{"id":"https://openalex.org/W2550037452","doi":"https://doi.org/10.1109/tcsi.2016.2621344","title":"Robust Ultra-Low Power Non-Volatile Logic-in-Memory Circuits in FD-SOI Technology","display_name":"Robust Ultra-Low Power Non-Volatile Logic-in-Memory Circuits in FD-SOI Technology","publication_year":2016,"publication_date":"2016-11-18","ids":{"openalex":"https://openalex.org/W2550037452","doi":"https://doi.org/10.1109/tcsi.2016.2621344","mag":"2550037452"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2016.2621344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2016.2621344","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079498326","display_name":"Hao Cai","orcid":"https://orcid.org/0000-0001-9794-8049"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Hao Cai","raw_affiliation_strings":["D\u00e9partement Communications et Electronique, Universit\u00e9 Paris-Saclay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement Communications et Electronique, Universit\u00e9 Paris-Saclay, France","institution_ids":["https://openalex.org/I277688954"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100430217","display_name":"You Wang","orcid":"https://orcid.org/0000-0002-6917-2199"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"You Wang","raw_affiliation_strings":["D\u00e9partement Communications et Electronique, Universit\u00e9 Paris-Saclay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement Communications et Electronique, Universit\u00e9 Paris-Saclay, France","institution_ids":["https://openalex.org/I277688954"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I277688954","display_name":"Universit\u00e9 Paris-Saclay","ror":"https://ror.org/03xjwb503","country_code":"FR","type":"education","lineage":["https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Alves De Barros Naviner","raw_affiliation_strings":["D\u00e9partement Communications et Electronique, Universit\u00e9 Paris-Saclay, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"D\u00e9partement Communications et Electronique, Universit\u00e9 Paris-Saclay, France","institution_ids":["https://openalex.org/I277688954"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066473925","display_name":"Weisheng Zhao","orcid":"https://orcid.org/0000-0001-8088-0404"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["Fert Beijing Institute, BDBC and School of Electronic and Information Engineering, Beihang Univeristy, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, BDBC and School of Electronic and Information Engineering, Beihang Univeristy, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":6.9514,"has_fulltext":false,"cited_by_count":100,"citation_normalized_percentile":{"value":0.97234646,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"64","issue":"4","first_page":"847","last_page":"857"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4938662648200989},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.45644858479499817},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4497985541820526},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4464263617992401},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.4413508474826813},{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.41821929812431335},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.39943641424179077},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2776332497596741},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1757352650165558},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15839096903800964}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4938662648200989},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.45644858479499817},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4497985541820526},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4464263617992401},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.4413508474826813},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.41821929812431335},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.39943641424179077},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2776332497596741},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1757352650165558},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15839096903800964},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2016.2621344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2016.2621344","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-02287638v1","is_oa":false,"landing_page_url":"https://telecom-paris.hal.science/hal-02287638","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers, 2017, 64 (4), pp.847-857","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1535173887","https://openalex.org/W1575364989","https://openalex.org/W1594409878","https://openalex.org/W1646024661","https://openalex.org/W1964242651","https://openalex.org/W1969011731","https://openalex.org/W1996418689","https://openalex.org/W1998824039","https://openalex.org/W2003777196","https://openalex.org/W2010635096","https://openalex.org/W2010860794","https://openalex.org/W2017819499","https://openalex.org/W2020217519","https://openalex.org/W2025173691","https://openalex.org/W2030922317","https://openalex.org/W2050565026","https://openalex.org/W2058483530","https://openalex.org/W2072610908","https://openalex.org/W2085442213","https://openalex.org/W2088481695","https://openalex.org/W2093460958","https://openalex.org/W2103954785","https://openalex.org/W2106223839","https://openalex.org/W2112701476","https://openalex.org/W2135818056","https://openalex.org/W2143987902","https://openalex.org/W2150049803","https://openalex.org/W2151092072","https://openalex.org/W2153677786","https://openalex.org/W2155551886","https://openalex.org/W2167566128","https://openalex.org/W2171215694","https://openalex.org/W2303314981","https://openalex.org/W2334389085","https://openalex.org/W2473720811","https://openalex.org/W3098517937","https://openalex.org/W4233492225","https://openalex.org/W6632115895","https://openalex.org/W6634369169","https://openalex.org/W6672540876"],"related_works":["https://openalex.org/W4390550886","https://openalex.org/W3217463396","https://openalex.org/W2790557758","https://openalex.org/W2516396101","https://openalex.org/W3204929712","https://openalex.org/W4295102875","https://openalex.org/W2300671402","https://openalex.org/W1993041309","https://openalex.org/W4312888585","https://openalex.org/W2533938775"],"abstract_inverted_index":{"In":[0,60],"the":[1],"upcoming":[2],"internet":[3],"of":[4,124,143],"things":[5],"(IoT)":[6],"era,":[7],"spin":[8],"transfer":[9],"torque":[10],"magnetic":[11],"tunnel":[12],"junction":[13],"(STT-MTJ)":[14],"based":[15,51],"non-volatile":[16],"(NV)":[17],"memory":[18],"and":[19,24,35,85,107,129,140],"circuits":[20,73,145],"for":[21,69,101,137],"IoT":[22],"nodes":[23],"normally-off":[25],"electronics":[26],"will":[27],"need":[28],"to":[29,62],"meet":[30],"constraints":[31],"in":[32,49,71,116],"speed,":[33],"energy":[34],"robustness.":[36],"This":[37],"study":[38],"focuses":[39],"on":[40,55],"NV":[41,72],"logic-in-memory":[42],"(LIM)":[43],"architecture.":[44],"Supply":[45],"voltage":[46],"(Vdd)":[47],"scaling":[48],"MTJ":[50],"NV-LIM":[52,144],"is":[53,74,114],"evaluated":[54],"FD-SOI":[56,147],"28":[57],"nm":[58],"node.":[59],"order":[61],"overcome":[63],"Vddscaling":[64,70],"bottleneck,":[65],"an":[66],"efficient":[67],"framework":[68],"proposed":[75],"with":[76,135,146],"design":[77,89,112,139],"strategies,":[78],"e.g.,":[79],"back-bias":[80],"(BB),":[81],"poly":[82],"biasing":[83],"(PB),":[84],"approximate":[86],"computing.":[87],"The":[88,111],"vector":[90],"(Vdd,VBB,PB)":[91],"generated":[92],"power-delay":[93],"curves":[94],"can":[95],"provide":[96],"user-defined":[97],"LIM":[98],"circuit":[99,138],"aiming":[100],"dynamic/leakage":[102],"power":[103],"saving,":[104],"power/speed":[105],"efficiency":[106],"process":[108],"variation":[109],"resilient.":[110],"space":[113],"explored":[115],"near-threshold":[117],"regime":[118],"around":[119],"0.5":[120],"V":[121],"supply.":[122],"Simulations":[123],"NV-logic,":[125],"full":[126],"adder":[127],"(NV-FA)":[128],"flip-flop":[130],"(NV-FF)":[131],"are":[132],"performed,":[133],"along":[134],"insights":[136],"practical":[141],"implementation":[142],"technology.":[148]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":13},{"year":2021,"cited_by_count":17},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":18},{"year":2017,"cited_by_count":14},{"year":2012,"cited_by_count":2}],"updated_date":"2026-08-26T07:47:46.906454","created_date":"2025-10-10T00:00:00"}