{"id":"https://openalex.org/W2128845263","doi":"https://doi.org/10.1109/tcsi.2013.2284179","title":"A 25-\u00b5W All-MOS Potentiostatic Delta-Sigma ADC for Smart Electrochemical Sensors","display_name":"A 25-\u00b5W All-MOS Potentiostatic Delta-Sigma ADC for Smart Electrochemical Sensors","publication_year":2014,"publication_date":"2014-01-31","ids":{"openalex":"https://openalex.org/W2128845263","doi":"https://doi.org/10.1109/tcsi.2013.2284179","mag":"2128845263"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2013.2284179","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2013.2284179","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/10261/144238","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075906455","display_name":"Stepan Sutula","orcid":null},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Stepan Sutula","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015112893","display_name":"Jofre Pallar\u00e8s","orcid":"https://orcid.org/0000-0002-2265-3999"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jofre Pallares Cuxart","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074060594","display_name":"Javier Gonzalo\u2010Ruiz","orcid":"https://orcid.org/0000-0003-4342-3815"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Javier Gonzalo-Ruiz","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089411705","display_name":"Francesc Xavier Mu\u00f1oz","orcid":null},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francesc Xavier Munoz-Pascual","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007355640","display_name":"Llu\u00eds Ter\u00e9s","orcid":"https://orcid.org/0000-0002-9263-411X"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Lluis Teres","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Barcelona IMB-CNM(CSIC), Spain","institution_ids":["https://openalex.org/I4210160312"]},{"raw_affiliation_string":"Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056485115","display_name":"Francisco Serra-Graells","orcid":"https://orcid.org/0000-0002-7274-1911"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]},{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francisco Serra-Graells","raw_affiliation_strings":["Universitat Aut\u00f3noma de Barcelona, Spain","Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Universitat Aut\u00f3noma de Barcelona, Spain","institution_ids":["https://openalex.org/I123044942"]},{"raw_affiliation_string":"Inst. de Microelectron. de Barcelona IMB, CNM, Barcelona, Spain","institution_ids":["https://openalex.org/I4210160312"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5075906455"],"corresponding_institution_ids":["https://openalex.org/I4210160312"],"apc_list":null,"apc_paid":null,"fwci":1.5353,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.82630517,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"61","issue":"3","first_page":"671","last_page":"679"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/potentiostat","display_name":"Potentiostat","score":0.8992856740951538},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7489755153656006},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.6561538577079773},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5459325909614563},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.531125545501709},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.498445987701416},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4902039170265198},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.4626409113407135},{"id":"https://openalex.org/keywords/amperometry","display_name":"Amperometry","score":0.4443019926548004},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44176095724105835},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40210410952568054},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3593793213367462},{"id":"https://openalex.org/keywords/electrochemistry","display_name":"Electrochemistry","score":0.2870884835720062},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2565317749977112},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.2509009540081024},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23154431581497192},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15316268801689148}],"concepts":[{"id":"https://openalex.org/C2779995598","wikidata":"https://www.wikidata.org/wiki/Q629290","display_name":"Potentiostat","level":4,"score":0.8992856740951538},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7489755153656006},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.6561538577079773},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5459325909614563},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.531125545501709},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.498445987701416},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4902039170265198},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.4626409113407135},{"id":"https://openalex.org/C139369640","wikidata":"https://www.wikidata.org/wiki/Q474536","display_name":"Amperometry","level":4,"score":0.4443019926548004},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44176095724105835},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40210410952568054},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3593793213367462},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.2870884835720062},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2565317749977112},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.2509009540081024},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23154431581497192},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15316268801689148},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2013.2284179","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2013.2284179","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:digital.csic.es:10261/144238","is_oa":true,"landing_page_url":"http://hdl.handle.net/10261/144238","pdf_url":null,"source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Art\u00edculo"}],"best_oa_location":{"id":"pmh:oai:digital.csic.es:10261/144238","is_oa":true,"landing_page_url":"http://hdl.handle.net/10261/144238","pdf_url":null,"source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Art\u00edculo"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.49000000953674316}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1513582413","https://openalex.org/W1965609522","https://openalex.org/W1966494280","https://openalex.org/W1971775068","https://openalex.org/W1973279852","https://openalex.org/W1980884957","https://openalex.org/W1995733996","https://openalex.org/W1995994759","https://openalex.org/W2020664983","https://openalex.org/W2035179348","https://openalex.org/W2036565131","https://openalex.org/W2054348369","https://openalex.org/W2067900275","https://openalex.org/W2078060525","https://openalex.org/W2079826846","https://openalex.org/W2091523085","https://openalex.org/W2092861685","https://openalex.org/W2093562058","https://openalex.org/W2100851090","https://openalex.org/W2102375473","https://openalex.org/W2103969056","https://openalex.org/W2117554472","https://openalex.org/W2128508216","https://openalex.org/W2143653413","https://openalex.org/W2146524624","https://openalex.org/W2147767292","https://openalex.org/W2150769312","https://openalex.org/W2161811052","https://openalex.org/W2170129161","https://openalex.org/W3149729898","https://openalex.org/W4299973078","https://openalex.org/W6630707220"],"related_works":["https://openalex.org/W2897418078","https://openalex.org/W2070359565","https://openalex.org/W1024889183","https://openalex.org/W2159595243","https://openalex.org/W1991579521","https://openalex.org/W4206703893","https://openalex.org/W2124502750","https://openalex.org/W2139704386","https://openalex.org/W1605395211","https://openalex.org/W2066624532"],"abstract_inverted_index":{"<?Pub":[0],"Dtl=\"\"?>":[1],"This":[2],"paper":[3],"presents":[4],"a":[5,35],"low-power":[6],"all-MOS":[7],"delta-sigma":[8,39],"ADC":[9],"specifically":[10],"optimized":[11],"for":[12],"the":[13,26,30,110,113],"potentiostatic":[14],"biasing":[15],"and":[16],"amperometric":[17],"read-out":[18],"of":[19,29,96,112],"electrochemical":[20,38,55,79],"sensors.":[21],"The":[22],"proposed":[23,114],"architecture":[24],"reuses":[25],"dynamic":[27,73],"properties":[28],"sensor":[31,56],"itself":[32],"to":[33,85,108],"implement":[34],"continuous-time":[36],"mixed":[37],"modulator":[40],"with":[41,64,90,101],"minimalist":[42],"analog":[43],"circuits":[44],"fully":[45],"integrable":[46],"in":[47,59,94],"purely":[48],"digital":[49],"CMOS":[50,62],"technologies.":[51],"A":[52,98],"25-\u00b5W":[53],"smart":[54],"demonstrator":[57],"integrated":[58],"low-cost":[60],"1M":[61],"technology":[63],"Au":[65],"post-processing":[66],"is":[67,105],"presented.":[68],"Experimental":[69],"results":[70],"show":[71],"electrical":[72],"range":[74],"values":[75],"exceeding":[76],"10-bit,":[77],"while":[78],"figures":[80],"exhibit":[81],"linearity":[82],"levels":[83],"close":[84],"R\u00b2":[86],"=":[87],"0.999":[88],"combined":[89],"RSD":[91],"<":[92],"15%":[93],"terms":[95],"reproducibility.":[97],"comparative":[99],"test":[100],"commercial":[102],"potentiostat":[103],"equipment":[104],"also":[106],"included":[107],"qualify":[109],"performance":[111],"ADC.":[115]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2016-06-24T00:00:00"}