{"id":"https://openalex.org/W3088383297","doi":"https://doi.org/10.1109/tcsi.2020.3024601","title":"Timing Reliability Improvement of Master-Slave Flip-Flops in the Presence of Aging Effects","display_name":"Timing Reliability Improvement of Master-Slave Flip-Flops in the Presence of Aging Effects","publication_year":2020,"publication_date":"2020-09-25","ids":{"openalex":"https://openalex.org/W3088383297","doi":"https://doi.org/10.1109/tcsi.2020.3024601","mag":"3088383297"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2020.3024601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2020.3024601","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073424361","display_name":"Atousa Jafari","orcid":"https://orcid.org/0000-0003-4613-1922"},"institutions":[{"id":"https://openalex.org/I166459259","display_name":"Shiraz University","ror":"https://ror.org/028qtbk54","country_code":"IR","type":"education","lineage":["https://openalex.org/I166459259"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Atousa Jafari","raw_affiliation_strings":["School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran","institution_ids":["https://openalex.org/I166459259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078040742","display_name":"Mohsen Raji","orcid":"https://orcid.org/0000-0001-7113-5197"},"institutions":[{"id":"https://openalex.org/I166459259","display_name":"Shiraz University","ror":"https://ror.org/028qtbk54","country_code":"IR","type":"education","lineage":["https://openalex.org/I166459259"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohsen Raji","raw_affiliation_strings":["School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran"],"raw_orcid":"https://orcid.org/0000-0001-7113-5197","affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran","institution_ids":["https://openalex.org/I166459259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028010546","display_name":"Behnam Ghavami","orcid":"https://orcid.org/0000-0001-5391-383X"},"institutions":[{"id":"https://openalex.org/I115566878","display_name":"Shahid Bahonar University of Kerman","ror":"https://ror.org/04zn42r77","country_code":"IR","type":"education","lineage":["https://openalex.org/I115566878"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Behnam Ghavami","raw_affiliation_strings":["Faculty of Engineering, Shahid Bahonar University of Kerman, Kerman, Iran"],"raw_orcid":"https://orcid.org/0000-0001-5391-383X","affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Shahid Bahonar University of Kerman, Kerman, Iran","institution_ids":["https://openalex.org/I115566878"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7066,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.7009447,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"67","issue":"12","first_page":"4761","last_page":"4773"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7173587083816528},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.6704369783401489},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5153741240501404},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5045100450515747},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5032829642295837},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5018725395202637},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.48932498693466187},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.4810393154621124},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4720792770385742},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46831780672073364},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4579235017299652},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44821280241012573},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43635955452919006},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4248265027999878},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.385719895362854},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.2711421847343445},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23240745067596436},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16947928071022034},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.16072514653205872},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12189891934394836},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10710984468460083}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7173587083816528},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.6704369783401489},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5153741240501404},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5045100450515747},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5032829642295837},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5018725395202637},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.48932498693466187},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.4810393154621124},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4720792770385742},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46831780672073364},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4579235017299652},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44821280241012573},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43635955452919006},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4248265027999878},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.385719895362854},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.2711421847343445},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23240745067596436},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16947928071022034},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.16072514653205872},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12189891934394836},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10710984468460083},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2020.3024601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2020.3024601","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W1157979147","https://openalex.org/W1518236483","https://openalex.org/W1533299367","https://openalex.org/W1561603855","https://openalex.org/W1966288395","https://openalex.org/W1967073752","https://openalex.org/W1969390180","https://openalex.org/W1971423421","https://openalex.org/W1982515552","https://openalex.org/W1989372524","https://openalex.org/W1990960030","https://openalex.org/W1991025821","https://openalex.org/W1995138381","https://openalex.org/W2000082666","https://openalex.org/W2012947974","https://openalex.org/W2029364567","https://openalex.org/W2033907418","https://openalex.org/W2037171854","https://openalex.org/W2037773470","https://openalex.org/W2042461881","https://openalex.org/W2048459293","https://openalex.org/W2076404185","https://openalex.org/W2078373366","https://openalex.org/W2087512113","https://openalex.org/W2096581954","https://openalex.org/W2100661413","https://openalex.org/W2102729267","https://openalex.org/W2106028351","https://openalex.org/W2107944009","https://openalex.org/W2109195618","https://openalex.org/W2114131053","https://openalex.org/W2117043376","https://openalex.org/W2121878622","https://openalex.org/W2124460294","https://openalex.org/W2126298267","https://openalex.org/W2138654516","https://openalex.org/W2140823559","https://openalex.org/W2143279430","https://openalex.org/W2170333286","https://openalex.org/W2171649152","https://openalex.org/W2344758701","https://openalex.org/W2469211945","https://openalex.org/W2793374156","https://openalex.org/W2946281845","https://openalex.org/W2968696769","https://openalex.org/W3142526730","https://openalex.org/W3152064381","https://openalex.org/W4231252248","https://openalex.org/W4234368526"],"related_works":["https://openalex.org/W2090255174","https://openalex.org/W2081199158","https://openalex.org/W4360585747","https://openalex.org/W2005390090","https://openalex.org/W2519438976","https://openalex.org/W3000250676","https://openalex.org/W2074961296","https://openalex.org/W2163600392","https://openalex.org/W2003414294","https://openalex.org/W1973928325"],"abstract_inverted_index":{"Manufacturing":[0],"process":[1,60,124],"variations":[2,61],"and":[3,62,127,155,167],"transistor's":[4],"aging":[5,63],"effects":[6],"are":[7,97],"two":[8],"major":[9],"concerns":[10],"for":[11,53],"reliable":[12],"design":[13],"of":[14,20,25,39,59,71,90,93,110,138,146,163,170],"nano-scale":[15],"digital":[16,31],"circuits.":[17],"Correct":[18],"functionality":[19],"flip-flops":[21],"(FFs),":[22],"as":[23],"one":[24],"the":[26,57,68,72,80,84,88,94,100,108,111,135,161],"most":[27],"important":[28],"elements":[29],"in":[30,37,76,99,144,160],"circuits,":[32],"plays":[33],"a":[34,46],"key":[35],"role":[36],"reliability":[38,48,81,113,137],"modern":[40],"circuit":[41],"designs.":[42],"In":[43,65],"this":[44,66],"paper,":[45],"timing":[47],"improvement":[49,114],"technique":[50,115],"is":[51,74,116],"proposed":[52],"master-slave":[54],"FFs":[55,140],"considering":[56,118],"impacts":[58],"effects.":[64],"technique,":[67],"internal":[69],"circuitry":[70],"FF":[73],"restructured":[75],"order":[77],"to":[78],"improve":[79],"by":[82,142],"reducing":[83],"stress":[85],"time":[86,89],"(i.e.":[87,122],"being":[91],"ON)":[92],"transistors":[95],"which":[96],"stacked":[98],"feedback":[101],"loop.":[102],"Using":[103],"Monte-Carlo":[104],"based":[105],"HSPICE":[106],"simulations,":[107],"efficacy":[109],"restructuring-based":[112],"shown":[117],"various":[119],"experimental":[120,131],"conditions":[121],"different":[123],"variation":[125,165],"ratios":[126],"lifetime":[128,136],"values).":[129],"The":[130],"results":[132],"show":[133],"that,":[134],"Master-Slave":[139],"improved":[141],"22%":[143],"expense":[145],"3%":[147],"area":[148],"overhead,":[149],"8%":[150],"propagation":[151],"delay":[152],"absolute":[153,157],"change,":[154],"6%":[156],"power":[158],"change":[159],"presence":[162],"20%":[164],"ratio":[166],"9":[168],"years":[169],"operation":[171],"time.":[172]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}