{"id":"https://openalex.org/W2072816542","doi":"https://doi.org/10.1109/tcsi.2012.2209733","title":"Fractional Order Modeling of Large Three-Dimensional RC Networks","display_name":"Fractional Order Modeling of Large Three-Dimensional RC Networks","publication_year":2012,"publication_date":"2012-11-29","ids":{"openalex":"https://openalex.org/W2072816542","doi":"https://doi.org/10.1109/tcsi.2012.2209733","mag":"2072816542"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2012.2209733","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2209733","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027760931","display_name":"Roberto Kawakami Harrop Galv\u00e3o","orcid":"https://orcid.org/0000-0001-9794-8815"},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Roberto Kawakami Harrop Galvao","raw_affiliation_strings":["Department of Electronics Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Sao Jose dos Campos, Sao Paulo, Brazil","Dept. of Electron. Eng., Inst. Tecnol. de Aeronaut., Sa\u0303o Jose\u0301 dos Campos, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Sao Jose dos Campos, Sao Paulo, Brazil","institution_ids":["https://openalex.org/I107428990"]},{"raw_affiliation_string":"Dept. of Electron. Eng., Inst. Tecnol. de Aeronaut., Sa\u0303o Jose\u0301 dos Campos, Brazil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073156550","display_name":"Sillas Hadjiloucas","orcid":"https://orcid.org/0000-0003-2380-6114"},"institutions":[{"id":"https://openalex.org/I71052956","display_name":"University of Reading","ror":"https://ror.org/05v62cm79","country_code":"GB","type":"education","lineage":["https://openalex.org/I71052956"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Sillas Hadjiloucas","raw_affiliation_strings":["School of Systems Engineering, University of Reading, Reading, UK","[Sch. of Syst. Eng., Univ. of Reading, Reading, UK]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Systems Engineering, University of Reading, Reading, UK","institution_ids":["https://openalex.org/I71052956"]},{"raw_affiliation_string":"[Sch. of Syst. Eng., Univ. of Reading, Reading, UK]","institution_ids":["https://openalex.org/I71052956"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016448194","display_name":"Karl Heinz Kienitz","orcid":"https://orcid.org/0000-0002-1608-1541"},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Karl Heinz Kienitz","raw_affiliation_strings":["Department of Electronics Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Sao Jose dos Campos, Sao Paulo, Brazil","Dept. of Electron. Eng., Inst. Tecnol. de Aeronaut., Sa\u0303o Jose\u0301 dos Campos, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Sao Jose dos Campos, Sao Paulo, Brazil","institution_ids":["https://openalex.org/I107428990"]},{"raw_affiliation_string":"Dept. of Electron. Eng., Inst. Tecnol. de Aeronaut., Sa\u0303o Jose\u0301 dos Campos, Brazil","institution_ids":["https://openalex.org/I107428990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039231137","display_name":"Henrique Mohallem Paiva","orcid":"https://orcid.org/0000-0001-7081-8383"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Henrique Mohallem Paiva","raw_affiliation_strings":["Mectron-Odebrecht Organization, Sao Jose dos Campos, Sao Paulo, Brazil","Mectron-Odebrecht Organ., Sa\u0303o Jose\u0301 dos Campos, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mectron-Odebrecht Organization, Sao Jose dos Campos, Sao Paulo, Brazil","institution_ids":[]},{"raw_affiliation_string":"Mectron-Odebrecht Organ., Sa\u0303o Jose\u0301 dos Campos, Brazil","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089131089","display_name":"Rubens J. M. Afonso","orcid":"https://orcid.org/0000-0001-9209-2253"},"institutions":[{"id":"https://openalex.org/I107428990","display_name":"Instituto Tecnol\u00f3gico de Aeron\u00e1utica","ror":"https://ror.org/05vh67662","country_code":"BR","type":"education","lineage":["https://openalex.org/I107428990"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Rubens Junqueira Magalh\u00e3es Afonso","raw_affiliation_strings":["Department of Electronics Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Sao Jose dos Campos, Sao Paulo, Brazil","Dept. of Electron. Eng., Inst. Tecnol. de Aeronaut., Sa\u0303o Jose\u0301 dos Campos, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Instituto Tecnol\u00f3gico de Aeron\u00e1utica, Sao Jose dos Campos, Sao Paulo, Brazil","institution_ids":["https://openalex.org/I107428990"]},{"raw_affiliation_string":"Dept. of Electron. Eng., Inst. Tecnol. de Aeronaut., Sa\u0303o Jose\u0301 dos Campos, Brazil","institution_ids":["https://openalex.org/I107428990"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.5775,"has_fulltext":false,"cited_by_count":94,"citation_normalized_percentile":{"value":0.91017515,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"60","issue":"3","first_page":"624","last_page":"637"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10306","display_name":"Liquid Crystal Research Advancements","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10306","display_name":"Liquid Crystal Research Advancements","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.598444402217865},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5545446872711182},{"id":"https://openalex.org/keywords/admittance-parameters","display_name":"Admittance parameters","score":0.547142505645752},{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.5469884276390076},{"id":"https://openalex.org/keywords/fractal","display_name":"Fractal","score":0.4863436818122864},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.4818219244480133},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.4700948894023895},{"id":"https://openalex.org/keywords/rc-circuit","display_name":"RC circuit","score":0.4535277485847473},{"id":"https://openalex.org/keywords/network-model","display_name":"Network model","score":0.41650134325027466},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41195225715637207},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.4008767008781433},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3766831159591675},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3616049289703369},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3096129894256592},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.29765015840530396},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.17333626747131348},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1690945029258728},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13964194059371948}],"concepts":[{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.598444402217865},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5545446872711182},{"id":"https://openalex.org/C133833761","wikidata":"https://www.wikidata.org/wiki/Q16001847","display_name":"Admittance parameters","level":3,"score":0.547142505645752},{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.5469884276390076},{"id":"https://openalex.org/C40636538","wikidata":"https://www.wikidata.org/wiki/Q81392","display_name":"Fractal","level":2,"score":0.4863436818122864},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.4818219244480133},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.4700948894023895},{"id":"https://openalex.org/C39394816","wikidata":"https://www.wikidata.org/wiki/Q939318","display_name":"RC circuit","level":4,"score":0.4535277485847473},{"id":"https://openalex.org/C104122410","wikidata":"https://www.wikidata.org/wiki/Q1416406","display_name":"Network model","level":2,"score":0.41650134325027466},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41195225715637207},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.4008767008781433},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3766831159591675},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3616049289703369},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3096129894256592},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.29765015840530396},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.17333626747131348},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1690945029258728},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13964194059371948},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tcsi.2012.2209733","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2209733","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:centaur.reading.ac.uk:31538","is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6365281","pdf_url":null,"source":{"id":"https://openalex.org/S4306402273","display_name":"CentAUR (University of Reading)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I71052956","host_organization_name":"University of Reading","host_organization_lineage":["https://openalex.org/I71052956"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":96,"referenced_works":["https://openalex.org/W55790716","https://openalex.org/W83533993","https://openalex.org/W207094665","https://openalex.org/W232893681","https://openalex.org/W291003596","https://openalex.org/W1530054495","https://openalex.org/W1534096605","https://openalex.org/W1552098139","https://openalex.org/W1556177135","https://openalex.org/W1606202192","https://openalex.org/W1966044630","https://openalex.org/W1969313263","https://openalex.org/W1969636108","https://openalex.org/W1971148560","https://openalex.org/W1972467729","https://openalex.org/W1973099745","https://openalex.org/W1976592995","https://openalex.org/W1979731145","https://openalex.org/W1980940290","https://openalex.org/W1981845192","https://openalex.org/W1984161352","https://openalex.org/W1988106902","https://openalex.org/W1990403530","https://openalex.org/W1992254261","https://openalex.org/W1992944881","https://openalex.org/W1993882471","https://openalex.org/W1999913367","https://openalex.org/W2001705007","https://openalex.org/W2005010408","https://openalex.org/W2006236787","https://openalex.org/W2010835136","https://openalex.org/W2012510869","https://openalex.org/W2018517858","https://openalex.org/W2019149683","https://openalex.org/W2019455259","https://openalex.org/W2020483723","https://openalex.org/W2021536546","https://openalex.org/W2023082491","https://openalex.org/W2023644895","https://openalex.org/W2023976076","https://openalex.org/W2027184318","https://openalex.org/W2029018540","https://openalex.org/W2034562813","https://openalex.org/W2043865705","https://openalex.org/W2052609932","https://openalex.org/W2055600542","https://openalex.org/W2057181109","https://openalex.org/W2059888459","https://openalex.org/W2059912591","https://openalex.org/W2062659408","https://openalex.org/W2063357061","https://openalex.org/W2066042420","https://openalex.org/W2068959076","https://openalex.org/W2070541368","https://openalex.org/W2075930670","https://openalex.org/W2077524818","https://openalex.org/W2083559699","https://openalex.org/W2083562085","https://openalex.org/W2084134149","https://openalex.org/W2086242700","https://openalex.org/W2087728961","https://openalex.org/W2091749294","https://openalex.org/W2095835509","https://openalex.org/W2097290623","https://openalex.org/W2106464396","https://openalex.org/W2114427205","https://openalex.org/W2117274828","https://openalex.org/W2120090534","https://openalex.org/W2122266953","https://openalex.org/W2128226330","https://openalex.org/W2128470802","https://openalex.org/W2132394861","https://openalex.org/W2133242986","https://openalex.org/W2140500784","https://openalex.org/W2140748343","https://openalex.org/W2140947903","https://openalex.org/W2153393721","https://openalex.org/W2153660027","https://openalex.org/W2156517293","https://openalex.org/W2161411167","https://openalex.org/W2186594928","https://openalex.org/W2490116147","https://openalex.org/W2502759836","https://openalex.org/W2506586217","https://openalex.org/W2738635245","https://openalex.org/W2963237196","https://openalex.org/W2984261018","https://openalex.org/W3017143921","https://openalex.org/W3173138228","https://openalex.org/W3180974608","https://openalex.org/W4212995568","https://openalex.org/W4239247004","https://openalex.org/W4285719527","https://openalex.org/W4302779457","https://openalex.org/W4312428382","https://openalex.org/W6674273903"],"related_works":["https://openalex.org/W2563111511","https://openalex.org/W2913402129","https://openalex.org/W2161728531","https://openalex.org/W2044195815","https://openalex.org/W2057151759","https://openalex.org/W2368309484","https://openalex.org/W2066729819","https://openalex.org/W2460740512","https://openalex.org/W2163540231","https://openalex.org/W3040710037"],"abstract_inverted_index":{"An":[0],"incidence":[1],"matrix":[2],"analysis":[3,139],"is":[4,41,90],"used":[5,142],"to":[6,92,143,154,173],"model":[7,84,110,144,174],"a":[8,27,44,73,78,107,166],"three-dimensional":[9,60],"network":[10,32],"consisting":[11],"of":[12,30,36,46,59,81,87,120,123,178],"resistive":[13],"and":[14,39,55,99,128,134],"capacitive":[15],"elements":[16],"distributed":[17],"across":[18],"several":[19],"interconnected":[20],"layers.":[21],"A":[22,83],"systematic":[23],"methodology":[24],"for":[25],"deriving":[26],"descriptor":[28,48],"representation":[29,49],"the":[31,37,47,94,118,175],"with":[33,72,111,131],"random":[34,61,182],"allocation":[35],"resistors":[38,133],"capacitors":[40],"proposed.":[42],"Using":[43],"transformation":[45],"into":[50],"standard":[51],"state-space":[52],"form,":[53],"amplitude":[54],"phase":[56],"admittance":[57,95],"responses":[58,119,177],"RC":[62],"networks":[63,67,89,121],"are":[64],"obtained.":[65],"Such":[66],"display":[68],"an":[69],"emergent":[70],"behavior":[71],"characteristic":[74],"Jonscher-like":[75],"response":[76,96],"over":[77],"wide":[79],"range":[80],"frequencies.":[82],"approximation":[85],"study":[86],"these":[88],"performed":[91],"infer":[93],"using":[97,185],"integral":[98],"fractional":[100,108],"order":[101,109],"models.":[102],"It":[103],"was":[104],"found":[105],"that":[106],"only":[112],"seven":[113],"parameters":[114],"can":[115,140],"accurately":[116],"describe":[117],"composed":[122],"more":[124],"than":[125],"70":[126],"nodes":[127],"200":[129],"branches":[130],"100":[132,135],"capacitors.":[136],"The":[137],"proposed":[138],"be":[141,152],"charge":[145],"migration":[146],"in":[147,163],"amorphous":[148],"materials,":[149],"which":[150],"may":[151],"associated":[153],"specific":[155],"macroscopic":[156],"or":[157],"microscopic":[158],"scale":[159],"fractal":[160],"geometrical":[161],"structures":[162],"composites":[164],"displaying":[165],"viscoelastic":[167],"electromechanical":[168],"response,":[169],"as":[170,172],"well":[171],"collective":[176],"processes":[179],"governed":[180],"by":[181],"events":[183],"described":[184],"statistical":[186],"mechanics.":[187]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":14},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":16},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}