{"id":"https://openalex.org/W3168375080","doi":"https://doi.org/10.1109/tcsi.2021.3084684","title":"High-Precision Sub-Nyquist Sampling System Based on Modulated Wideband Converter for Communication Device Testing","display_name":"High-Precision Sub-Nyquist Sampling System Based on Modulated Wideband Converter for Communication Device Testing","publication_year":2021,"publication_date":"2021-06-08","ids":{"openalex":"https://openalex.org/W3168375080","doi":"https://doi.org/10.1109/tcsi.2021.3084684","mag":"3168375080"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2021.3084684","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2021.3084684","pdf_url":"https://ieeexplore.ieee.org/ielx7/8919/9684154/09447940.pdf","source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/8919/9684154/09447940.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007407763","display_name":"Zolboo Byambadorj","orcid":"https://orcid.org/0000-0003-3859-4169"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zolboo Byambadorj","raw_affiliation_strings":["Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3859-4169","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057617933","display_name":"Koji Asami","orcid":"https://orcid.org/0000-0002-8263-4423"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Asami","raw_affiliation_strings":["Advantest Laboratories Ltd., Miyagi, Japan"],"raw_orcid":"https://orcid.org/0000-0002-8263-4423","affiliations":[{"raw_affiliation_string":"Advantest Laboratories Ltd., Miyagi, Japan","institution_ids":["https://openalex.org/I4210103901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro J. Yamaguchi","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000680886","display_name":"Akio Higo","orcid":"https://orcid.org/0000-0002-4595-0929"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akio Higo","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-4595-0929","affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027837299","display_name":"Masahiro Fujita","orcid":"https://orcid.org/0000-0002-6516-4175"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Fujita","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-6516-4175","affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007028121","display_name":"Tetsuya Iizuka","orcid":"https://orcid.org/0000-0002-1512-4714"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuya Iizuka","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-1512-4714","affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7259,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.82219413,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"69","issue":"1","first_page":"378","last_page":"388"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11233","display_name":"Advanced Adaptive Filtering Techniques","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10931","display_name":"Direction-of-Arrival Estimation Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.7516809105873108},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5306987166404724},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.5205986499786377},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4911346137523651},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46275779604911804},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.20177879929542542},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1663978099822998}],"concepts":[{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.7516809105873108},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5306987166404724},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.5205986499786377},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4911346137523651},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46275779604911804},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.20177879929542542},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1663978099822998},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2021.3084684","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2021.3084684","pdf_url":"https://ieeexplore.ieee.org/ielx7/8919/9684154/09447940.pdf","source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tcsi.2021.3084684","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tcsi.2021.3084684","pdf_url":"https://ieeexplore.ieee.org/ielx7/8919/9684154/09447940.pdf","source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3168375080.pdf","grobid_xml":"https://content.openalex.org/works/W3168375080.grobid-xml"},"referenced_works_count":49,"referenced_works":["https://openalex.org/W1572162988","https://openalex.org/W1579431389","https://openalex.org/W1716783928","https://openalex.org/W1965224799","https://openalex.org/W1990878583","https://openalex.org/W1993784401","https://openalex.org/W2009927762","https://openalex.org/W2013994110","https://openalex.org/W2030084813","https://openalex.org/W2037070508","https://openalex.org/W2067998771","https://openalex.org/W2071707134","https://openalex.org/W2084810455","https://openalex.org/W2092400178","https://openalex.org/W2114129195","https://openalex.org/W2123629701","https://openalex.org/W2128659236","https://openalex.org/W2138787877","https://openalex.org/W2147993722","https://openalex.org/W2171372399","https://openalex.org/W2178459682","https://openalex.org/W2421528993","https://openalex.org/W2486903205","https://openalex.org/W2500768872","https://openalex.org/W2517800102","https://openalex.org/W2547793102","https://openalex.org/W2593237072","https://openalex.org/W2594151784","https://openalex.org/W2607444723","https://openalex.org/W2610972779","https://openalex.org/W2740607275","https://openalex.org/W2783677359","https://openalex.org/W2807869502","https://openalex.org/W2907984103","https://openalex.org/W2912056303","https://openalex.org/W2943643282","https://openalex.org/W2944789664","https://openalex.org/W2949995217","https://openalex.org/W2974806135","https://openalex.org/W2980654335","https://openalex.org/W3007484925","https://openalex.org/W3023378638","https://openalex.org/W3039488810","https://openalex.org/W3082527214","https://openalex.org/W3108997813","https://openalex.org/W3116463515","https://openalex.org/W3117545963","https://openalex.org/W4240584738","https://openalex.org/W6677500593"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2610414734","https://openalex.org/W3112081258","https://openalex.org/W2292639271","https://openalex.org/W3116463515","https://openalex.org/W3110712034","https://openalex.org/W2003802220","https://openalex.org/W4200009461","https://openalex.org/W4280643942","https://openalex.org/W2379572111"],"abstract_inverted_index":{"This":[0,78],"paper":[1,79],"proposes":[2],"a":[3,8,89],"new":[4],"method":[5,20,59],"of":[6,38,75,84,95,106,124,136],"constructing":[7],"compensation":[9,55,113],"filter":[10],"for":[11,92,151],"the":[12,26,34,39,44,53,64,72,76,82,85,93,96,103,107,111,117,120,133,137,139],"modulated":[13],"wideband":[14],"converter":[15],"(MWC)":[16],"system.":[17],"The":[18,57,99],"proposed":[19,54,58,112],"can":[21,60],"be":[22,61],"directly":[23],"used":[24],"in":[25,52,63,71,116,126],"MWC":[27,66,100,127],"circuit":[28],"without":[29],"disconnecting":[30],"any":[31],"components.":[32],"Furthermore,":[33],"non-ideal":[35],"transfer":[36],"characteristics":[37],"real":[40,45],"mixer":[41],"output":[42],"and":[43],"ADC":[46],"input":[47],"are":[48],"taken":[49],"into":[50],"account":[51],"filter.":[56,114],"utilized":[62],"advanced":[65],"that":[67,119],"enables":[68],"more":[69],"flexibility":[70],"design":[73],"parameters":[74],"MWC.":[77],"also":[80],"demonstrates":[81],"reconstruction":[83,97],"Bluetooth":[86,152],"signal":[87,108],"as":[88,130],"practical":[90],"example":[91],"evaluation":[94],"performance.":[98],"successfully":[101],"reconstructs":[102],"time-domain":[104],"waveform":[105],"based":[109],"on":[110],"Even":[115],"case":[118],"total":[121],"effective":[122],"number":[123],"channels":[125],"is":[128,149],"small":[129],"close":[131],"to":[132],"necessary":[134],"condition":[135],"MWC,":[138],"error":[140],"vector":[141],"magnitude":[142],"(EVM)":[143],"was":[144],"still":[145],"under":[146],"1%,":[147],"which":[148],"acceptable":[150],"device":[153],"testing":[154],"applications.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}