{"id":"https://openalex.org/W2398710777","doi":"https://doi.org/10.1109/tcsi.2016.2538039","title":"An FPGA-Based Instrument for En-Masse RRAM Characterization With ns Pulsing Resolution","display_name":"An FPGA-Based Instrument for En-Masse RRAM Characterization With ns Pulsing Resolution","publication_year":2016,"publication_date":"2016-05-18","ids":{"openalex":"https://openalex.org/W2398710777","doi":"https://doi.org/10.1109/tcsi.2016.2538039","mag":"2398710777"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2016.2538039","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2016.2538039","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086948087","display_name":"Jinling Xing","orcid":"https://orcid.org/0000-0002-8700-9483"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jinling Xing","raw_affiliation_strings":["Nano Group, Electronics and Computer Science, National University of Defense Technology, Changsha, China"],"affiliations":[{"raw_affiliation_string":"Nano Group, Electronics and Computer Science, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017301291","display_name":"Alexander Serb","orcid":"https://orcid.org/0000-0002-8034-2398"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexander Serb","raw_affiliation_strings":["Nano Group, Electronics and Computer Science, University of Southampton, Southampton, U.K"],"affiliations":[{"raw_affiliation_string":"Nano Group, Electronics and Computer Science, University of Southampton, Southampton, U.K","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112538141","display_name":"Ali Khiat","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ali Khiat","raw_affiliation_strings":["Nano Group, Electronics and Computer Science, University of Southampton, Southampton, U.K"],"affiliations":[{"raw_affiliation_string":"Nano Group, Electronics and Computer Science, University of Southampton, Southampton, U.K","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016480389","display_name":"Radu Berdan","orcid":"https://orcid.org/0000-0003-2247-7267"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Radu Berdan","raw_affiliation_strings":["Circuits and Systems Group, Electrical and Electronic Engineering, Imperial College London, London, U.K"],"affiliations":[{"raw_affiliation_string":"Circuits and Systems Group, Electrical and Electronic Engineering, Imperial College London, London, U.K","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100625645","display_name":"Hui Xu","orcid":"https://orcid.org/0000-0003-2081-555X"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Xu","raw_affiliation_strings":["College of Electronic Science and Engineering, National University of Defense Technology, Changsha, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Science and Engineering, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088089733","display_name":"Themis Prodromakis","orcid":"https://orcid.org/0000-0002-6267-6909"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Themistoklis Prodromakis","raw_affiliation_strings":["Nano Group, Electronics and Computer Science, University of Southampton, Southampton, U.K"],"affiliations":[{"raw_affiliation_string":"Nano Group, Electronics and Computer Science, University of Southampton, Southampton, U.K","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5086948087"],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":2.2311,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.88685609,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"63","issue":"6","first_page":"818","last_page":"826"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oscilloscope","display_name":"Oscilloscope","score":0.8334318399429321},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.7940109968185425},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7015581130981445},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.54352867603302},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5159767270088196},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4980292320251465},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.44047513604164124},{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.422113299369812},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4072189927101135},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32878339290618896},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19223827123641968},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1198820173740387}],"concepts":[{"id":"https://openalex.org/C184026988","wikidata":"https://www.wikidata.org/wiki/Q174320","display_name":"Oscilloscope","level":3,"score":0.8334318399429321},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.7940109968185425},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7015581130981445},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.54352867603302},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5159767270088196},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4980292320251465},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.44047513604164124},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.422113299369812},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4072189927101135},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32878339290618896},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19223827123641968},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1198820173740387}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2016.2538039","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2016.2538039","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:eprints.soton.ac.uk:397927","is_oa":false,"landing_page_url":"https://eprints.soton.ac.uk/397927/2/articleDetails.jsp_reload%253Dtrue%2526arnumber%253D7470624%2526newsearch%253Dtrue%2526queryText%253DAn%2520FPGA-based%2520Instrument%2520for%2520en-masse%2520RRAM%2520Characterisation%2520with%2520ns%2520Pulsing%2520Resolution","pdf_url":null,"source":{"id":"https://openalex.org/S4306401019","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1518418366","display_name":null,"funder_award_id":"61471377","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1766713921","display_name":"Reliably unreliable nanotechnologies","funder_award_id":"EP/K017829/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3085993365","display_name":null,"funder_award_id":"(Grant No.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G361948359","display_name":null,"funder_award_id":"EPSRC EP","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G37568934","display_name":null,"funder_award_id":"Grant","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6479529614","display_name":null,"funder_award_id":"EP/K017829/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G7726157001","display_name":null,"funder_award_id":"Grant No.","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1606057915","https://openalex.org/W1895189654","https://openalex.org/W1973133171","https://openalex.org/W1998177673","https://openalex.org/W2021853834","https://openalex.org/W2025674646","https://openalex.org/W2035373681","https://openalex.org/W2045614943","https://openalex.org/W2048290734","https://openalex.org/W2064756415","https://openalex.org/W2066051615","https://openalex.org/W2074357625","https://openalex.org/W2087279666","https://openalex.org/W2092158274","https://openalex.org/W2101091847","https://openalex.org/W2135210684","https://openalex.org/W2139203854","https://openalex.org/W2150313118","https://openalex.org/W2159622644","https://openalex.org/W2168011431","https://openalex.org/W2271267131","https://openalex.org/W2323986115"],"related_works":["https://openalex.org/W1972598373","https://openalex.org/W4229452466","https://openalex.org/W2364019159","https://openalex.org/W1489049788","https://openalex.org/W2243648136","https://openalex.org/W2370764016","https://openalex.org/W3087970328","https://openalex.org/W2966276069","https://openalex.org/W2355173512","https://openalex.org/W2124637416"],"abstract_inverted_index":{"An":[0],"FPGA-based":[1],"instrument":[2],"with":[3,64],"capabilities":[4],"of":[5,21,25,98,108,123],"on-board":[6],"oscilloscope":[7,93],"and":[8,45,84],"nanoscale":[9],"pulsing":[10,63],"(70":[11],"ns":[12,69],"@":[13],"\u00b110":[14],"V)":[15],"is":[16,81],"presented,":[17],"thus":[18],"allowing":[19],"exploration":[20],"the":[22,96,120],"nano-scale":[23],"switching":[24,60],"RRAM":[26,53],"devices.":[27],"The":[28,73,91],"system":[29],"possesses":[30],"less":[31],"than":[32],"1%":[33],"read-out":[34,79],"error":[35],"for":[36,105,114],"resistance":[37],"range":[38],"between":[39,67],"1":[40,43],"k\u03a9":[41],"to":[42,70],"M\u03a9,":[44],"demonstrated":[46],"its":[47],"functionality":[48],"on":[49,55,78],"characterizing":[50],"solid-state":[51],"prototype":[52],"devices":[54,57],"wafer;":[56],"exhibiting":[58],"gradual":[59],"behavior":[61],"under":[62],"duration":[65],"spanning":[66],"30":[68],"100":[71],"\u03bcs.":[72],"data":[74],"conversion":[75],"error-induced":[76],"degradation":[77],"accuracy":[80],"studied":[82],"extensively":[83],"verified":[85],"by":[86],"standard":[87],"linear":[88],"resistor":[89],"measurements.":[90],"integrated":[92],"capability":[94],"extends":[95],"versatility":[97],"our":[99],"instrument,":[100],"rendering":[101],"a":[102],"powerful":[103],"tool":[104],"processing":[106],"development":[107],"emerging":[109],"memory":[110],"technologies":[111],"but":[112],"also":[113],"testing":[115],"theoretical":[116],"hypotheses":[117],"arising":[118],"in":[119],"new":[121],"field":[122],"memristors.":[124]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":8}],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}