{"id":"https://openalex.org/W1999484437","doi":"https://doi.org/10.1109/tcsi.2011.2165389","title":"Technology Variability From a Design Perspective","display_name":"Technology Variability From a Design Perspective","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W1999484437","doi":"https://doi.org/10.1109/tcsi.2011.2165389","mag":"1999484437"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2011.2165389","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2011.2165389","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041784384","display_name":"Borivoje Nikoli\u0107","orcid":"https://orcid.org/0000-0003-2324-1715"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Borivoje Nikolic","raw_affiliation_strings":["Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100767275","display_name":"Jihoon Park","orcid":"https://orcid.org/0000-0003-3582-204X"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ji-Hoon Park","raw_affiliation_strings":["Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056872202","display_name":"Jaehwa Kwak","orcid":"https://orcid.org/0000-0002-8045-1404"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaehwa Kwak","raw_affiliation_strings":["Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053227652","display_name":"Bastien Giraud","orcid":"https://orcid.org/0000-0002-1183-6685"},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bastien Giraud","raw_affiliation_strings":["Leti, CEA, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Leti, CEA, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007891380","display_name":"Zheng Guo","orcid":"https://orcid.org/0000-0001-8615-9749"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zheng Guo","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA","Intel Corporation, , Hillsboro, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, , Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054062234","display_name":"Liang-Teck Pang","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Liang-Teck Pang","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM T. J. Watson Center, Yorktown Heights, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM T. J. Watson Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014740587","display_name":"Seng Oon Toh","orcid":null},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seng Oon Toh","raw_affiliation_strings":["Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009326557","display_name":"Ruzica Jevti\u0107","orcid":"https://orcid.org/0000-0002-5261-5491"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ruzica Jevtic","raw_affiliation_strings":["Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076453728","display_name":"Kun Qian","orcid":"https://orcid.org/0000-0003-4971-8075"},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kun Qian","raw_affiliation_strings":["Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]","institution_ids":["https://openalex.org/I95457486"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013076652","display_name":"Costas J. Spanos","orcid":null},"institutions":[{"id":"https://openalex.org/I95457486","display_name":"University of California, Berkeley","ror":"https://ror.org/01an7q238","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Costas Spanos","raw_affiliation_strings":["Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and computer Sciences, University of California, Berkeley, CA, USA","institution_ids":["https://openalex.org/I95457486"]},{"raw_affiliation_string":"[Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA]","institution_ids":["https://openalex.org/I95457486"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.703,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.90344727,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"58","issue":"9","first_page":"1996","last_page":"2009"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7516937255859375},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.7019447684288025},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6192370057106018},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.5936237573623657},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5553304553031921},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45766761898994446},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4516916275024414},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.42410963773727417},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.32686328887939453},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3035154938697815},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22954970598220825},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2003265619277954}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7516937255859375},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.7019447684288025},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6192370057106018},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.5936237573623657},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5553304553031921},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45766761898994446},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4516916275024414},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.42410963773727417},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.32686328887939453},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3035154938697815},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22954970598220825},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2003265619277954},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2011.2165389","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2011.2165389","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320307757","display_name":"Advanced Micro Devices","ror":"https://ror.org/04kd6c783"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":66,"referenced_works":["https://openalex.org/W1552177954","https://openalex.org/W1572287951","https://openalex.org/W1607434217","https://openalex.org/W1766933113","https://openalex.org/W1870293527","https://openalex.org/W1966250416","https://openalex.org/W1966741973","https://openalex.org/W1968791949","https://openalex.org/W1974974397","https://openalex.org/W1990845788","https://openalex.org/W2001114775","https://openalex.org/W2012811678","https://openalex.org/W2027548746","https://openalex.org/W2033246483","https://openalex.org/W2033443176","https://openalex.org/W2059147047","https://openalex.org/W2059193309","https://openalex.org/W2060406996","https://openalex.org/W2069012095","https://openalex.org/W2079706534","https://openalex.org/W2099528297","https://openalex.org/W2099569060","https://openalex.org/W2103793078","https://openalex.org/W2104010258","https://openalex.org/W2104677471","https://openalex.org/W2108088191","https://openalex.org/W2112013772","https://openalex.org/W2112414127","https://openalex.org/W2113488294","https://openalex.org/W2115150721","https://openalex.org/W2117608378","https://openalex.org/W2119075450","https://openalex.org/W2120353978","https://openalex.org/W2122217504","https://openalex.org/W2126811283","https://openalex.org/W2129883611","https://openalex.org/W2133079932","https://openalex.org/W2147477544","https://openalex.org/W2150526221","https://openalex.org/W2153292994","https://openalex.org/W2153677786","https://openalex.org/W2155636448","https://openalex.org/W2159801533","https://openalex.org/W2161934647","https://openalex.org/W2162613878","https://openalex.org/W2172173999","https://openalex.org/W2204402797","https://openalex.org/W2252344835","https://openalex.org/W2262848367","https://openalex.org/W2268136522","https://openalex.org/W2275545695","https://openalex.org/W2543171663","https://openalex.org/W2545471485","https://openalex.org/W3139804307","https://openalex.org/W3149249597","https://openalex.org/W3151457670","https://openalex.org/W4231296481","https://openalex.org/W4236432903","https://openalex.org/W4239917711","https://openalex.org/W4242754029","https://openalex.org/W4285719527","https://openalex.org/W6640183753","https://openalex.org/W6642641465","https://openalex.org/W6670518604","https://openalex.org/W6677325421","https://openalex.org/W6729012750"],"related_works":["https://openalex.org/W2004049596","https://openalex.org/W2104413329","https://openalex.org/W3015531425","https://openalex.org/W2081795747","https://openalex.org/W2093304652","https://openalex.org/W4389672975","https://openalex.org/W2098316714","https://openalex.org/W1987513258","https://openalex.org/W1963851171","https://openalex.org/W2148163917"],"abstract_inverted_index":{"Increased":[0],"variability":[1,44,72,99],"in":[2,11,55,74],"semiconductor":[3],"process":[4],"technology":[5],"and":[6,32,35,46,51,60,70,88],"devices":[7],"requires":[8],"added":[9],"margins":[10,81,105],"the":[12,16,25,75,107],"design":[13,80],"to":[14,24,43,66,106],"guarantee":[15],"desired":[17],"yield.":[18],"Variability":[19],"is":[20],"characterized":[21],"with":[22],"respect":[23],"distribution":[26],"of":[27,78,98],"its":[28,30,36],"components,":[29],"spatial":[31],"temporal":[33],"characteristics":[34],"impact":[37],"on":[38],"specific":[39,68],"circuit":[40],"topologies.":[41],"Approaches":[42],"characterization":[45],"modeling":[47],"for":[48,102],"digital":[49],"logic":[50],"SRAM":[52,79],"are":[53,64,82,100],"analyzed":[54],"this":[56],"paper.":[57],"Transistor":[58],"arrays":[59,63],"ring":[61],"oscillator":[62],"designed":[65],"isolate":[67],"systematic":[69],"random":[71],"components":[73,97],"design.":[76,108],"Distributions":[77],"measured":[83],"by":[84],"using":[85],"padded-out":[86],"cells":[87],"observing":[89],"minimum":[90],"array":[91],"operating":[92],"voltages.":[93],"Correlations":[94],"between":[95],"various":[96],"essential":[101],"adding":[103],"appropriate":[104]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}