{"id":"https://openalex.org/W2052476273","doi":"https://doi.org/10.1109/tcsi.2009.2035418","title":"Fast, Non-Monte-Carlo Estimation of Transient Performance Variation Due to Device Mismatch","display_name":"Fast, Non-Monte-Carlo Estimation of Transient Performance Variation Due to Device Mismatch","publication_year":2010,"publication_date":"2010-01-04","ids":{"openalex":"https://openalex.org/W2052476273","doi":"https://doi.org/10.1109/tcsi.2009.2035418","mag":"2052476273"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2009.2035418","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2009.2035418","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015393579","display_name":"Jaeha Kim","orcid":"https://orcid.org/0000-0003-2237-3134"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["KR","US"],"is_corresponding":true,"raw_author_name":"Jaeha Kim","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","University of Stanford, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Seoul National University, Seoul, South Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043312142","display_name":"Kevin Jones","orcid":"https://orcid.org/0000-0002-7960-0978"},"institutions":[{"id":"https://openalex.org/I4210095722","display_name":"Rambus (United States)","ror":"https://ror.org/00pn5a327","country_code":"US","type":"company","lineage":["https://openalex.org/I4210095722"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin D Jones","raw_affiliation_strings":["Rambus, Inc., Los Altos, CA, USA"],"affiliations":[{"raw_affiliation_string":"Rambus, Inc., Los Altos, CA, USA","institution_ids":["https://openalex.org/I4210095722"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090469068","display_name":"Mark Horowitz","orcid":"https://orcid.org/0000-0003-3245-7542"},"institutions":[{"id":"https://openalex.org/I4210095722","display_name":"Rambus (United States)","ror":"https://ror.org/00pn5a327","country_code":"US","type":"company","lineage":["https://openalex.org/I4210095722"]},{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark A Horowitz","raw_affiliation_strings":["Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","Rambus, Inc., Los Altos, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Stanford, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Rambus, Inc., Los Altos, CA, USA","institution_ids":["https://openalex.org/I4210095722"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5015393579"],"corresponding_institution_ids":["https://openalex.org/I139264467","https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":4.1174,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.94072564,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"57","issue":"7","first_page":"1746","last_page":"1755"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.8090881109237671},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6204662322998047},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5915365815162659},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5046302080154419},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.48023372888565063},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.38206759095191956},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36150676012039185},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2232780158519745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16691845655441284},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08301916718482971}],"concepts":[{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.8090881109237671},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6204662322998047},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5915365815162659},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5046302080154419},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.48023372888565063},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.38206759095191956},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36150676012039185},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2232780158519745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16691845655441284},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08301916718482971},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tcsi.2009.2035418","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2009.2035418","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.425.1234","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.425.1234","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"http://openaccess.city.ac.uk/1968/1/Fast Non-MonteCarlo Estimation of Transient.pdf","raw_type":"text"},{"id":"pmh:oai:openaccess.city.ac.uk:1968","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2009.2035418>","pdf_url":null,"source":{"id":"https://openalex.org/S4306401940","display_name":"City Research Online (City University London)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I180825142","host_organization_name":"City, University of London","host_organization_lineage":["https://openalex.org/I180825142"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1577335399","https://openalex.org/W1978981235","https://openalex.org/W1979012374","https://openalex.org/W1993715096","https://openalex.org/W2025995062","https://openalex.org/W2096808535","https://openalex.org/W2099320289","https://openalex.org/W2105982376","https://openalex.org/W2109320948","https://openalex.org/W2111079473","https://openalex.org/W2112955232","https://openalex.org/W2113236374","https://openalex.org/W2115477597","https://openalex.org/W2119901732","https://openalex.org/W2120553722","https://openalex.org/W2124586558","https://openalex.org/W2140823559","https://openalex.org/W2141004763","https://openalex.org/W2141776905","https://openalex.org/W2144232723","https://openalex.org/W2157404888","https://openalex.org/W2161672754","https://openalex.org/W2166479132","https://openalex.org/W2169263481","https://openalex.org/W2540724732","https://openalex.org/W2566206439","https://openalex.org/W2892151252","https://openalex.org/W4234927513","https://openalex.org/W4235854529","https://openalex.org/W6663682036"],"related_works":["https://openalex.org/W2358137648","https://openalex.org/W3128819368","https://openalex.org/W2393870460","https://openalex.org/W2259231220","https://openalex.org/W1982160337","https://openalex.org/W1971380437","https://openalex.org/W4284894156","https://openalex.org/W2141691317","https://openalex.org/W2161803855","https://openalex.org/W3170092502"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3,59,136],"efficient":[4],"way":[5],"of":[6,10,122,128,135,142],"simulating":[7],"the":[8,39,53,71,77,99,115,118,126,133,139],"effects":[9],"device":[11],"random":[12,31],"mismatch":[13],"on":[14],"circuit":[15,50],"transient":[16],"characteristics,":[17],"such":[18],"as":[19,33,58],"variations":[20,96,116],"in":[21,24,117],"delay":[22,127],"or":[23],"frequency.":[25],"The":[26],"proposed":[27],"method":[28,54],"models":[29],"DC":[30],"offsets":[32],"equivalent":[34],"AC":[35],"pseudo-noises":[36],"and":[37,64,97,132],"leverages":[38],"fast,":[40],"linear":[41,79],"periodically":[42],"time-varying":[43],"(LPTV)":[44],"noise":[45],"analysis":[46,63],"available":[47],"from":[48],"RF":[49],"simulators.":[51],"Therefore,":[52],"can":[55],"be":[56],"considered":[57],"extension":[60],"to":[61,70,92,104,146],"DCMATCH":[62],"offers":[65],"a":[66,123,129,147],"large":[67],"speed-up":[68],"compared":[69,145],"traditional":[72],"Monte":[73,149],"Carlo":[74,150],"analysis.":[75],"Although":[76],"assumed":[78],"perturbation":[80],"model":[81],"is":[82],"valid":[83],"only":[84],"for":[85],"small":[86],"variations,":[87],"it":[88],"enables":[89],"easy":[90],"ways":[91],"estimate":[93],"correlations":[94],"among":[95],"identify":[98],"most":[100],"sensitive":[101],"design":[102],"parameters":[103],"mismatch,":[105],"all":[106],"at":[107],"no":[108],"additional":[109],"simulation":[110],"cost.":[111],"Three":[112],"benchmarks":[113],"measuring":[114],"input":[119],"offset":[120],"voltage":[121],"clocked":[124],"comparator,":[125],"logic":[130],"path,":[131],"frequency":[134],"oscillator":[137],"demonstrate":[138],"speed":[140],"improvement":[141],"about":[143],"100-1000\u00d7":[144],"1000-point":[148],"method.":[151]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":4}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}