{"id":"https://openalex.org/W2132220603","doi":"https://doi.org/10.1109/tcsi.2012.2226515","title":"On-Chip Process and Temperature Monitor for Self-Adjusting Slew Rate Control of 2$\\,\\times\\,$VDD Output Buffers","display_name":"On-Chip Process and Temperature Monitor for Self-Adjusting Slew Rate Control of 2$\\,\\times\\,$VDD Output Buffers","publication_year":2013,"publication_date":"2013-01-25","ids":{"openalex":"https://openalex.org/W2132220603","doi":"https://doi.org/10.1109/tcsi.2012.2226515","mag":"2132220603"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2012.2226515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2226515","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077220045","display_name":"Chua\u2010Chin Wang","orcid":"https://orcid.org/0000-0002-2426-2879"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chua-Chin Wang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032088383","display_name":"Chih-Lin Chen","orcid":"https://orcid.org/0000-0003-3924-2835"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Lin Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071930768","display_name":"Ron-Chi Kuo","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ron-Chi Kuo","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014003434","display_name":"Hsin-Yuan Tseng","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hsin-Yuan Tseng","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034038138","display_name":"Jen\u2010Wei Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jen-Wei Liu","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, , Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013147068","display_name":"Chun-Ying Juan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148968","display_name":"Metal Industries Research & Development Centre","ror":"https://ror.org/0584sxj05","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148968"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Ying Juan","raw_affiliation_strings":["Metal Industries Research Development Centre, Taipei, Taiwan","Metal Ind. Res. Dev. Centre (MIRDC), Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Metal Industries Research Development Centre, Taipei, Taiwan","institution_ids":["https://openalex.org/I4210148968"]},{"raw_affiliation_string":"Metal Ind. Res. Dev. Centre (MIRDC), Taipei, Taiwan","institution_ids":["https://openalex.org/I4210148968"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8032,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.74226871,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"60","issue":"6","first_page":"1432","last_page":"1440"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.8718592524528503},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.713184118270874},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5549072027206421},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48876023292541504},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4660201072692871},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.46519696712493896},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4650607705116272},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4132378101348877},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.34545665979385376},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33946678042411804},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3157588243484497},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.26045745611190796},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.23075637221336365},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15190982818603516},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.12315446138381958}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.8718592524528503},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.713184118270874},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5549072027206421},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48876023292541504},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4660201072692871},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.46519696712493896},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4650607705116272},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4132378101348877},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.34545665979385376},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33946678042411804},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3157588243484497},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.26045745611190796},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.23075637221336365},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15190982818603516},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.12315446138381958},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2012.2226515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2226515","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1589632217","https://openalex.org/W1606557131","https://openalex.org/W1871134805","https://openalex.org/W1986751201","https://openalex.org/W1999293178","https://openalex.org/W2011795786","https://openalex.org/W2031068066","https://openalex.org/W2055283523","https://openalex.org/W2055944305","https://openalex.org/W2100581498","https://openalex.org/W2115217949","https://openalex.org/W2120142994","https://openalex.org/W2124673164","https://openalex.org/W2125177293","https://openalex.org/W2130801548","https://openalex.org/W2142400505","https://openalex.org/W2143536486","https://openalex.org/W2143738690","https://openalex.org/W2143798917","https://openalex.org/W2143905108","https://openalex.org/W2149196948","https://openalex.org/W2150357124","https://openalex.org/W2164940593","https://openalex.org/W2165179842","https://openalex.org/W2169676602","https://openalex.org/W2179007144","https://openalex.org/W3143884389","https://openalex.org/W6636232378","https://openalex.org/W6639383915","https://openalex.org/W6646955768","https://openalex.org/W6678047399","https://openalex.org/W6681355974"],"related_works":["https://openalex.org/W2029904754","https://openalex.org/W2014419659","https://openalex.org/W170188723","https://openalex.org/W2115314666","https://openalex.org/W2099162222","https://openalex.org/W2075569182","https://openalex.org/W4285408939","https://openalex.org/W1989271320","https://openalex.org/W2031160685","https://openalex.org/W2185588300"],"abstract_inverted_index":{"A":[0,33],"novel":[1],"process":[2,25],"and":[3,21,26],"temperature":[4,27],"compensation":[5,43,74],"design":[6,44],"for":[7],"2":[8,35],"VDD":[9,37],"output":[10,38,56,62],"buffers":[11],"is":[12,45,75,86],"proposed,":[13],"where":[14],"the":[15,41,58],"threshold":[16],"voltages":[17],"(Vth)":[18],"of":[19,61,96],"PMOSs":[20],"NMOSs":[22],"varying":[23],"with":[24,73,80,90],"deviation":[28],"could":[29,64],"be":[30,65],"detected,":[31],"respectively.":[32],"prototype":[34],"\u00d7":[36],"buffer":[39],"using":[40,47],"proposed":[42],"fabricated":[46],"a":[48],"typical":[49],"0.18":[50],"\u03bcm":[51],"CMOS":[52],"process.":[53],"By":[54],"adjusting":[55],"currents,":[57],"slew":[59],"rate":[60,72],"signals":[63],"compensated":[66],"over":[67],"117%.":[68],"The":[69],"maximum":[70],"data":[71],"120":[76],"MHz":[77,82],"in":[78],"contrast":[79],"95":[81],"without":[83],"compensation,":[84],"which":[85],"measured":[87],"on":[88],"silicon":[89],"an":[91],"equivalent":[92],"probe":[93],"capacitive":[94],"load":[95],"10":[97],"pF.":[98]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}