{"id":"https://openalex.org/W2957282149","doi":"https://doi.org/10.1109/tcsi.2019.2925743","title":"A 13-Bit 260MS/s Power-Efficient Pipeline ADC Using a Current-Reuse Technique and Interstage Gain and Nonlinearity Errors Calibration","display_name":"A 13-Bit 260MS/s Power-Efficient Pipeline ADC Using a Current-Reuse Technique and Interstage Gain and Nonlinearity Errors Calibration","publication_year":2019,"publication_date":"2019-07-12","ids":{"openalex":"https://openalex.org/W2957282149","doi":"https://doi.org/10.1109/tcsi.2019.2925743","mag":"2957282149"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2019.2925743","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2019.2925743","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057203782","display_name":"Dadian Zhou","orcid":"https://orcid.org/0000-0001-9068-890X"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Dadian Zhou","raw_affiliation_strings":["ECE Department, Texas A&M University, College Station, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-9068-890X","affiliations":[{"raw_affiliation_string":"ECE Department, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037953661","display_name":"Carlos Briseno-Vidrios","orcid":"https://orcid.org/0000-0001-7315-4148"},"institutions":[{"id":"https://openalex.org/I93085520","display_name":"Silicon Labs (United States)","ror":"https://ror.org/02dyqfb80","country_code":"US","type":"company","lineage":["https://openalex.org/I93085520"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carlos Briseno-Vidrios","raw_affiliation_strings":["Silicon Laboratories, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-7315-4148","affiliations":[{"raw_affiliation_string":"Silicon Laboratories, Austin, TX, USA","institution_ids":["https://openalex.org/I93085520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078242528","display_name":"Junning Jiang","orcid":"https://orcid.org/0000-0001-6540-3060"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Junning Jiang","raw_affiliation_strings":["ECE Department, Texas A&M University, College Station, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-6540-3060","affiliations":[{"raw_affiliation_string":"ECE Department, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056603856","display_name":"Chulhyun Park","orcid":"https://orcid.org/0000-0001-8301-3955"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chulhyun Park","raw_affiliation_strings":["ECE Department, Texas A&M University, College Station, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-8301-3955","affiliations":[{"raw_affiliation_string":"ECE Department, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100735687","display_name":"Qiyuan Liu","orcid":"https://orcid.org/0000-0001-5605-3409"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qiyuan Liu","raw_affiliation_strings":["Qualcomm, Tempe, AZ, USA"],"raw_orcid":"https://orcid.org/0000-0001-5605-3409","affiliations":[{"raw_affiliation_string":"Qualcomm, Tempe, AZ, USA","institution_ids":["https://openalex.org/I4210087596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074872395","display_name":"Eric Soenen","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric G. Soenen","raw_affiliation_strings":["TSMC Technology, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TSMC Technology, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052885080","display_name":"Martin Kinyua","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Martin Kinyua","raw_affiliation_strings":["TSMC Technology, Inc., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TSMC Technology, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024571753","display_name":"Jos\u00e9 Silva-Mart\u00ednez","orcid":"https://orcid.org/0000-0002-7960-0177"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jose Silva-Martinez","raw_affiliation_strings":["ECE Department, Texas A&M University, College Station, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-7960-0177","affiliations":[{"raw_affiliation_string":"ECE Department, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5057203782"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":1.096,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.75591292,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"66","issue":"9","first_page":"3373","last_page":"3383"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.8974984288215637},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6041382551193237},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"Operational transconductance amplifier","score":0.5820867419242859},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5024187564849854},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.49941444396972656},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.4837627410888672},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46893027424812317},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4626380503177643},{"id":"https://openalex.org/keywords/transimpedance-amplifier","display_name":"Transimpedance amplifier","score":0.44848641753196716},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4380648136138916},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.4227238595485687},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.41832441091537476},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.4124111533164978},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3840310573577881},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3827185034751892},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.20486879348754883}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.8974984288215637},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6041382551193237},{"id":"https://openalex.org/C58117264","wikidata":"https://www.wikidata.org/wiki/Q1239595","display_name":"Operational transconductance amplifier","level":5,"score":0.5820867419242859},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5024187564849854},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.49941444396972656},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.4837627410888672},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46893027424812317},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4626380503177643},{"id":"https://openalex.org/C92631468","wikidata":"https://www.wikidata.org/wiki/Q215437","display_name":"Transimpedance amplifier","level":5,"score":0.44848641753196716},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4380648136138916},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.4227238595485687},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.41832441091537476},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.4124111533164978},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3840310573577881},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3827185034751892},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.20486879348754883}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2019.2925743","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2019.2925743","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G7577286832","display_name":null,"funder_award_id":"1509872","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1648307515","https://openalex.org/W1941414088","https://openalex.org/W1979007902","https://openalex.org/W1990103922","https://openalex.org/W2007564081","https://openalex.org/W2026225680","https://openalex.org/W2063165946","https://openalex.org/W2069896714","https://openalex.org/W2099745999","https://openalex.org/W2118014140","https://openalex.org/W2119630764","https://openalex.org/W2124081222","https://openalex.org/W2135256797","https://openalex.org/W2161944474","https://openalex.org/W2165299997","https://openalex.org/W2175250124","https://openalex.org/W2177872670","https://openalex.org/W2323444784","https://openalex.org/W2464699181","https://openalex.org/W2469737602","https://openalex.org/W2488845768","https://openalex.org/W2564345649","https://openalex.org/W2565240407","https://openalex.org/W2609875481","https://openalex.org/W2749655596","https://openalex.org/W2758716033","https://openalex.org/W2768008485","https://openalex.org/W2802439969","https://openalex.org/W2898857372","https://openalex.org/W4255919373"],"related_works":["https://openalex.org/W2021405064","https://openalex.org/W2135048255","https://openalex.org/W2035972461","https://openalex.org/W2240623354","https://openalex.org/W2004162305","https://openalex.org/W2207354743","https://openalex.org/W2904640696","https://openalex.org/W2490203154","https://openalex.org/W2221147977","https://openalex.org/W2736714494"],"abstract_inverted_index":{"A":[0,54,89],"pipeline":[1,191],"analog-to-digital":[2],"converter":[3],"(ADC)":[4],"with":[5,93],"high":[6],"power":[7,79,177],"efficiency":[8],"is":[9,33,97,117,186],"implemented":[10],"in":[11,35,71,203],"this":[12],"paper.":[13],"The":[14,62,126,150,175,199],"ADC":[15,128,151,181,192],"architecture":[16],"consists":[17],"of":[18,158],"3.5b,":[19,20,21],"and":[22,64,81,123,135],"4b":[23],"sub-ADCs.":[24],"For":[25],"the":[26,36,58,65,68,85,101,110,168,180,190],"first":[27],"three":[28],"stages,":[29],"a":[30,72,76,94,105,144,154,194,204],"current-reuse":[31],"technique":[32],"employed":[34],"current":[37,73,102],"mode":[38],"multiplying":[39],"digital-to-analog":[40],"converters":[41],"(MDACs).":[42],"An":[43,113],"operational":[44],"transconductance":[45],"amplifier":[46,91],"(OTA)":[47],"converts":[48],"an":[49,162],"input":[50,146,163],"voltage":[51,106],"into":[52],"current;":[53],"current-steering":[55],"DAC":[56,66],"reuses":[57],"OTA":[59,63],"bias":[60],"current.":[61],"generate":[67],"sub-ADC":[69],"residue":[70,107],"domain.":[74],"As":[75],"result,":[77],"both":[78],"consumption":[80,178],"thermal":[82],"noise":[83],"for":[84,109,143,179],"MDAC":[86],"are":[87,171],"reduced.":[88],"transimpedance":[90],"(TIA)":[92],"feedback":[95],"resistor":[96],"utilized":[98],"to":[99,104,119],"convert":[100],"signal":[103,108,164],"next":[111],"stage.":[112],"off-chip":[114],"calibration":[115],"scheme":[116],"used":[118],"correct":[120],"interstage":[121],"gain":[122],"nonlinearity":[124],"errors.":[125],"fabricated":[127],"achieves":[129,193],"68.1":[130],"dB":[131,137,196],"signal-to-noise-and-distortion":[132],"ratio":[133],"(SNDR)":[134],"82.3":[136],"spurious":[138],"free":[139],"dynamic":[140],"range":[141],"(SFDR)":[142],"sinusoidal":[145],"at":[147,153,165,183],"4.17":[148],"MHz.":[149,160],"operates":[152],"maximum":[155,184],"sampling":[156],"frequency":[157],"260":[159],"With":[161],"123.129":[166],"MHz,":[167],"measured":[169],"SNDR/SFDR":[170],"66.3/78.22":[172],"dB,":[173],"respectively.":[174],"total":[176],"running":[182],"speed":[185],"15.38":[187],"mW.":[188],"Thus,":[189],"167.4":[195],"figure-of-merit":[197],"(FoM).":[198],"chip":[200],"was":[201],"manufactured":[202],"TSMC":[205],"40-nm":[206],"CMOS":[207],"process.":[208]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1}],"updated_date":"2026-05-12T08:28:47.272897","created_date":"2025-10-10T00:00:00"}