{"id":"https://openalex.org/W2116597081","doi":"https://doi.org/10.1109/tcsi.2009.2033528","title":"A Design-Oriented Soft Error Rate Variation Model Accounting for Both Die-to-Die and Within-Die Variations in Submicrometer CMOS SRAM Cells","display_name":"A Design-Oriented Soft Error Rate Variation Model Accounting for Both Die-to-Die and Within-Die Variations in Submicrometer CMOS SRAM Cells","publication_year":2010,"publication_date":"2010-01-26","ids":{"openalex":"https://openalex.org/W2116597081","doi":"https://doi.org/10.1109/tcsi.2009.2033528","mag":"2116597081"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2009.2033528","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2009.2033528","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063929219","display_name":"Hassan Mostafa","orcid":"https://orcid.org/0000-0003-0043-5007"},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Hassan Mostafa","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ONT, Canada","[Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ONT, Canada","institution_ids":["https://openalex.org/I151746483"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada]","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112829693","display_name":"Mohab Anis","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohab Anis","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ONT, Canada","[Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ONT, Canada","institution_ids":["https://openalex.org/I151746483"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada]","institution_ids":["https://openalex.org/I151746483"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111829312","display_name":"M.I. Elmasry","orcid":null},"institutions":[{"id":"https://openalex.org/I151746483","display_name":"University of Waterloo","ror":"https://ror.org/01aff2v68","country_code":"CA","type":"education","lineage":["https://openalex.org/I151746483"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohamed Elmasry","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ONT, Canada","[Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, ONT, Canada","institution_ids":["https://openalex.org/I151746483"]},{"raw_affiliation_string":"[Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada]","institution_ids":["https://openalex.org/I151746483"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.354,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.89391624,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"57","issue":"6","first_page":"1298","last_page":"1311"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.7804536819458008},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7455682754516602},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7314133644104004},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6451985239982605},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.5106175541877747},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4921514391899109},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.46655863523483276},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45368871092796326},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4521907567977905},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.44944149255752563},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4310286343097687},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41595494747161865},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33824747800827026},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1752922236919403},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.11747786402702332},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10035926103591919},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08146536350250244}],"concepts":[{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.7804536819458008},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7455682754516602},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7314133644104004},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6451985239982605},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5106175541877747},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4921514391899109},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.46655863523483276},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45368871092796326},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4521907567977905},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.44944149255752563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4310286343097687},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41595494747161865},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33824747800827026},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1752922236919403},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.11747786402702332},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10035926103591919},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08146536350250244},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2009.2033528","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2009.2033528","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W413878220","https://openalex.org/W1501443680","https://openalex.org/W1540206583","https://openalex.org/W1542800729","https://openalex.org/W1588171175","https://openalex.org/W1661368752","https://openalex.org/W1893212117","https://openalex.org/W2000372137","https://openalex.org/W2004236878","https://openalex.org/W2033443176","https://openalex.org/W2059941121","https://openalex.org/W2066269170","https://openalex.org/W2087114849","https://openalex.org/W2098274007","https://openalex.org/W2099320289","https://openalex.org/W2100048711","https://openalex.org/W2100192071","https://openalex.org/W2101328080","https://openalex.org/W2104113688","https://openalex.org/W2117648153","https://openalex.org/W2119795588","https://openalex.org/W2122747234","https://openalex.org/W2131581217","https://openalex.org/W2132621842","https://openalex.org/W2133877139","https://openalex.org/W2134067926","https://openalex.org/W2134490163","https://openalex.org/W2135880741","https://openalex.org/W2142358791","https://openalex.org/W2143676743","https://openalex.org/W2151829775","https://openalex.org/W2155051493","https://openalex.org/W2160155636","https://openalex.org/W2161549238","https://openalex.org/W2168525368","https://openalex.org/W2168703759","https://openalex.org/W2169213530","https://openalex.org/W2170039577","https://openalex.org/W2171998298","https://openalex.org/W2532574515","https://openalex.org/W2535854306","https://openalex.org/W3144245627","https://openalex.org/W4210341450","https://openalex.org/W4254168948","https://openalex.org/W6632468068","https://openalex.org/W6685646588","https://openalex.org/W6729219327"],"related_works":["https://openalex.org/W1500230652","https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2363504003","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2612883256","https://openalex.org/W4386933833","https://openalex.org/W1030007664"],"abstract_inverted_index":{"Submicrometer":[0],"static":[1],"random":[2],"access":[3],"memory":[4],"cells":[5],"are":[6,41,46,165],"more":[7],"susceptible":[8],"to":[9,50,128,133],"particle":[10,160],"strike":[11,161],"soft":[12,79,169],"errors":[13],"and":[14,38,48,112,139,158,172],"increased":[15],"statistical":[16],"process":[17],"variations,":[18],"in":[19,108,116,142,176],"advanced":[20],"nanometer":[21],"CMOS":[22,58],"technologies.":[23],"In":[24],"this":[25,100],"paper,":[26],"analytical":[27,148],"models":[28,45,149],"for":[29,35,151,168,180],"the":[30,68,71,76,84,113,121,130,135,152,155],"critical":[31,85],"charge":[32,86],"variations":[33,40,111,136],"accounting":[34],"both":[36],"die-to-die":[37],"within-die":[39],"proposed.":[42],"The":[43,104,146],"derived":[44,147],"verified":[47],"compared":[49],"Monte":[51],"Carlo":[52],"simulations":[53],"by":[54],"using":[55],"industrial":[56],"65-nm":[57],"technology.":[59],"This":[60],"paper":[61],"provides":[62],"new":[63],"design":[64,129,144],"insights":[65],"such":[66],"as":[67],"impact":[69,153],"of":[70,75,99,154],"coupling":[72,101,131],"capacitor,":[73],"one":[74],"most":[77],"common":[78],"error":[80,170],"mitigation":[81],"techniques,":[82],"on":[83],"variability,":[87],"especially,":[88,179],"at":[89],"lower":[90],"supply":[91,156],"voltages.":[92],"It":[93],"demonstrates":[94],"that":[95],"two":[96],"extreme":[97],"values":[98],"capacitor":[102,132],"exist.":[103],"first":[105],"value":[106],"results":[107,115,127,164],"maximum":[109],"relative":[110,118],"other":[114],"minimum":[117],"variations.":[119],"Therefore,":[120],"circuit":[122],"designers":[123],"can":[124],"utilize":[125],"these":[126],"limit":[134],"under":[137],"power":[138,182],"performance":[140],"constraints":[141],"early":[143],"cycles.":[145],"account":[150],"voltage":[157],"different":[159],"conditions.":[162],"These":[163],"particularly":[166],"important":[167],"tolerant":[171,174],"variation":[173],"designs":[175],"submicrometer":[177],"technologies,":[178],"low":[181],"operations.":[183]},"counts_by_year":[{"year":2023,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}