{"id":"https://openalex.org/W1973839642","doi":"https://doi.org/10.1109/tcsi.2014.2327334","title":"Statistical Analysis of Read Static Noise Margin for Near/Sub-Threshold SRAM Cell","display_name":"Statistical Analysis of Read Static Noise Margin for Near/Sub-Threshold SRAM Cell","publication_year":2014,"publication_date":"2014-10-21","ids":{"openalex":"https://openalex.org/W1973839642","doi":"https://doi.org/10.1109/tcsi.2014.2327334","mag":"1973839642"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2014.2327334","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2014.2327334","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037472767","display_name":"Roghayeh Saeidi","orcid":"https://orcid.org/0000-0001-6505-8623"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Roghayeh Saeidi","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","Department of Electrical Engineering, Sharif university of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Department of Electrical Engineering, Sharif university of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060271369","display_name":"Mohammad Sharifkhani","orcid":"https://orcid.org/0009-0004-8609-7815"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohammad Sharifkhani","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","Department of Electrical Engineering, Sharif university of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Department of Electrical Engineering, Sharif university of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062684025","display_name":"Khosrow Hajsadeghi","orcid":null},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Khosrow Hajsadeghi","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","Department of Electrical Engineering, Sharif university of Technology, Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Department of Electrical Engineering, Sharif university of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5037472767"],"corresponding_institution_ids":["https://openalex.org/I133529467"],"apc_list":null,"apc_paid":null,"fwci":1.0467,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.79193562,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"61","issue":"12","first_page":"3386","last_page":"3393"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.7567529678344727},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7381142377853394},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6548281311988831},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.573340654373169},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.5733121633529663},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5224865078926086},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.49339762330055237},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.48318377137184143},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.48174405097961426},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.461089551448822},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4594058096408844},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4511321485042572},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4303785562515259},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3304927349090576},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3147887587547302},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23858711123466492},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21652460098266602},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.21270674467086792},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20487409830093384},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1144019365310669}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.7567529678344727},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7381142377853394},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6548281311988831},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.573340654373169},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.5733121633529663},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5224865078926086},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.49339762330055237},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.48318377137184143},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.48174405097961426},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.461089551448822},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4594058096408844},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4511321485042572},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4303785562515259},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3304927349090576},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3147887587547302},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23858711123466492},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21652460098266602},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.21270674467086792},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20487409830093384},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1144019365310669},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2014.2327334","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2014.2327334","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1518236483","https://openalex.org/W1661368752","https://openalex.org/W1968464410","https://openalex.org/W1999777621","https://openalex.org/W2002612140","https://openalex.org/W2052490383","https://openalex.org/W2080326481","https://openalex.org/W2099087448","https://openalex.org/W2102655721","https://openalex.org/W2131833150","https://openalex.org/W2135880741","https://openalex.org/W2141274564","https://openalex.org/W2155153274","https://openalex.org/W2162613878","https://openalex.org/W2168101540","https://openalex.org/W2172020468","https://openalex.org/W2172173999","https://openalex.org/W3149402879"],"related_works":["https://openalex.org/W2117824263","https://openalex.org/W2134421493","https://openalex.org/W2009852498","https://openalex.org/W1991521745","https://openalex.org/W3004587385","https://openalex.org/W4220771873","https://openalex.org/W2109147260","https://openalex.org/W2786811717","https://openalex.org/W2069364674","https://openalex.org/W2062767191"],"abstract_inverted_index":{"A":[0],"fast":[1,105],"statistical":[2],"method":[3,23,62],"for":[4,49,108],"the":[5,8,27,31,41,50,57,64,70,74,88,91,123,130],"analysis":[6,107],"of":[7,11,30,43,56,73,79,82,90,112,126,129],"Read":[9,51,71,92],"SNM":[10,72,93],"a":[12,77,104,109,113,117],"6":[13],"T":[14],"SRAM":[15,59],"cell":[16,75,83,110],"in":[17,40,140],"near/subthreshold":[18,58],"region":[19],"is":[20,24],"proposed.":[21],"The":[22,132],"based":[25],"on":[26,94],"nonlinear":[28],"behavior":[29],"cell.":[32,60,131],"DIBL":[33],"and":[34,98,116],"body":[35],"effects":[36],"are":[37,135],"thoroughly":[38],"considered":[39],"derivation":[42],"an":[44],"accurate":[45,124],"closed":[46],"form":[47],"solution":[48],"Static":[52],"Noise":[53],"Margin":[54],"(SNM)":[55],"This":[61,85],"uses":[63],"state":[65],"space":[66],"equation":[67],"to":[68],"derive":[69],"as":[76],"function":[78,86],"threshold":[80,99],"voltage":[81,100],"transistors.":[84],"shows":[87],"dependency":[89],"sizing,":[95],"VDD,":[96],"temperature,":[97],"variations.":[101],"It":[102,120],"provides":[103],"reliability":[106],"array":[111],"given":[114],"size":[115],"supply":[118],"voltage.":[119],"also":[121],"calculates":[122],"value":[125],"failure":[127],"probability":[128],"analytical":[133],"results":[134],"verified":[136],"using":[137],"Monte-Carlo":[138],"simulations":[139],"45":[141],"nm":[142],"Predictive":[143],"Technology":[144],"Models.":[145]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}