{"id":"https://openalex.org/W2525628955","doi":"https://doi.org/10.1109/tcsi.2016.2600498","title":"A Thin-Film, Large-Area Sensing and Compression System for Image Detection","display_name":"A Thin-Film, Large-Area Sensing and Compression System for Image Detection","publication_year":2016,"publication_date":"2016-09-30","ids":{"openalex":"https://openalex.org/W2525628955","doi":"https://doi.org/10.1109/tcsi.2016.2600498","mag":"2525628955"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2016.2600498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2016.2600498","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059262689","display_name":"Tiffany Moy","orcid":"https://orcid.org/0000-0001-8196-3359"},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tiffany Moy","raw_affiliation_strings":["Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","Department of Electrical Engineering Princeton University Princeton NJ USA"],"raw_orcid":"https://orcid.org/0000-0001-8196-3359","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","institution_ids":["https://openalex.org/I20089843"]},{"raw_affiliation_string":"Department of Electrical Engineering Princeton University Princeton NJ USA","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048510237","display_name":"Warren Rieutort\u2010Louis","orcid":null},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Warren Rieutort-Louis","raw_affiliation_strings":["Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","Department of Electrical Engineering Princeton University Princeton NJ USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","institution_ids":["https://openalex.org/I20089843"]},{"raw_affiliation_string":"Department of Electrical Engineering Princeton University Princeton NJ USA","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032133587","display_name":"S. Wagner","orcid":"https://orcid.org/0000-0002-3222-4071"},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sigurd Wagner","raw_affiliation_strings":["Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","Department of Electrical Engineering Princeton University Princeton NJ USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","institution_ids":["https://openalex.org/I20089843"]},{"raw_affiliation_string":"Department of Electrical Engineering Princeton University Princeton NJ USA","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074204707","display_name":"James C. Sturm","orcid":"https://orcid.org/0000-0002-0878-5266"},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James C. Sturm","raw_affiliation_strings":["Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","Department of Electrical Engineering Princeton University Princeton NJ USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","institution_ids":["https://openalex.org/I20089843"]},{"raw_affiliation_string":"Department of Electrical Engineering Princeton University Princeton NJ USA","institution_ids":["https://openalex.org/I20089843"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101645607","display_name":"Naveen Verma","orcid":"https://orcid.org/0000-0002-8208-5030"},"institutions":[{"id":"https://openalex.org/I20089843","display_name":"Princeton University","ror":"https://ror.org/00hx57361","country_code":"US","type":"education","lineage":["https://openalex.org/I20089843"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Naveen Verma","raw_affiliation_strings":["Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","Department of Electrical Engineering Princeton University Princeton NJ USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Princeton University, Princeton, NJ, USA","institution_ids":["https://openalex.org/I20089843"]},{"raw_affiliation_string":"Department of Electrical Engineering Princeton University Princeton NJ USA","institution_ids":["https://openalex.org/I20089843"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3021,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.82847291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"63","issue":"11","first_page":"1833","last_page":"1844"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-compression","display_name":"Image compression","score":0.47558891773223877},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4689079523086548},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.4609020948410034},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4585203528404236},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.4238739311695099},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4148525595664978},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39190176129341125},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34502726793289185},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.27516472339630127},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.22902560234069824},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.12385094165802002}],"concepts":[{"id":"https://openalex.org/C13481523","wikidata":"https://www.wikidata.org/wiki/Q412438","display_name":"Image compression","level":4,"score":0.47558891773223877},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4689079523086548},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.4609020948410034},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4585203528404236},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.4238739311695099},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4148525595664978},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39190176129341125},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34502726793289185},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.27516472339630127},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.22902560234069824},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.12385094165802002}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2016.2600498","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2016.2600498","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2523769008","display_name":null,"funder_award_id":"CCF-1218206","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G7690936620","display_name":null,"funder_award_id":"ECCS-1202168","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1513856277","https://openalex.org/W1563088657","https://openalex.org/W1965246325","https://openalex.org/W1968693414","https://openalex.org/W1978745606","https://openalex.org/W2007719056","https://openalex.org/W2020192881","https://openalex.org/W2030449718","https://openalex.org/W2038537365","https://openalex.org/W2086659790","https://openalex.org/W2088658556","https://openalex.org/W2100561453","https://openalex.org/W2109449402","https://openalex.org/W2112796928","https://openalex.org/W2129131372","https://openalex.org/W2135383307","https://openalex.org/W2140196014","https://openalex.org/W2143780370","https://openalex.org/W2153569771","https://openalex.org/W2219386034","https://openalex.org/W2314377257","https://openalex.org/W2330007780","https://openalex.org/W4250955649"],"related_works":["https://openalex.org/W2121524756","https://openalex.org/W782553550","https://openalex.org/W2633218168","https://openalex.org/W2059707233","https://openalex.org/W4235897794","https://openalex.org/W1983126463","https://openalex.org/W2095126257","https://openalex.org/W1987967678","https://openalex.org/W2085738998","https://openalex.org/W2766041112"],"abstract_inverted_index":{"This":[0,59],"paper":[1],"presents":[2],"a":[3,62,86,98],"sensing":[4],"and":[5,44,71,75,129],"compression":[6,141,160,187],"system":[7,69,73,82,135],"for":[8,57,116,185],"image":[9,102,168],"detection,":[10],"based":[11],"on":[12],"large-area":[13],"electronics":[14],"(LAE).":[15],"LAE":[16,40,106],"allows":[17],"us":[18],"to":[19,51,54,92,126,131,158],"create":[20],"expansive,":[21],"yet":[22],"highly-dense":[23],"arrays":[24],"of":[25,29,31,65,101,146,161,170,183],"sensors,":[26],"enabling":[27],"integration":[28],"millions":[30],"pixels.":[32],"However,":[33],"the":[34,48,80,94,105,113,162,174],"thin-film":[35],"transistors":[36],"(TFTs)":[37],"available":[38],"in":[39,61,104],"have":[41],"low":[42],"performance":[43],"high":[45],"variability,":[46],"requiring":[47],"sensor":[49],"data":[50,96],"be":[52],"fed":[53],"CMOS":[55],"ICs":[56],"processing.":[58],"results":[60],"large":[63,99],"number":[64],"interconnections,":[66],"which":[67],"raises":[68],"cost,":[70],"limits":[72],"scalability":[74],"robustness.":[76],"To":[77],"overcome":[78],"this,":[79],"presented":[81],"employs":[83],"random":[84],"projection,":[85],"method":[87],"from":[88,97,173],"statistical":[89],"signal":[90,164],"processing,":[91],"compress":[93],"pixel":[95],"array":[100,145],"sensors":[103],"domain":[107],"using":[108],"TFTs.":[109],"Random":[110],"projection":[111],"preserves":[112],"information":[114],"required":[115],"subsequent":[117],"classification,":[118],"and,":[119],"as":[120],"we":[121],"show,":[122],"is":[123,177],"highly":[124],"tolerant":[125],"device-level":[127],"variabilities":[128],"amenable":[130],"parallelized":[132],"implementation.":[133],"The":[134],"integrates":[136],"an":[137,144,150],"amorphous-silicon":[138],"(a-Si)":[139],"TFT":[140],"circuit":[142],"with":[143],"a-Si":[147],"photoconductors,":[148],"representing":[149],"80":[151,153,163],"\u00d7":[152],"active":[154],"matrix,":[155],"performing":[156],"up":[157],"80\u00d7":[159],"interfaces.":[165],"For":[166],"demonstration,":[167],"classification":[169],"handwritten":[171],"digits":[172],"MNIST":[175],"database":[176],"performed,":[178],"achieving":[179],"average":[180],"error":[181],"rates":[182],"2-25%":[184],"8-80\u00d7":[186],"(e.g.,":[188],"7%":[189],"at":[190],"20\u00d7":[191],"compression).":[192]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}