{"id":"https://openalex.org/W1990202733","doi":"https://doi.org/10.1109/tcsi.2012.2190632","title":"Multiple Cell Upset Correction in Memories Using Difference Set Codes","display_name":"Multiple Cell Upset Correction in Memories Using Difference Set Codes","publication_year":2012,"publication_date":"2012-04-12","ids":{"openalex":"https://openalex.org/W1990202733","doi":"https://doi.org/10.1109/tcsi.2012.2190632","mag":"1990202733"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2012.2190632","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2190632","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014330907","display_name":"Mark F. Flanagan","orcid":"https://orcid.org/0000-0001-6552-7020"},"institutions":[{"id":"https://openalex.org/I100930933","display_name":"University College Dublin","ror":"https://ror.org/05m7pjf47","country_code":"IE","type":"education","lineage":["https://openalex.org/I100930933"]}],"countries":["IE"],"is_corresponding":false,"raw_author_name":"Mark F. Flanagan","raw_affiliation_strings":["School of Electrical, Electronic and Mechanical Engineering, University College Dublin, Dublin, Ireland","Sch. of Electr., Electron., & Mech. Eng., Univ. Coll. Dublin, Dublin, Ireland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic and Mechanical Engineering, University College Dublin, Dublin, Ireland","institution_ids":["https://openalex.org/I100930933"]},{"raw_affiliation_string":"Sch. of Electr., Electron., & Mech. Eng., Univ. Coll. Dublin, Dublin, Ireland","institution_ids":["https://openalex.org/I100930933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029187842","display_name":"Shih\u2010Fu Liu","orcid":"https://orcid.org/0000-0003-3895-3221"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Shih-Fu Liu","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044495372","display_name":"Juan Antonio Maestro","orcid":"https://orcid.org/0000-0001-7133-9026"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Juan Antonio Maestro","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.174,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.94229135,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"59","issue":"11","first_page":"2592","last_page":"2599"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6813434362411499},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.6638671159744263},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6570668816566467},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.6256163716316223},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.621350884437561},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.6004286408424377},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.47694864869117737},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.4638955593109131},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.4358583688735962},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4149203896522522},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35385262966156006},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3283630609512329},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.30978870391845703},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17533183097839355},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12670189142227173}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6813434362411499},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.6638671159744263},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6570668816566467},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.6256163716316223},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.621350884437561},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.6004286408424377},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.47694864869117737},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.4638955593109131},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.4358583688735962},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4149203896522522},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35385262966156006},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3283630609512329},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.30978870391845703},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17533183097839355},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12670189142227173},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2012.2190632","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2012.2190632","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1985800138","https://openalex.org/W2003964202","https://openalex.org/W2021708499","https://openalex.org/W2025474944","https://openalex.org/W2031113490","https://openalex.org/W2096568519","https://openalex.org/W2099569658","https://openalex.org/W2110196049","https://openalex.org/W2118637853","https://openalex.org/W2128530344","https://openalex.org/W2134910804","https://openalex.org/W2138815251","https://openalex.org/W2151466808","https://openalex.org/W2151529344","https://openalex.org/W2154551122","https://openalex.org/W2168793636","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W2160088500","https://openalex.org/W2124354281","https://openalex.org/W1523508240","https://openalex.org/W2102538861","https://openalex.org/W2622269177","https://openalex.org/W2012451149","https://openalex.org/W3206176645","https://openalex.org/W2978528242","https://openalex.org/W3140581668","https://openalex.org/W2394408226"],"abstract_inverted_index":{"Error":[0],"Correction":[1],"Codes":[2],"(ECCs)":[3],"are":[4,74,129,150],"commonly":[5],"used":[6,131],"to":[7,32,38,87,117,132],"protect":[8,33,88],"memories":[9,34],"from":[10,91],"soft":[11],"errors.":[12],"As":[13],"technology":[14],"scales,":[15],"Multiple":[16],"Cell":[17],"Upsets":[18],"(MCUs)":[19],"become":[20],"more":[21,45],"common":[22],"and":[23,144,147],"affect":[24],"a":[25,83,89],"larger":[26],"number":[27],"of":[28,56,77,103,114,125],"cells.":[29],"An":[30],"option":[31],"against":[35],"MCUs":[36,92],"is":[37,85],"use":[39,55],"advanced":[40],"ECCs":[41],"that":[42],"can":[43],"correct":[44],"than":[46],"one":[47,57,75],"error":[48,120],"per":[49],"word.":[50],"In":[51,80],"this":[52,81],"area,":[53],"the":[54,101,104,112,126,134],"step":[58],"majority":[59],"logic":[60],"decodable":[61],"codes":[62,73,128],"has":[63,139],"recently":[64],"been":[65,140],"proposed":[66,98],"for":[67],"memory":[68,90],"applications.":[69],"Difference":[70,94],"Set":[71,95],"(DS)":[72],"example":[76],"these":[78],"codes.":[79,96],"paper,":[82],"scheme":[84,99,138],"presented":[86],"using":[93],"The":[97,123,137],"exploits":[100],"localization":[102],"errors":[105],"in":[106,142],"an":[107],"MCU,":[108],"as":[109,111],"well":[110],"properties":[113,124],"DS":[115,127],"codes,":[116],"provide":[118],"enhanced":[119],"correction":[121],"capabilities.":[122],"also":[130],"reduce":[133],"decoding":[135],"time.":[136],"implemented":[141],"HDL,":[143],"circuit":[145],"area":[146],"speed":[148],"estimates":[149],"provided.":[151]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}