{"id":"https://openalex.org/W2897553417","doi":"https://doi.org/10.1109/tcsi.2018.2872507","title":"Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications","display_name":"Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications","publication_year":2018,"publication_date":"2018-10-15","ids":{"openalex":"https://openalex.org/W2897553417","doi":"https://doi.org/10.1109/tcsi.2018.2872507","mag":"2897553417"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2018.2872507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2018.2872507","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057556916","display_name":"Jianwei Jiang","orcid":"https://orcid.org/0000-0002-0071-413X"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwei Jiang","raw_affiliation_strings":["University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0071-413X","affiliations":[{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002758713","display_name":"Yiran Xu","orcid":"https://orcid.org/0000-0002-5224-7860"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiran Xu","raw_affiliation_strings":["Huawei Technologies, Co., Ltd., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Huawei Technologies, Co., Ltd., Shanghai, China","institution_ids":["https://openalex.org/I2250955327"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103274862","display_name":"Wenyi Zhu","orcid":"https://orcid.org/0000-0002-7792-8785"},"institutions":[{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenyi Zhu","raw_affiliation_strings":["University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101852787","display_name":"Jun Xiao","orcid":"https://orcid.org/0009-0005-2767-3218"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jun Xiao","raw_affiliation_strings":["Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108468717","display_name":"Shichang Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shichang Zou","raw_affiliation_strings":["State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":4.8981,"has_fulltext":false,"cited_by_count":175,"citation_normalized_percentile":{"value":0.95892921,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"66","issue":"3","first_page":"967","last_page":"977"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8182786703109741},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.6431951522827148},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.636842668056488},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5827855467796326},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.578323483467102},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.571584939956665},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4938298165798187},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4532890319824219},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.42693397402763367},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.42608559131622314},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36419594287872314},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.23834168910980225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19194093346595764},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18349143862724304},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1539529263973236}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8182786703109741},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.6431951522827148},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.636842668056488},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5827855467796326},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.578323483467102},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.571584939956665},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4938298165798187},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4532890319824219},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.42693397402763367},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42608559131622314},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36419594287872314},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.23834168910980225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19194093346595764},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18349143862724304},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1539529263973236},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2018.2872507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2018.2872507","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1973839642","https://openalex.org/W1974982221","https://openalex.org/W2005422545","https://openalex.org/W2033453286","https://openalex.org/W2048751700","https://openalex.org/W2050431855","https://openalex.org/W2099569658","https://openalex.org/W2106507957","https://openalex.org/W2142386325","https://openalex.org/W2153751624","https://openalex.org/W2281229150","https://openalex.org/W2338090195","https://openalex.org/W2397682474","https://openalex.org/W2524971917","https://openalex.org/W2558003305","https://openalex.org/W2578302800","https://openalex.org/W2587844224","https://openalex.org/W2737640031","https://openalex.org/W2755826572","https://openalex.org/W2758315396","https://openalex.org/W2769815858","https://openalex.org/W2784101586","https://openalex.org/W2790072224","https://openalex.org/W2801628874","https://openalex.org/W2805796447","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W1500230652","https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2363504003","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2612883256","https://openalex.org/W4386933833","https://openalex.org/W1030007664"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"quadruple":[3],"cross-coupled":[4],"storage":[5],"cells":[6,117,158],"(QUCCE)":[7],"10T":[8,20,48,72,88],"and":[9,21,26,49,64,69,83,129],"12T":[10,22,50,102,171],"are":[11,23],"proposed":[12],"in":[13,79,142,147,165],"130":[14],"nm":[15],"CMOS":[16],"technology.":[17],"The":[18,86],"QUCCE":[19,47,71,87,101,170],"about":[24],"2\u00d7":[25],"3.4\u00d7":[27],"the":[28,33,41,95,100,107,115,119,133,139,148,155,169],"minimum":[29],"critical":[30],"charge":[31],"of":[32,40,81,114,144],"conventional":[34],"6T,":[35,120],"respectively.":[36],"Compared":[37],"with":[38,112],"most":[39,113],"considered":[42,157],"state-of-the-art":[43],"SRAM":[44,127],"cells,":[45],"both":[46],"have":[51,161],"comparable":[52],"or":[53,76],"better":[54],"soft":[55],"error":[56],"tolerance,":[57],"time":[58,110],"performance,":[59],"read":[60,108,135],"static":[61,66],"noise":[62,67],"margins,":[63,68],"hold":[65],"besides,":[70],"also":[73,131],"has":[74,132],"similar":[75],"lower":[77],"costs":[78],"terms":[80,143],"area":[82],"leakage":[84],"power.":[85],"is":[89,172],"designed":[90],"for":[91,124,138,176],"high-density":[92],"SRAMs":[93],"at":[94],"nominal":[96],"supply":[97],"voltage.":[98],"Furthermore,":[99],"saves":[103],"more":[104],"than":[105],"50%":[106],"access":[109],"compared":[111],"referential":[116],"including":[118],"making":[121],"it":[122,130],"suitable":[123],"high":[125],"speed":[126],"designs,":[128],"best":[134],"margin,":[136],"except":[137],"traditional":[140],"8T,":[141],"\u03bc/\u03c3":[145],"ratio":[146],"near":[149],"threshold":[150],"voltage":[151],"region":[152],"among":[153],"all":[154],"other":[156],"which":[159],"nearly":[160],"no":[162],"write":[163],"failure":[164],"that":[166],"region.":[167],"Hence,":[168],"a":[173],"promising":[174],"candidate":[175],"future":[177],"highly":[178],"reliable":[179],"terrestrial":[180],"low-voltage":[181],"applications.":[182]},"counts_by_year":[{"year":2026,"cited_by_count":12},{"year":2025,"cited_by_count":27},{"year":2024,"cited_by_count":28},{"year":2023,"cited_by_count":34},{"year":2022,"cited_by_count":25},{"year":2021,"cited_by_count":30},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":8}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}