{"id":"https://openalex.org/W3000497601","doi":"https://doi.org/10.1109/tcsi.2019.2960028","title":"A Self-Timed Voltage-Mode Sensing Scheme With Successive Sensing and Checking for STT-MRAM","display_name":"A Self-Timed Voltage-Mode Sensing Scheme With Successive Sensing and Checking for STT-MRAM","publication_year":2020,"publication_date":"2020-01-08","ids":{"openalex":"https://openalex.org/W3000497601","doi":"https://doi.org/10.1109/tcsi.2019.2960028","mag":"3000497601"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2019.2960028","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2019.2960028","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085770846","display_name":"Yongliang Zhou","orcid":"https://orcid.org/0000-0002-7327-6759"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yongliang Zhou","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079498326","display_name":"Hao Cai","orcid":"https://orcid.org/0000-0001-9794-8049"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Cai","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101446253","display_name":"Lei Xie","orcid":"https://orcid.org/0000-0002-4188-5015"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Xie","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087360153","display_name":"Menglin Han","orcid":"https://orcid.org/0000-0003-2598-0386"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Menglin Han","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100708630","display_name":"Mingyue Liu","orcid":"https://orcid.org/0000-0002-4334-5354"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingyue Liu","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102127167","display_name":"Shi Xu","orcid":"https://orcid.org/0000-0002-8815-9707"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shi Xu","raw_affiliation_strings":["Artificial Intelligence Research Center, National Innovation Institute of Defense Technology (NIIDT), Beijing, China"],"affiliations":[{"raw_affiliation_string":"Artificial Intelligence Research Center, National Innovation Institute of Defense Technology (NIIDT), Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100461621","display_name":"Bo Liu","orcid":"https://orcid.org/0000-0002-0894-1054"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Liu","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066473925","display_name":"Weisheng Zhao","orcid":"https://orcid.org/0000-0001-8088-0404"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["Fert Beijing Institute, BDBC, Beihang Univeristy, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, BDBC, Beihang Univeristy, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030384645","display_name":"Jun Yang","orcid":"https://orcid.org/0000-0002-8379-0321"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Yang","raw_affiliation_strings":["National ASIC System Engineering Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5085770846"],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":4.4895,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.95315063,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"67","issue":"5","first_page":"1602","last_page":"1614"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.6908373832702637},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6402981281280518},{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.6190254092216492},{"id":"https://openalex.org/keywords/multiplexer","display_name":"Multiplexer","score":0.599193811416626},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5763808488845825},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5684791803359985},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.49895501136779785},{"id":"https://openalex.org/keywords/process-corners","display_name":"Process corners","score":0.4738474488258362},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.45063796639442444},{"id":"https://openalex.org/keywords/input-offset-voltage","display_name":"Input offset voltage","score":0.4488733112812042},{"id":"https://openalex.org/keywords/sense","display_name":"Sense (electronics)","score":0.44796445965766907},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.42101311683654785},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4046202600002289},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.39192038774490356},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.324367493391037},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2990306615829468},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.26418983936309814},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18277710676193237},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.15696373581886292},{"id":"https://openalex.org/keywords/multiplexing","display_name":"Multiplexing","score":0.14698559045791626},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11867555975914001}],"concepts":[{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.6908373832702637},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6402981281280518},{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.6190254092216492},{"id":"https://openalex.org/C70970002","wikidata":"https://www.wikidata.org/wiki/Q189434","display_name":"Multiplexer","level":3,"score":0.599193811416626},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5763808488845825},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5684791803359985},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.49895501136779785},{"id":"https://openalex.org/C192615534","wikidata":"https://www.wikidata.org/wiki/Q7247268","display_name":"Process corners","level":3,"score":0.4738474488258362},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.45063796639442444},{"id":"https://openalex.org/C63651839","wikidata":"https://www.wikidata.org/wiki/Q478566","display_name":"Input offset voltage","level":5,"score":0.4488733112812042},{"id":"https://openalex.org/C143141573","wikidata":"https://www.wikidata.org/wiki/Q7450971","display_name":"Sense (electronics)","level":2,"score":0.44796445965766907},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.42101311683654785},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4046202600002289},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.39192038774490356},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.324367493391037},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2990306615829468},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.26418983936309814},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18277710676193237},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.15696373581886292},{"id":"https://openalex.org/C19275194","wikidata":"https://www.wikidata.org/wiki/Q222903","display_name":"Multiplexing","level":2,"score":0.14698559045791626},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11867555975914001},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2019.2960028","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2019.2960028","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7900000214576721,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3597668754","display_name":null,"funder_award_id":"61904028","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1483257517","https://openalex.org/W1901149441","https://openalex.org/W1916668514","https://openalex.org/W1964056440","https://openalex.org/W1967035245","https://openalex.org/W1967547265","https://openalex.org/W1969719403","https://openalex.org/W1996356878","https://openalex.org/W2000818868","https://openalex.org/W2006880809","https://openalex.org/W2038170692","https://openalex.org/W2046515116","https://openalex.org/W2056511998","https://openalex.org/W2058483530","https://openalex.org/W2102209351","https://openalex.org/W2120544688","https://openalex.org/W2159904000","https://openalex.org/W2303314981","https://openalex.org/W2333032139","https://openalex.org/W2396622873","https://openalex.org/W2525037638","https://openalex.org/W2527848006","https://openalex.org/W2539008933","https://openalex.org/W2550037452","https://openalex.org/W2594135538","https://openalex.org/W2747816535","https://openalex.org/W2757632807","https://openalex.org/W2766355005","https://openalex.org/W2767804611","https://openalex.org/W2770089378","https://openalex.org/W2789899229","https://openalex.org/W2793045952","https://openalex.org/W2886752557","https://openalex.org/W2898560722","https://openalex.org/W2903750391","https://openalex.org/W2909180686","https://openalex.org/W2934817499","https://openalex.org/W3105500088","https://openalex.org/W6652203013","https://openalex.org/W6664507615","https://openalex.org/W6684149499","https://openalex.org/W6748890629"],"related_works":["https://openalex.org/W2077498413","https://openalex.org/W2949498821","https://openalex.org/W3085306935","https://openalex.org/W2146647189","https://openalex.org/W2544913214","https://openalex.org/W1596212773","https://openalex.org/W2806715440","https://openalex.org/W2096973557","https://openalex.org/W2074628056","https://openalex.org/W3082007433"],"abstract_inverted_index":{"In":[0],"Spin-Transfer":[1],"Torque":[2],"Magnetic":[3],"Random":[4],"Access":[5],"Memory":[6],"(STT-MRAM),":[7],"the":[8,21,30,58,75,78,101,139,154],"most":[9],"commonly":[10],"used":[11],"timing":[12,55],"scheme":[13,48],"for":[14],"conventional":[15,155],"Voltage-mode":[16],"Sense":[17],"Amplifier":[18],"(VSA)":[19],"is":[20,94,125],"global":[22],"activated":[23],"timing.":[24],"Obviously":[25],"this":[26],"method":[27,99],"cannot":[28],"obtain":[29],"optimal":[31,54],"yield":[32,163,185],"because":[33],"different":[34],"bit-cells":[35],"have":[36],"its":[37],"sensing":[38,82,107,113,141],"latency":[39],"respectively.":[40,178,200],"This":[41],"paper":[42],"proposes":[43],"a":[44,72,128,144],"self-timed":[45],"voltage-mode":[46],"sense":[47],"named":[49],"ST-VSS":[50,124],"which":[51],"can":[52,115,149],"enable":[53],"depending":[56],"on":[57],"bit-cell":[59],"discharging":[60],"ability.":[61],"Two":[62],"circuit":[63],"structures":[64],"are":[65,84],"proposed:":[66],"The":[67,112,122,157,179],"single":[68,158],"SA":[69,92,159,181],"structure":[70,93,160,182],"uses":[71],"multiplexer":[73],"at":[74],"input":[76,87],"of":[77,147],"SA.":[79],"Its":[80],"successive":[81],"operations":[83],"implemented":[85],"with":[86,153],"offset":[88,103],"flipping.":[89],"A":[90],"dual":[91,180],"reconfigured":[95],"by":[96],"built-in-self-test":[97],"(BIST)":[98],"to":[100,105,127],"opposite":[102],"states":[104],"monitor":[106],"results":[108,136],"from":[109],"each":[110],"other.":[111],"operation":[114],"be":[116,150],"immediately":[117],"terminated":[118],"after":[119],"successful":[120,140],"reading.":[121],"proposed":[123],"applied":[126],"32bits/word":[129],"MRAM":[130],"using":[131],"28-nm":[132],"CMOS":[133],"process.":[134],"Simulation":[135],"show":[137],"that":[138],"rate":[142],"across":[143],"wide":[145],"range":[146],"voltages":[148],"improved,":[151],"comparing":[152],"scheme.":[156],"obtains":[161],"32%~42%":[162],"improvement,":[164,186],"costs":[165,187],"44.1%/26.9%/19.3%":[166],"energy,":[167,189],"and":[168,190],"brings":[169,191],"8.3%/5.8%/2.9%":[170],"layout":[171],"area":[172,193],"penalty":[173,194],"in":[174,195],"128/256/512":[175,196],"column":[176,197],"depth,":[177],"gets":[183],"54%~65%":[184],"66.2%/38.6%/27.5%":[188],"26.4%/13.8%/7.1%":[192],"depth":[198],"conditions,":[199]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":9}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}