{"id":"https://openalex.org/W2933263187","doi":"https://doi.org/10.1109/tcsi.2019.2893294","title":"A Wide-Voltage-Range Half-Path Timing Error-Detection System With a 9-Transistor Transition-Detector in 40-nm CMOS","display_name":"A Wide-Voltage-Range Half-Path Timing Error-Detection System With a 9-Transistor Transition-Detector in 40-nm CMOS","publication_year":2019,"publication_date":"2019-03-28","ids":{"openalex":"https://openalex.org/W2933263187","doi":"https://doi.org/10.1109/tcsi.2019.2893294","mag":"2933263187"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2019.2893294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2019.2893294","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057291086","display_name":"Weiwei Shan","orcid":"https://orcid.org/0000-0001-5520-1326"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiwei Shan","raw_affiliation_strings":["School of Electronic Science and Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0001-5520-1326","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004171738","display_name":"Xinchao Shang","orcid":"https://orcid.org/0000-0003-2645-9912"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinchao Shang","raw_affiliation_strings":["School of Electronic Science and Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0003-2645-9912","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102501536","display_name":"Xing Wan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xing Wan","raw_affiliation_strings":["ASR Microelectronics, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ASR Microelectronics, Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079498326","display_name":"Hao Cai","orcid":"https://orcid.org/0000-0001-9794-8049"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Cai","raw_affiliation_strings":["School of Electronic Science and Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0001-9794-8049","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100380082","display_name":"Chuan Zhang","orcid":"https://orcid.org/0000-0002-7736-6487"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuan Zhang","raw_affiliation_strings":["National Mobile Communications Research Laboratory, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-7736-6487","affiliations":[{"raw_affiliation_string":"National Mobile Communications Research Laboratory, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030384645","display_name":"Jun Yang","orcid":"https://orcid.org/0000-0002-8379-0321"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Yang","raw_affiliation_strings":["School of Electronic Science and Engineering, Southeast University, Nanjing, China"],"raw_orcid":"https://orcid.org/0000-0002-8379-0321","affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9687,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.75860762,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"66","issue":"6","first_page":"2288","last_page":"2297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.6280786395072937},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6140186190605164},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5970807671546936},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.563875675201416},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.555208683013916},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4918077290058136},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4897952079772949},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47929638624191284},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4584175944328308},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30789369344711304},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2864648699760437}],"concepts":[{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.6280786395072937},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6140186190605164},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5970807671546936},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.563875675201416},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.555208683013916},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4918077290058136},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4897952079772949},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47929638624191284},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4584175944328308},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30789369344711304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2864648699760437},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2019.2893294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2019.2893294","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2288518288","display_name":null,"funder_award_id":"61774038","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G271618741","display_name":null,"funder_award_id":"61574033","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7882353974","display_name":null,"funder_award_id":"2017436901","funder_id":"https://openalex.org/F4320322857","funder_display_name":"Aeronautical Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322857","display_name":"Aeronautical Science Foundation of China","ror":"https://ror.org/02wq41p38"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W749368315","https://openalex.org/W1975918566","https://openalex.org/W1984996269","https://openalex.org/W1985616818","https://openalex.org/W2015917466","https://openalex.org/W2025340565","https://openalex.org/W2082597509","https://openalex.org/W2090480959","https://openalex.org/W2095351656","https://openalex.org/W2102587899","https://openalex.org/W2106648230","https://openalex.org/W2152406824","https://openalex.org/W2156667996","https://openalex.org/W2174721295","https://openalex.org/W2178304595","https://openalex.org/W2220643768","https://openalex.org/W2586553551","https://openalex.org/W2588150542","https://openalex.org/W2594678906","https://openalex.org/W2743713949","https://openalex.org/W2761878354","https://openalex.org/W2781093096","https://openalex.org/W2897636697","https://openalex.org/W4231450833"],"related_works":["https://openalex.org/W4293114473","https://openalex.org/W2139774918","https://openalex.org/W1561253851","https://openalex.org/W1749848917","https://openalex.org/W2132665626","https://openalex.org/W1850314507","https://openalex.org/W2152920913","https://openalex.org/W2061181929","https://openalex.org/W2902302001","https://openalex.org/W2206937489"],"abstract_inverted_index":{"To":[0],"reduce":[1,131],"conservative":[2],"timing":[3,20,96,111],"margin":[4],"in":[5,37,98,106,146],"digital":[6],"circuit":[7,195],"designs,":[8],"adaptive":[9],"techniques":[10],"based":[11],"on":[12],"timing-error":[13],"detection":[14],"were":[15],"proposed":[16,63,123,141],"to":[17,32,72,89,108,130,162,171],"monitor":[18],"the":[19,33,38,80,84,90,95,99,114,126,132,140,155],"of":[21,27,83,134],"selected":[22],"critical":[23,85],"paths.":[24],"However,":[25],"most":[26],"them":[28],"can":[29,103],"respond":[30],"only":[31],"detected":[34,105],"error":[35],"signals":[36],"next,":[39],"or":[40],"a":[41,50,57,67,147,160,180,191],"few,":[42],"clock":[43,101],"cycles.":[44],"Then":[45],"too,":[46],"they":[47],"usually":[48],"have":[49],"large":[51],"area":[52,182],"overhead.":[53,183],"In":[54],"this":[55],"paper,":[56],"low-overhead,":[58],"9-transistor":[59],"transition-detector":[60],"(TD)":[61],"is":[62,122,186],"for":[64,190],"use":[65],"at":[66,79,113,166,175],"wide":[68],"voltage":[69,168],"range":[70],"down":[71],"near-threshold":[73,167],"voltage.":[74],"These":[75],"TDs":[76],"are":[77,144],"inserted":[78,135],"half-path":[81,117],"points":[82,128],"paths":[86],"as":[87,169],"opposed":[88],"conventional":[91,172],"endpoints,":[92],"so":[93],"that":[94,154],"errors":[97,112],"current":[100],"cycle":[102],"be":[104],"advance":[107],"prevent":[109],"actual":[110],"endpoints.":[115],"A":[116],"insertion":[118],"point":[119],"selection":[120],"method":[121,189],"here,":[124],"with":[125,179],"middle":[127],"merging":[129],"number":[133],"TDs.":[136],"Test":[137],"chips":[138],"employing":[139],"design":[142,157,174],"approach":[143],"fabricated":[145],"40-nm":[148],"CMOS":[149],"process.":[150],"Silicon":[151],"measurements":[152],"demonstrate":[153],"whole":[156],"has":[158],"achieved":[159],"41.2%":[161],"50.5%":[163],"energy":[164],"saving":[165],"compared":[170],"margined":[173],"0.56":[176],"V,":[177],"and":[178,193],"small":[181],"Thus,":[184],"it":[185],"an":[187],"effective":[188],"low-power":[192],"energy-efficient":[194],"design.":[196]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}