{"id":"https://openalex.org/W2105963142","doi":"https://doi.org/10.1109/tcsi.2011.2157741","title":"DRAM Yield Analysis and Optimization by a Statistical Design Approach","display_name":"DRAM Yield Analysis and Optimization by a Statistical Design Approach","publication_year":2011,"publication_date":"2011-07-11","ids":{"openalex":"https://openalex.org/W2105963142","doi":"https://doi.org/10.1109/tcsi.2011.2157741","mag":"2105963142"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2011.2157741","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2011.2157741","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100380417","display_name":"Yan Li","orcid":"https://orcid.org/0000-0003-1809-1695"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Yan Li","raw_affiliation_strings":["Lehrstuhl Technische Elektronik, Technical University Munich, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Lehrstuhl Technische Elektronik, Technical University Munich, Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008454417","display_name":"Helmut Schneider","orcid":"https://orcid.org/0000-0001-5594-2220"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Helmut Schneider","raw_affiliation_strings":["Qimonda AG, Neubiberg, Germany"],"affiliations":[{"raw_affiliation_string":"Qimonda AG, Neubiberg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076721993","display_name":"Florian Schnabel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153229","display_name":"European Patent Organisation","ror":"https://ror.org/050pmr719","country_code":"DE","type":"other","lineage":["https://openalex.org/I4210153229"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Florian Schnabel","raw_affiliation_strings":["European Patent Office, Munich, Germany","Qimonda AG, Neubiberg, Germany"],"affiliations":[{"raw_affiliation_string":"European Patent Office, Munich, Germany","institution_ids":["https://openalex.org/I4210153229"]},{"raw_affiliation_string":"Qimonda AG, Neubiberg, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090592661","display_name":"R. Thewes","orcid":null},"institutions":[{"id":"https://openalex.org/I4577782","display_name":"Technische Universit\u00e4t Berlin","ror":"https://ror.org/03v4gjf40","country_code":"DE","type":"education","lineage":["https://openalex.org/I4577782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Roland Thewes","raw_affiliation_strings":["Qimonda AG, Neubiberg, Germany","Technical University Berlin, Berlin, Germany"],"affiliations":[{"raw_affiliation_string":"Qimonda AG, Neubiberg, Germany","institution_ids":[]},{"raw_affiliation_string":"Technical University Berlin, Berlin, Germany","institution_ids":["https://openalex.org/I4577782"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057693404","display_name":"Doris Schmitt-Landsiedel","orcid":null},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Doris Schmitt-Landsiedel","raw_affiliation_strings":["Lehrstuhl Technische Elektronik, Technical University Munich, Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Lehrstuhl Technische Elektronik, Technical University Munich, Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100380417"],"corresponding_institution_ids":["https://openalex.org/I62916508"],"apc_list":null,"apc_paid":null,"fwci":1.8871,"has_fulltext":false,"cited_by_count":54,"citation_normalized_percentile":{"value":0.87100352,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"58","issue":"12","first_page":"2906","last_page":"2918"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.8679287433624268},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5871556997299194},{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.5729222893714905},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5128138661384583},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.49169355630874634},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.48724451661109924},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4823576807975769},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47495317459106445},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.47109681367874146},{"id":"https://openalex.org/keywords/log-normal-distribution","display_name":"Log-normal distribution","score":0.4600316286087036},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.459930956363678},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4307061433792114},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3219729959964752},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28781259059906006},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24863681197166443},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.16687297821044922},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1421290636062622},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1417180597782135}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.8679287433624268},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5871556997299194},{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.5729222893714905},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5128138661384583},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.49169355630874634},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.48724451661109924},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4823576807975769},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47495317459106445},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.47109681367874146},{"id":"https://openalex.org/C151620405","wikidata":"https://www.wikidata.org/wiki/Q826116","display_name":"Log-normal distribution","level":2,"score":0.4600316286087036},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.459930956363678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4307061433792114},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3219729959964752},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28781259059906006},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24863681197166443},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.16687297821044922},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1421290636062622},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1417180597782135},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2011.2157741","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2011.2157741","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1486120055","https://openalex.org/W1661368752","https://openalex.org/W1954777664","https://openalex.org/W1966450577","https://openalex.org/W2023834387","https://openalex.org/W2057335336","https://openalex.org/W2083451059","https://openalex.org/W2112127942","https://openalex.org/W2119435553","https://openalex.org/W2120092807","https://openalex.org/W2134905057","https://openalex.org/W2137808030","https://openalex.org/W2138732051","https://openalex.org/W2140823559","https://openalex.org/W2150938923","https://openalex.org/W2157210245","https://openalex.org/W2159392208","https://openalex.org/W2166582703","https://openalex.org/W2167869933","https://openalex.org/W2169761045","https://openalex.org/W2328407804","https://openalex.org/W2788331863","https://openalex.org/W3147289055","https://openalex.org/W4210341450","https://openalex.org/W6671487899"],"related_works":["https://openalex.org/W2154176871","https://openalex.org/W1607126780","https://openalex.org/W2165816612","https://openalex.org/W2900372418","https://openalex.org/W2620640398","https://openalex.org/W2097599071","https://openalex.org/W2170651760","https://openalex.org/W2475657675","https://openalex.org/W2540933489","https://openalex.org/W4221167253"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"the":[3,26,37,55,59,64,69,75,113,123,149,152],"electric":[4],"yield":[5,42,81,103,126,155],"of":[6,14,58,128,156],"DRAM":[7,27,38,88,132],"core":[8,28,142],"circuits":[9],"is":[10,83,105],"investigated":[11],"by":[12,51],"means":[13],"a":[15,20,32],"statistical":[16],"approach":[17],"that":[18],"incorporates":[19],"hierarchical":[21],"linear":[22],"Gaussian":[23,65],"model":[24,35,104],"for":[25,36,85,151,154],"sensing":[29],"process":[30],"and":[31,46,74,90,98,125,141],"lognormal":[33,56],"distribution":[34,57,66],"cell":[39,60,133],"leakage.":[40],"Analytical":[41,80],"expressions":[43],"are":[44],"obtained":[45],"found":[47,106],"to":[48,92,107,112,122],"be":[49,108,119],"dominated":[50],"two":[52],"independent":[53],"sources\u2014either":[54],"leakage":[61,134],"components":[62],"or":[63],"depending":[67],"on":[68],"array":[70,130],"structural":[71],"parameters,":[72],"parasitic,":[73],"sense":[76,136],"amplifier":[77,137],"offset":[78,138],"voltage.":[79],"analysis":[82,97,124],"conducted":[84],"several":[86],"different":[87],"architectures":[89],"compared":[91],"measurements":[93],"from":[94],"signal":[95],"margin":[96],"data":[99],"retention":[100],"tests.":[101],"The":[102],"very":[109],"accurate.":[110],"Thanks":[111],"short":[114],"computation":[115],"time,":[116],"it":[117],"can":[118],"easily":[120],"applied":[121],"optimization":[127],"novel":[129],"structures,":[131],"analysis,":[135],"voltage":[139,144],"requirements,":[140],"supply":[143],"optimization.":[145],"It":[146],"also":[147],"paves":[148],"way":[150],"design":[153],"other":[157],"memory":[158],"circuits.":[159]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":8},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}