{"id":"https://openalex.org/W1987592213","doi":"https://doi.org/10.1109/tcsi.2008.2012232","title":"Effect of Mismatch on the Reliability of ON/OFF-Programmable CNNs","display_name":"Effect of Mismatch on the Reliability of ON/OFF-Programmable CNNs","publication_year":2009,"publication_date":"2009-01-16","ids":{"openalex":"https://openalex.org/W1987592213","doi":"https://doi.org/10.1109/tcsi.2008.2012232","mag":"1987592213"},"language":"en","primary_location":{"id":"doi:10.1109/tcsi.2008.2012232","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2008.2012232","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052855358","display_name":"Mika Laiho","orcid":"https://orcid.org/0000-0002-3794-0800"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":true,"raw_author_name":"M. Laiho","raw_affiliation_strings":["Microelectronics Laboratory, University of Turku, Turku, Finland","[Microelectron. Lab., Univ. of Turku, Turku, Finland]"],"affiliations":[{"raw_affiliation_string":"Microelectronics Laboratory, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]},{"raw_affiliation_string":"[Microelectron. Lab., Univ. of Turku, Turku, Finland]","institution_ids":["https://openalex.org/I155660961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077550469","display_name":"V.M. Brea","orcid":"https://orcid.org/0000-0003-0078-0425"},"institutions":[{"id":"https://openalex.org/I200284239","display_name":"Universidade de Santiago de Compostela","ror":"https://ror.org/030eybx10","country_code":"ES","type":"education","lineage":["https://openalex.org/I200284239"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"V. Brea","raw_affiliation_strings":["Department of Electronics and Computer Science, University of Santiago de Compostela, Santiago de Compostela, Spain","[Dept. of Electron. & Comput. Sci., Univ. of Santiago de Compostela, Santiago de Compostela, Spain]"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Computer Science, University of Santiago de Compostela, Santiago de Compostela, Spain","institution_ids":["https://openalex.org/I200284239"]},{"raw_affiliation_string":"[Dept. of Electron. & Comput. Sci., Univ. of Santiago de Compostela, Santiago de Compostela, Spain]","institution_ids":["https://openalex.org/I200284239"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038944203","display_name":"A. Paasio","orcid":"https://orcid.org/0000-0003-2543-7391"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"A. Paasio","raw_affiliation_strings":["Microelectronics Laboratory, University of Turku, Turku, Finland","[Microelectron. Lab., Univ. of Turku, Turku, Finland]"],"affiliations":[{"raw_affiliation_string":"Microelectronics Laboratory, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]},{"raw_affiliation_string":"[Microelectron. Lab., Univ. of Turku, Turku, Finland]","institution_ids":["https://openalex.org/I155660961"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5052855358"],"corresponding_institution_ids":["https://openalex.org/I155660961"],"apc_list":null,"apc_paid":null,"fwci":0.3428,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.60513045,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"56","issue":"10","first_page":"2259","last_page":"2269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11347","display_name":"Neural Networks Stability and Synchronization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11347","display_name":"Neural Networks Stability and Synchronization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9821000099182129,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8898493647575378},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.721479594707489},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.7119774222373962},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6643206477165222},{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.6228998303413391},{"id":"https://openalex.org/keywords/probability-of-error","display_name":"Probability of error","score":0.5667581558227539},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5431167483329773},{"id":"https://openalex.org/keywords/random-error","display_name":"Random error","score":0.5051177144050598},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47551852464675903},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4408056139945984},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4170178174972534},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.41516605019569397},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.39155203104019165},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15094420313835144},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10476067662239075},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10244178771972656}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8898493647575378},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.721479594707489},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.7119774222373962},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6643206477165222},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.6228998303413391},{"id":"https://openalex.org/C92224547","wikidata":"https://www.wikidata.org/wiki/Q1673216","display_name":"Probability of error","level":2,"score":0.5667581558227539},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5431167483329773},{"id":"https://openalex.org/C73782692","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Random error","level":2,"score":0.5051177144050598},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47551852464675903},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4408056139945984},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4170178174972534},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.41516605019569397},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.39155203104019165},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15094420313835144},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10476067662239075},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10244178771972656},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcsi.2008.2012232","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcsi.2008.2012232","pdf_url":null,"source":{"id":"https://openalex.org/S116977442","display_name":"IEEE Transactions on Circuits and Systems I Regular Papers","issn_l":"1549-8328","issn":["1549-8328","1558-0806"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Circuits and Systems I: Regular Papers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W147475332","https://openalex.org/W571960815","https://openalex.org/W1583478547","https://openalex.org/W1596163821","https://openalex.org/W1931821121","https://openalex.org/W1979482335","https://openalex.org/W2009744112","https://openalex.org/W2025995062","https://openalex.org/W2036831172","https://openalex.org/W2046085767","https://openalex.org/W2066373419","https://openalex.org/W2098602075","https://openalex.org/W2109812597","https://openalex.org/W2117148079","https://openalex.org/W2126860636","https://openalex.org/W2129816731","https://openalex.org/W2132846136","https://openalex.org/W2140281076","https://openalex.org/W2140823559","https://openalex.org/W2141378314","https://openalex.org/W2143412353","https://openalex.org/W2157965136","https://openalex.org/W2160121923","https://openalex.org/W2172085037"],"related_works":["https://openalex.org/W2060120035","https://openalex.org/W2414667732","https://openalex.org/W4242862669","https://openalex.org/W2102163837","https://openalex.org/W2157263809","https://openalex.org/W2389075589","https://openalex.org/W2137019427","https://openalex.org/W2145123420","https://openalex.org/W1526445242","https://openalex.org/W2291306337"],"abstract_inverted_index":{"In":[0,106],"this":[1],"paper,":[2],"the":[3,18,38,60,70,80,87,99,111,119],"reliability":[4,40,58],"of":[5,7,21,41,73,82,89],"computation":[6,39],"ON/OFF-programmable":[8,28],"cellular":[9],"nonlinear":[10],"networks":[11],"(CNNs)":[12],"is":[13,52,67],"analyzed.":[14],"This":[15],"paper":[16],"redefines":[17],"classical":[19],"concept":[20],"robustness":[22,51],"(tolerance":[23],"to":[24,36,49,122],"physical":[25,43,77],"imperfections)":[26],"in":[27,75,117],"CNNs":[29],"so":[30],"that":[31],"it":[32],"can":[33],"be":[34,115],"used":[35],"predict":[37],"a":[42,46,76,90],"realization.":[44,78],"Also,":[45],"systematic":[47],"approach":[48],"improve":[50],"described,":[53],"and":[54,98],"guidelines":[55],"for":[56],"optimizing":[57],"with":[59,95,125],"given":[61],"resources":[62],"are":[63],"given.":[64],"Random":[65],"mismatch":[66],"identified":[68],"as":[69],"main":[71],"source":[72],"errors":[74],"At":[79],"presence":[81],"random":[83,104],"mismatch,":[84],"we":[85,108],"describe":[86],"probability":[88,101,113],"cell":[91,120],"producing":[92],"an":[93],"error":[94,100,112],"specific":[96],"inputs":[97],"when":[102],"processing":[103],"data.":[105],"addition,":[107],"show":[109],"how":[110],"could":[114],"defined":[116],"case":[118],"needs":[121],"work":[123],"correctly":[124],"all":[126],"possible":[127],"input":[128],"combinations.":[129]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}