{"id":"https://openalex.org/W2111479122","doi":"https://doi.org/10.1109/tcsi.2012.2230500","title":"A 2-Kb One-Time Programmable Memory for UHF Passive RFID Tag IC in a Standard 0.18 $\\mu$m CMOS Process","display_name":"A 2-Kb One-Time Programmable Memory for UHF Passive RFID Tag IC in a Standard 0.18 $\\mu$m CMOS Process","publication_year":2013,"publication_date":"2013-03-18","ids":{"openalex":"https://openalex.org/W2111479122","doi":"https://doi.org/10.1109/tcsi.2012.2230500","mag":"2111479122"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2012.2230500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2230500","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035624049","display_name":"Ngoc Dang Phan","orcid":null},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ngoc Dang Phan","raw_affiliation_strings":["School of Electronics and Information, Kyung Hee University, Suwon, South Korea","Sch. of Electron. & Inf., Kyung Hee Univ., Suwon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information, Kyung Hee University, Suwon, South Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Sch. of Electron. & Inf., Kyung Hee Univ., Suwon, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045028723","display_name":"Ik\u2010Joon Chang","orcid":"https://orcid.org/0000-0002-8871-8695"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ik Joon Chang","raw_affiliation_strings":["School of Electronics and Information, Kyung Hee University, Suwon, South Korea","Sch. of Electron. & Inf., Kyung Hee Univ., Suwon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information, Kyung Hee University, Suwon, South Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Sch. of Electron. & Inf., Kyung Hee Univ., Suwon, South Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100702747","display_name":"Jong\u2010Wook Lee","orcid":"https://orcid.org/0000-0002-9160-2183"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Wook Lee","raw_affiliation_strings":["School of Electronics and Information, Kyung Hee University, Suwon, South Korea","Sch. of Electron. & Inf., Kyung Hee Univ., Suwon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information, Kyung Hee University, Suwon, South Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Sch. of Electron. & Inf., Kyung Hee Univ., Suwon, South Korea","institution_ids":["https://openalex.org/I35928602"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6404,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.90875074,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"60","issue":"7","first_page":"1810","last_page":"1822"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6480916738510132},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6135284900665283},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5516454577445984},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5490071773529053},{"id":"https://openalex.org/keywords/ultra-high-frequency","display_name":"Ultra high frequency","score":0.48858603835105896},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4877510666847229},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.47958651185035706},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4472808837890625},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4423353672027588},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39999040961265564},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16125783324241638}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6480916738510132},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6135284900665283},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5516454577445984},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5490071773529053},{"id":"https://openalex.org/C96122199","wikidata":"https://www.wikidata.org/wiki/Q628096","display_name":"Ultra high frequency","level":2,"score":0.48858603835105896},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4877510666847229},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.47958651185035706},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4472808837890625},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4423353672027588},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39999040961265564},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16125783324241638}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2012.2230500","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2230500","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1602873116","https://openalex.org/W1981752360","https://openalex.org/W2003390915","https://openalex.org/W2058732803","https://openalex.org/W2063781848","https://openalex.org/W2072774679","https://openalex.org/W2076220892","https://openalex.org/W2079915013","https://openalex.org/W2095759509","https://openalex.org/W2110978209","https://openalex.org/W2111323554","https://openalex.org/W2119623502","https://openalex.org/W2130120220","https://openalex.org/W2134941691","https://openalex.org/W2135465509","https://openalex.org/W2139893910","https://openalex.org/W2510137024","https://openalex.org/W6724845487"],"related_works":["https://openalex.org/W2036374021","https://openalex.org/W2925227264","https://openalex.org/W3090532395","https://openalex.org/W2347832052","https://openalex.org/W2370825978","https://openalex.org/W2369450403","https://openalex.org/W2167441838","https://openalex.org/W1991397907","https://openalex.org/W2501578203","https://openalex.org/W2113108952"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,19,80,92,111],"2-Kb":[3],"one-time":[4],"programmable":[5],"(OTP)":[6],"memory":[7,14,31,146,172],"for":[8,25,64,70],"UHF":[9,93],"RFID":[10,95],"applications.":[11],"The":[12,85,105,123],"OTP":[13,87,145,171],"cell":[15,32],"is":[16,33,88,135,148],"based":[17],"on":[18],"two-transistor":[20],"(2-T)":[21],"gate-oxide":[22],"anti-fuse":[23],"(AF)":[24],"low":[26,54],"voltage":[27],"operation.":[28],"Reliability":[29],"of":[30,41,126,169],"enhanced":[34],"by":[35],"limiting":[36],"the":[37,101,127,130,144,164,170],"maximum":[38],"terminal":[39],"voltages":[40],"thin-oxide":[42],"and":[43,49,67,132,166,176],"thick-oxide":[44],"transistors":[45],"to":[46,100],"1.8":[47],"V":[48],"3.3":[50],"V,":[51],"respectively.":[52,179],"Improved":[53],"power":[55,76],"circuit":[56],"design":[57],"techniques":[58],"are":[59,173],"used":[60],"including":[61,129],"auto":[62],"shut-off":[63],"program":[65],"mode":[66],"self-timed":[68],"control":[69],"read":[71,165],"mode.":[72],"To":[73],"further":[74],"reduce":[75],"consumption,":[77],"we":[78],"develop":[79],"novel":[81],"power-efficient":[82],"charge":[83],"pump.":[84],"designed":[86],"successfully":[89],"embedded":[90],"into":[91],"passive":[94],"tag":[96,106,159],"IC":[97,160],"that":[98,163],"conforms":[99],"EPCglobal":[102],"Gen-2":[103],"standard.":[104],"chip":[107,128],"was":[108],"fabricated":[109],"in":[110],"0.18":[112],"m":[113],"1-poly":[114],"6-metal":[115],"standard":[116],"CMOS":[117],"process":[118],"with":[119],"no":[120],"additional":[121],"masks.":[122],"total":[124],"area":[125,147],"I/Os":[131],"bonding":[133],"pads":[134],"2.3":[136],"\u00d7":[137,151],"1.5":[138],"mm":[139,153],"<sup":[140,154],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[141,155],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[142,156],"where":[143],"only":[149],"0.43":[150],"0.31":[152],".":[157],"Our":[158],"measurement":[161],"shows":[162],"write":[167],"currents":[168],"17":[174],"\u03bcA":[175],"58":[177],"\u03bcA,":[178]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}