{"id":"https://openalex.org/W3142835241","doi":"https://doi.org/10.1109/tcsi.2021.3069664","title":"Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization","display_name":"Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization","publication_year":2021,"publication_date":"2021-04-02","ids":{"openalex":"https://openalex.org/W3142835241","doi":"https://doi.org/10.1109/tcsi.2021.3069664","mag":"3142835241"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2021.3069664","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2021.3069664","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083905801","display_name":"Florian Klemme","orcid":"https://orcid.org/0000-0002-0148-0523"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Klemme","raw_affiliation_strings":["Chair of Semiconductor Test and Reliability (STAR) within the Computer Science, Electrical Engineering Faculty, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":"https://orcid.org/0000-0002-0148-0523","affiliations":[{"raw_affiliation_string":"Chair of Semiconductor Test and Reliability (STAR) within the Computer Science, Electrical Engineering Faculty, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Chair of Semiconductor Test and Reliability (STAR) within the Computer Science, Electrical Engineering Faculty, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":"https://orcid.org/0000-0002-5649-3102","affiliations":[{"raw_affiliation_string":"Chair of Semiconductor Test and Reliability (STAR) within the Computer Science, Electrical Engineering Faculty, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":null,"apc_paid":null,"fwci":2.0905,"has_fulltext":false,"cited_by_count":44,"citation_normalized_percentile":{"value":0.8699015,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"68","issue":"6","first_page":"2569","last_page":"2579"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5890583395957947},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5524072051048279},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5228155851364136},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5147145390510559},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.5044230222702026},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.48431459069252014},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.24603447318077087},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10568562150001526}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5890583395957947},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5524072051048279},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5228155851364136},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5147145390510559},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.5044230222702026},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.48431459069252014},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.24603447318077087},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10568562150001526},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2021.3069664","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2021.3069664","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1966797259","https://openalex.org/W2086122092","https://openalex.org/W2101234009","https://openalex.org/W2233304223","https://openalex.org/W2396345169","https://openalex.org/W2739643704","https://openalex.org/W2898581147","https://openalex.org/W2955895406","https://openalex.org/W3112662320","https://openalex.org/W3113296849","https://openalex.org/W6675354045","https://openalex.org/W6742227522","https://openalex.org/W6787733248"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4306674287","https://openalex.org/W3046775127","https://openalex.org/W3107602296","https://openalex.org/W3170094116","https://openalex.org/W4386462264","https://openalex.org/W4364306694","https://openalex.org/W4312192474","https://openalex.org/W4283697347","https://openalex.org/W4210805261"],"abstract_inverted_index":{"Aging-induced":[0],"degradation":[1],"imposes":[2],"a":[3,111,124],"major":[4],"challenge":[5],"to":[6,22,47,68,105,122],"the":[7,45,52,61,69,76,85,88,92,102,118,158],"designer":[8,46,119],"when":[9],"estimating":[10],"timing":[11,127,162,179],"guardbands.":[12],"This":[13],"problem":[14],"increases":[15],"as":[16],"traditional":[17],"worst-case":[18],"corners":[19],"bring":[20,64],"over-pessimism":[21],"designers,":[23],"exacerbating":[24],"competitive":[25],"and":[26,140,187,192,202],"close-to-the-edge":[27],"designs.":[28],"In":[29],"this":[30],"work,":[31],"we":[32,63,115,181],"present":[33],"an":[34,148,169],"accurate":[35],"machine":[36,144,210],"learning":[37,145,211],"approach":[38,146],"for":[39,101,137,152,189,213],"aging-aware":[40],"cell":[41,65,96,159,215],"library":[42,66,216],"characterization,":[43],"enabling":[44],"evaluate":[48],"their":[49,72,138,141],"circuit":[50],"under":[51],"impact":[53,77],"of":[54,60,78,95,150,207],"precisely":[55],"selected":[56],"degradation.":[57],"Unlike":[58],"state":[59],"art,":[62],"characterization":[67,217],"designer,":[70],"empowering":[71],"capability":[73],"in":[74,110,157,177,197],"exploring":[75],"aging":[79],"while":[80],"protecting":[81],"confidential":[82],"information":[83],"from":[84],"foundry":[86],"at":[87],"same":[89],"time.":[90],"Furthermore,":[91],"fast":[93],"inference":[94],"libraries":[97,176],"makes":[98],"it":[99],"feasible,":[100],"first":[103],"time,":[104],"examine":[106],"aging-induced":[107],"variability":[108],"analysis":[109],"Monte-Carlo":[112],"fashion.":[113],"Finally,":[114],"show":[116,164],"that":[117],"is":[120,218],"able":[121],"select":[123],"less":[125,166],"pessimistic":[126],"guardband":[128],"by":[129,205],"choosing":[130],"adequate":[131],"delta":[132],"threshold":[133],"voltage":[134],"(":[135],"\u0394Vth)":[136],"design":[139],"needs.":[142],"Our":[143,209],"reaches":[147],"R2score":[149,170],"$>99\\%$":[151],"almost":[153],"all":[154],"data":[155],"stored":[156],"library.":[160],"Only":[161],"constraints":[163],"slightly":[165],"accuracy":[167],"with":[168],"around":[171],"95%.":[172],"When":[173],"using":[174],"ML-characterized":[175],"static":[178],"analysis,":[180],"achieve":[182],"errors":[183],"smaller":[184,204],"than":[185],"\u00b10.5%":[186],"\u00b10.1%":[188],"path":[190],"delay":[191],"dynamic":[193],"power,":[194],"respectively.":[195],"Errors":[196],"leakage":[198],"power":[199],"are":[200],"negligible":[201],"even":[203],"orders":[206],"magnitude.":[208],"implementation":[212],"standard":[214],"publicly":[219],"available.":[220],"Download:":[221],"https://opensource.mlcad.org":[222]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":14},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}