{"id":"https://openalex.org/W1985794108","doi":"https://doi.org/10.1109/tcsi.2011.2162382","title":"Sub-2-ps, Static Phase Error Calibration Technique Incorporating Measurement Uncertainty Cancellation for Multi-Gigahertz Time-Interleaved T/H Circuits","display_name":"Sub-2-ps, Static Phase Error Calibration Technique Incorporating Measurement Uncertainty Cancellation for Multi-Gigahertz Time-Interleaved T/H Circuits","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W1985794108","doi":"https://doi.org/10.1109/tcsi.2011.2162382","mag":"1985794108"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2011.2162382","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2011.2162382","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111569056","display_name":"Lingli Xia","orcid":null},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lingli Xia","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025420787","display_name":"Jingguang Wang","orcid":"https://orcid.org/0009-0000-7743-6513"},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]},{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jingguang Wang","raw_affiliation_strings":["Broadcom Corporation, Irvine, CA, USA","Oregon State University, Corvallis, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Broadcom Corporation, Irvine, CA, USA","institution_ids":["https://openalex.org/I4210127325"]},{"raw_affiliation_string":"Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111576771","display_name":"Will Beattie","orcid":null},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Will Beattie","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057341564","display_name":"Jacob Postman","orcid":null},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob Postman","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112245798","display_name":"Patrick Yin Chiang","orcid":null},"institutions":[{"id":"https://openalex.org/I131249849","display_name":"Oregon State University","ror":"https://ror.org/00ysfqy60","country_code":"US","type":"education","lineage":["https://openalex.org/I131249849"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick Yin Chiang","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, OR, USA","institution_ids":["https://openalex.org/I131249849"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0785,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.76510849,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"59","issue":"2","first_page":"276","last_page":"284"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/vernier-scale","display_name":"Vernier scale","score":0.7726396322250366},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6454964280128479},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6221486330032349},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.569239616394043},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5688630938529968},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5400300025939941},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4883860945701599},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4778292179107666},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4530389904975891},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.44633162021636963},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.43523895740509033},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.433808833360672},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.4174595773220062},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.41031572222709656},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.29231274127960205},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21782705187797546},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21238958835601807},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19542837142944336},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16321098804473877},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16110578179359436},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.11213552951812744},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0851128101348877}],"concepts":[{"id":"https://openalex.org/C69710193","wikidata":"https://www.wikidata.org/wiki/Q14946576","display_name":"Vernier scale","level":2,"score":0.7726396322250366},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6454964280128479},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6221486330032349},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.569239616394043},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5688630938529968},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5400300025939941},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4883860945701599},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4778292179107666},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4530389904975891},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.44633162021636963},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.43523895740509033},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.433808833360672},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.4174595773220062},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.41031572222709656},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.29231274127960205},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21782705187797546},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21238958835601807},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19542837142944336},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16321098804473877},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16110578179359436},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11213552951812744},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0851128101348877},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2011.2162382","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2011.2162382","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1581372012","https://openalex.org/W1825533673","https://openalex.org/W2011389124","https://openalex.org/W2095624237","https://openalex.org/W2096532743","https://openalex.org/W2099856596","https://openalex.org/W2126190772","https://openalex.org/W2129182275","https://openalex.org/W2130648546","https://openalex.org/W2143326453","https://openalex.org/W2145923236","https://openalex.org/W2148082913","https://openalex.org/W2155028642","https://openalex.org/W2163826094","https://openalex.org/W2169384972","https://openalex.org/W2172017172","https://openalex.org/W6644863192","https://openalex.org/W6670889262","https://openalex.org/W6674559331"],"related_works":["https://openalex.org/W2054844037","https://openalex.org/W2136440001","https://openalex.org/W2135250276","https://openalex.org/W3093575925","https://openalex.org/W2122001378","https://openalex.org/W1965493748","https://openalex.org/W1951127657","https://openalex.org/W1901843583","https://openalex.org/W2994809297","https://openalex.org/W3005757405"],"abstract_inverted_index":{"A":[0],"foreground":[1],"digital":[2,58],"calibration":[3,93],"method":[4],"is":[5],"presented":[6],"that":[7],"calibrates":[8],"the":[9,13,31,47,51,56,78,91,100,109],"timing":[10,48,105],"offsets":[11,40],"between":[12],"multiple":[14],"T/H":[15,52,132],"(track/hold)":[16],"circuits":[17],"of":[18,33,77,98,113,143],"time-interleaved":[19,126],"analog-to-digital":[20],"converters":[21],"and":[22,50,54,103],"multi-phase":[23],"serial":[24],"links.":[25],"Two":[26],"quantizer-based":[27],"phase":[28,39,101,111,141],"detectors":[29],"sample":[30],"outputs":[32],"adjacent":[34],"track/hold":[35],"circuits,":[36],"detecting":[37],"any":[38],"arising":[41],"from":[42,66],"process":[43],"mismatches":[44],"in":[45,60,86,121],"both":[46,99],"verniers":[49],"switches,":[53],"store":[55],"resulting":[57,65],"decisions":[59],"histogram":[61],"counters.":[62],"Measurement":[63],"inaccuracies":[64],"quantizer":[67],"offset":[68,112],"are":[69],"averaged":[70],"away":[71],"statistically":[72],"by":[73],"a":[74,87,131,135,139],"round-robin":[75],"rotation":[76],"dual":[79],"samplers,":[80],"compensating":[81],"for":[82],"comparator":[83],"imprecision.":[84],"Built":[85],"90-nm":[88],"CMOS":[89],"process,":[90],"proposed":[92],"technique,":[94],"after":[95],"three":[96],"iterations":[97],"measurement":[102],"subsequent":[104],"vernier":[106],"adjustment,":[107],"reduces":[108],"static":[110],"each":[114],"channel":[115],"to":[116],"less":[117,144],"than":[118,145],"\u00b10.5":[119],"ps":[120],"an":[122],"8-channel,":[123],"8":[124],"GS/s":[125],"system.":[127],"Further":[128],"measurements":[129],"using":[130],"circuit":[133],"as":[134],"down-conversion":[136],"mixer":[137],"confirm":[138],"residual":[140],"error":[142],"\u00b12":[146],"ps.":[147]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}