"increase,":[52],"which":[53],"leads":[54],"considerable":[56],"performance":[57],"losses":[58],"from":[59],"beginning":[61],"circuit\u2019s":[64],"lifetime.":[65],"Leveraging":[66],"inherent":[68],"error":[69,117,153,184],"resilience":[70],"vast":[73],"number":[74],"application":[76],"domains,":[77],"approximate":[78,102],"computing":[79],"was":[80],"recently":[81],"introduced":[82],"an":[84,151],"mitigation":[86],"mechanism.":[87],"In":[88],"this":[89],"work,":[90],"we":[91],"present":[92],"first":[94],"automated":[95],"framework":[96,165,191],"for":[97,150],"generating":[98],"<italic":[99],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[100,157,194],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">aging-aware":[101],"circuits</i>":[103],".":[104],"Our":[105],"framework,":[106],"by":[107,189],"applying":[108],"directed":[109],"gate-level":[110],"netlist":[111],"approximation,":[112],"induces":[113],"small":[115],"functional":[116],"and":[118,144],"recovers":[119],"degradation":[122],"aging.":[125],"As":[126],"result,":[128],"our":[129,164,190],"optimized":[130],"circuits":[131,143,176,187],"eliminate":[132],"errors.":[135],"Experimental":[136],"evaluation":[137],"over":[138],"variety":[140],"arithmetic":[142],"image":[145],"processing":[146],"benchmarks":[147],"demonstrates":[148],"that":[149],"average":[152],"merely":[155],"<inline-formula":[156,193],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[158,195],"<tex-math":[159,196],"notation=\"LaTeX\">$5\\times":[160],"10^{-3}$":[161],"</tex-math></inline-formula>":[162,199],",":[163],"completely":[166],"eliminates":[167],"guardbands.":[170],"Compared":[171],"respective":[174],"baseline":[175],"without":[177],"(i.e.,":[180],"iso-performance":[181],"evaluation),":[182],"generated":[188],"is":[192],"notation=\"LaTeX\">$1208\\times":[197],"$":[198],"smaller.":[200]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}