{"id":"https://openalex.org/W4391164256","doi":"https://doi.org/10.1109/tci.2024.3356861","title":"Densely Connected Convolutional Neural Network-Based Invalid Data Compensation for Brain Electrical Impedance Tomography","display_name":"Densely Connected Convolutional Neural Network-Based Invalid Data Compensation for Brain Electrical Impedance Tomography","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4391164256","doi":"https://doi.org/10.1109/tci.2024.3356861"},"language":"en","primary_location":{"id":"doi:10.1109/tci.2024.3356861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tci.2024.3356861","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2334-0118","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computational Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013551265","display_name":"Yanyan Shi","orcid":"https://orcid.org/0000-0003-2759-0015"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]},{"id":"https://openalex.org/I9916479","display_name":"Air Force Medical University","ror":"https://ror.org/00ms48f15","country_code":"CN","type":"education","lineage":["https://openalex.org/I9916479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanyan Shi","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","School of Biomedical Engineering, Fourth Military Medical University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0003-2759-0015","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]},{"raw_affiliation_string":"School of Biomedical Engineering, Fourth Military Medical University, Xi'an, China","institution_ids":["https://openalex.org/I9916479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000783483","display_name":"Yajun Lou","orcid":"https://orcid.org/0000-0003-2597-658X"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yajun Lou","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"],"raw_orcid":"https://orcid.org/0000-0003-2597-658X","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377250","display_name":"Meng Wang","orcid":"https://orcid.org/0000-0003-4230-1365"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Wang","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"],"raw_orcid":"https://orcid.org/0000-0003-4230-1365","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101767441","display_name":"Ke Yang","orcid":"https://orcid.org/0000-0002-3333-8177"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Yang","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"],"raw_orcid":"https://orcid.org/0000-0002-3333-8177","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074759214","display_name":"Zhen Gao","orcid":"https://orcid.org/0000-0001-7800-1407"},"institutions":[{"id":"https://openalex.org/I75955062","display_name":"Henan Normal University","ror":"https://ror.org/00s13br28","country_code":"CN","type":"education","lineage":["https://openalex.org/I75955062"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhen Gao","raw_affiliation_strings":["Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China"],"raw_orcid":"https://orcid.org/0000-0001-7800-1407","affiliations":[{"raw_affiliation_string":"Department of Electronic and Electrical Engineering, Henan Normal University, Xinxiang, China","institution_ids":["https://openalex.org/I75955062"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025171160","display_name":"Feng Fu","orcid":"https://orcid.org/0000-0003-1903-668X"},"institutions":[{"id":"https://openalex.org/I9916479","display_name":"Air Force Medical University","ror":"https://ror.org/00ms48f15","country_code":"CN","type":"education","lineage":["https://openalex.org/I9916479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Fu","raw_affiliation_strings":["School of Biomedical Engineering, Fourth Military Medical University, Xi'an, China"],"raw_orcid":"https://orcid.org/0000-0003-1903-668X","affiliations":[{"raw_affiliation_string":"School of Biomedical Engineering, Fourth Military Medical University, Xi'an, China","institution_ids":["https://openalex.org/I9916479"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5577,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.82060684,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"10","issue":null,"first_page":"143","last_page":"153"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9819999933242798,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9818999767303467,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.8044899106025696},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.7694072723388672},{"id":"https://openalex.org/keywords/disconnection","display_name":"Disconnection","score":0.6919022798538208},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6550279259681702},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6392778754234314},{"id":"https://openalex.org/keywords/imaging-phantom","display_name":"Imaging phantom","score":0.5522423386573792},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5263282656669617},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5190811157226562},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.47910383343696594},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4300713837146759},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.39875760674476624},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.38960596919059753},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3221479058265686},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.1386004388332367},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13321653008460999},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1077851951122284},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1029776930809021},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08052480220794678}],"concepts":[{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.8044899106025696},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.7694072723388672},{"id":"https://openalex.org/C2780371621","wikidata":"https://www.wikidata.org/wiki/Q3709910","display_name":"Disconnection","level":2,"score":0.6919022798538208},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6550279259681702},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6392778754234314},{"id":"https://openalex.org/C104293457","wikidata":"https://www.wikidata.org/wiki/Q28324852","display_name":"Imaging phantom","level":2,"score":0.5522423386573792},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5263282656669617},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5190811157226562},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.47910383343696594},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4300713837146759},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.39875760674476624},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.38960596919059753},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3221479058265686},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.1386004388332367},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13321653008460999},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1077851951122284},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1029776930809021},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08052480220794678},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tci.2024.3356861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tci.2024.3356861","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2334-0118","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computational Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4195455818","display_name":null,"funder_award_id":"52277234","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4997156755","display_name":"\u4e34\u5e8a\u9885\u8111\u635f\u4f24\u7535\u963b\u6297\u52a8\u6001\u6210\u50cf\u76d1\u6d4b\u7684\u5173\u952e\u95ee\u9898\u7814\u7a76","funder_award_id":"51837011","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W359288994","https://openalex.org/W2023627147","https://openalex.org/W2037714885","https://openalex.org/W2052625285","https://openalex.org/W2062091836","https://openalex.org/W2095120395","https://openalex.org/W2128648870","https://openalex.org/W2144961133","https://openalex.org/W2158048787","https://openalex.org/W2163674403","https://openalex.org/W2165704742","https://openalex.org/W2398382681","https://openalex.org/W2573438303","https://openalex.org/W2578286698","https://openalex.org/W2588773944","https://openalex.org/W2803200748","https://openalex.org/W2809447937","https://openalex.org/W2884367402","https://openalex.org/W2892867095","https://openalex.org/W2896344704","https://openalex.org/W2913384339","https://openalex.org/W2916125097","https://openalex.org/W2920875951","https://openalex.org/W2942544643","https://openalex.org/W2947413868","https://openalex.org/W2962092236","https://openalex.org/W2963231761","https://openalex.org/W2990050904","https://openalex.org/W3005368325","https://openalex.org/W3017209525","https://openalex.org/W3035905600","https://openalex.org/W3046520725","https://openalex.org/W3084741591","https://openalex.org/W3094060512","https://openalex.org/W3095460713","https://openalex.org/W3096852089","https://openalex.org/W3099236901","https://openalex.org/W3104579665","https://openalex.org/W3125122623","https://openalex.org/W3140349852","https://openalex.org/W3175610975","https://openalex.org/W3184565761","https://openalex.org/W3189826021","https://openalex.org/W3198506972","https://openalex.org/W4226206947","https://openalex.org/W4226372757","https://openalex.org/W6631190155"],"related_works":["https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2902419700","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2000128178","https://openalex.org/W2101428392","https://openalex.org/W2537891456","https://openalex.org/W2752613076"],"abstract_inverted_index":{"Electrical":[0],"impedance":[1],"tomography":[2],"(EIT)":[3],"is":[4,29,64,125,146,159,188],"a":[5,30,54],"potential":[6],"technique":[7],"for":[8,196],"the":[9,20,34,68,72,79,97,103,110,115,118,143,151,164,185,197],"brain":[10,80],"imaging.":[11],"With":[12],"this":[13,52,84],"technique,":[14],"pathology":[15],"related":[16],"conductivity":[17],"variation":[18],"inside":[19],"intracerebral":[21],"domain":[22],"can":[23,91,181],"be":[24,92,182],"visualized.":[25],"However,":[26],"electrode":[27,75,160,203],"disconnection":[28,76],"common":[31],"phenomenon":[32],"during":[33],"long-term":[35],"monitoring":[36],"with":[37,163],"EIT.":[38,81],"This":[39,190],"will":[40],"cause":[41],"data":[42,70,153],"loss":[43],"and":[44,106,138,173],"lead":[45],"to":[46,66,148],"image":[47],"reconstruction":[48,200],"failure.":[49],"To":[50,113],"address":[51],"problem,":[53],"novel":[55],"method":[56,145,187],"based":[57,167],"on":[58,83,168],"densely":[59],"connected":[60,170],"convolutional":[61,175],"neural":[62,171,176],"network":[63,172],"proposed":[65,119,144,186],"compensate":[67,150],"invalid":[69,152],"in":[71,78,102,109],"case":[73],"of":[74,88,99,117,135,199],"occurring":[77],"Based":[82],"method,":[85,121],"advanced":[86],"features":[87],"voltage":[89],"sequences":[90],"extracted.":[93],"Also,":[94],"it":[95],"alleviates":[96],"problems":[98],"information":[100],"disappearance":[101],"higher":[104],"layer":[105],"gradient":[107],"vanish":[108],"lower":[111],"layer.":[112],"evaluate":[114],"performance":[116,180],"compensation":[120,165],"extensive":[122],"simulation":[123],"work":[124,191],"conducted.":[126],"In":[127],"addition,":[128],"phantom":[129],"experiments":[130],"are":[131],"carried":[132],"out.":[133],"Both":[134],"qualitative":[136],"evaluation":[137],"quantitative":[139],"analysis":[140],"demonstrate":[141],"that":[142],"able":[147],"well":[149],"under":[154,202],"various":[155],"conditions":[156],"when":[157,184],"there":[158],"disconnection.":[161,204],"Compared":[162],"methods":[166],"fully":[169],"shallow":[174],"network,":[177],"much":[178],"better":[179],"obtained":[183],"adopted.":[189],"would":[192],"offer":[193],"an":[194],"alternative":[195],"improvement":[198],"quality":[201]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}