{"id":"https://openalex.org/W3211705374","doi":"https://doi.org/10.1109/tci.2021.3125925","title":"A Microwave Time Reversal Algorithm for Imaging Extended Defects in Dielectric Composites","display_name":"A Microwave Time Reversal Algorithm for Imaging Extended Defects in Dielectric Composites","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3211705374","doi":"https://doi.org/10.1109/tci.2021.3125925","mag":"3211705374"},"language":"en","primary_location":{"id":"doi:10.1109/tci.2021.3125925","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tci.2021.3125925","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computational Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tci.2021.3125925","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Saptarshi Mukherjee","orcid":"https://orcid.org/0000-0002-2840-8521"},"institutions":[{"id":"https://openalex.org/I1282311441","display_name":"Lawrence Livermore National Laboratory","ror":"https://ror.org/041nk4h53","country_code":"US","type":"facility","lineage":["https://openalex.org/I1282311441","https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210138311"]},{"id":"https://openalex.org/I4210138311","display_name":"Lawrence Livermore National Security","ror":"https://ror.org/03z21mf61","country_code":"US","type":"government","lineage":["https://openalex.org/I4210138311"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Saptarshi Mukherjee","raw_affiliation_strings":["Lawrence Livermore National Laboratory, 4578 Livermore, California, United States, 94550-5507 (e-mail: mukherjee5@llnl.gov)","Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)"],"raw_orcid":"https://orcid.org/0000-0002-2840-8521","affiliations":[{"raw_affiliation_string":"Lawrence Livermore National Laboratory, 4578 Livermore, California, United States, 94550-5507 (e-mail: mukherjee5@llnl.gov)","institution_ids":["https://openalex.org/I1282311441","https://openalex.org/I4210138311"]},{"raw_affiliation_string":"Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)","institution_ids":["https://openalex.org/I1282311441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039484123","display_name":"R. Owen Mays","orcid":"https://orcid.org/0000-0002-7575-8161"},"institutions":[{"id":"https://openalex.org/I1282311441","display_name":"Lawrence Livermore National Laboratory","ror":"https://ror.org/041nk4h53","country_code":"US","type":"facility","lineage":["https://openalex.org/I1282311441","https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210138311"]},{"id":"https://openalex.org/I4210138311","display_name":"Lawrence Livermore National Security","ror":"https://ror.org/03z21mf61","country_code":"US","type":"government","lineage":["https://openalex.org/I4210138311"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Owen Mays","raw_affiliation_strings":["Lawrence Livermore National Laboratory, 4578 Livermore, California, United States, (e-mail: mays8@llnl.gov)","Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lawrence Livermore National Laboratory, 4578 Livermore, California, United States, (e-mail: mays8@llnl.gov)","institution_ids":["https://openalex.org/I1282311441","https://openalex.org/I4210138311"]},{"raw_affiliation_string":"Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)","institution_ids":["https://openalex.org/I1282311441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049773005","display_name":"Joseph W. Tringe","orcid":"https://orcid.org/0000-0003-1792-5432"},"institutions":[{"id":"https://openalex.org/I1282311441","display_name":"Lawrence Livermore National Laboratory","ror":"https://ror.org/041nk4h53","country_code":"US","type":"facility","lineage":["https://openalex.org/I1282311441","https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210138311"]},{"id":"https://openalex.org/I4210138311","display_name":"Lawrence Livermore National Security","ror":"https://ror.org/03z21mf61","country_code":"US","type":"government","lineage":["https://openalex.org/I4210138311"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joseph W. Tringe","raw_affiliation_strings":["Lawrence Livermore National Laboratory, 4578 Livermore, California, United States, (e-mail: tringe2@llnl.gov)","Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lawrence Livermore National Laboratory, 4578 Livermore, California, United States, (e-mail: tringe2@llnl.gov)","institution_ids":["https://openalex.org/I1282311441","https://openalex.org/I4210138311"]},{"raw_affiliation_string":"Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)","institution_ids":["https://openalex.org/I1282311441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1282311441","https://openalex.org/I4210138311"],"apc_list":null,"apc_paid":null,"fwci":1.7362,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.83436551,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"1215","last_page":"1227"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6309327483177185},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.6170014142990112},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.6169193387031555},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.6111487746238708},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6101390719413757},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.4895351827144623},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.48456135392189026},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.46549591422080994},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4627492427825928},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45003741979599},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.3611988425254822},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.32678401470184326},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.32588687539100647},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17065104842185974},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.137674480676651},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.12226393818855286},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.08642032742500305}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6309327483177185},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.6170014142990112},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6169193387031555},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.6111487746238708},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6101390719413757},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.4895351827144623},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.48456135392189026},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.46549591422080994},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4627492427825928},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45003741979599},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3611988425254822},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.32678401470184326},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.32588687539100647},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17065104842185974},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.137674480676651},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.12226393818855286},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.08642032742500305},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1109/tci.2021.3125925","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tci.2021.3125925","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computational Imaging","raw_type":"journal-article"},{"id":"pmh:oai:osti.gov:1829383","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1829383","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai:osti.gov:1829384","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1829384","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai:osti.gov:1860690","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1860690","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai:osti.gov:1860911","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1860911","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"doi:10.1109/tci.2021.3125925","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tci.2021.3125925","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computational Imaging","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6600000262260437,"display_name":"Industry, innovation and infrastructure"}],"awards":[{"id":"https://openalex.org/G5522089832","display_name":null,"funder_award_id":"DE-AC52-07NA27344","funder_id":"https://openalex.org/F4320338286","funder_display_name":"Lawrence Livermore National Laboratory"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320338286","display_name":"Lawrence Livermore National Laboratory","ror":"https://ror.org/041nk4h53"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W1488032857","https://openalex.org/W1637304592","https://openalex.org/W1665301175","https://openalex.org/W1967550374","https://openalex.org/W1973475888","https://openalex.org/W1990433215","https://openalex.org/W1995651887","https://openalex.org/W2003520975","https://openalex.org/W2020717058","https://openalex.org/W2042582681","https://openalex.org/W2043217890","https://openalex.org/W2044514019","https://openalex.org/W2049432445","https://openalex.org/W2055346331","https://openalex.org/W2060793071","https://openalex.org/W2063293023","https://openalex.org/W2064391955","https://openalex.org/W2078940259","https://openalex.org/W2092636720","https://openalex.org/W2093361576","https://openalex.org/W2095310813","https://openalex.org/W2095673767","https://openalex.org/W2098027777","https://openalex.org/W2098113969","https://openalex.org/W2099545741","https://openalex.org/W2103983442","https://openalex.org/W2107625025","https://openalex.org/W2113837331","https://openalex.org/W2132747974","https://openalex.org/W2142063750","https://openalex.org/W2143341492","https://openalex.org/W2144425151","https://openalex.org/W2150084942","https://openalex.org/W2168142761","https://openalex.org/W2334010968","https://openalex.org/W2337083997","https://openalex.org/W2492261163","https://openalex.org/W2553527104","https://openalex.org/W2592277951","https://openalex.org/W2608229501","https://openalex.org/W2612125164","https://openalex.org/W2714220534","https://openalex.org/W2755736376","https://openalex.org/W2760696209","https://openalex.org/W2797966609","https://openalex.org/W2805712282","https://openalex.org/W2954040455","https://openalex.org/W2973887206","https://openalex.org/W3010353458","https://openalex.org/W4290665370","https://openalex.org/W7034702895"],"related_works":["https://openalex.org/W4225795411","https://openalex.org/W2809744190","https://openalex.org/W2511013388","https://openalex.org/W2044192478","https://openalex.org/W2064861618","https://openalex.org/W4378695326","https://openalex.org/W3021648695","https://openalex.org/W2464227412","https://openalex.org/W104168991","https://openalex.org/W4245961044"],"abstract_inverted_index":{"The":[0,45,147],"expanding":[1],"demand":[2],"for":[3,49,85,103,153,163],"glass":[4],"fiber":[5],"composites":[6,91],"in":[7,54,89,168],"aerospace,":[8],"automotive":[9],"and":[10,19,40,52,130,144],"civil":[11],"infrastructure":[12],"industries":[13],"has":[14,25,63],"led":[15],"to":[16,67,110],"large-scale":[17],"manufacturing":[18],"deployment":[20],"of":[21,29,47,79,95,133,136,156],"these":[22],"materials.":[23],"This":[24],"motivated":[26],"the":[27,77,93,128,150,154],"development":[28,155],"new":[30,158],"nondestructive":[31,160],"evaluation":[32,161],"techniques":[33],"that":[34,121],"can":[35,125],"detect":[36],"critical":[37],"damage":[38],"modes":[39],"continuously":[41],"monitor":[42],"structural":[43],"integrity.":[44],"advantages":[46],"microwaves":[48],"signal":[50],"propagation":[51],"resolution":[53],"dielectric":[55,90,169],"materials":[56],"have":[57],"previously":[58],"been":[59,64],"exploited.":[60],"However,":[61],"work":[62],"largely":[65],"limited":[66],"detecting":[68],"well-confined,":[69],"non-extended":[70],"defects.":[71,113],"In":[72],"this":[73],"paper":[74],"we":[75],"demonstrate":[76],"feasibility":[78],"a":[80,157],"microwave":[81,159],"time":[82],"reversal":[83],"algorithm":[84,124,148],"imaging":[86,164],"extended":[87,112],"defects":[88,137],"with":[92],"aid":[94],"computational":[96,151],"simulations.":[97],"We":[98],"introduce":[99],"an":[100],"improved":[101],"process":[102],"combining":[104],"time-resolved":[105],"information":[106],"from":[107,117],"multiple":[108],"sources":[109],"image":[111],"Model-based":[114],"numerical":[115],"results":[116],"parametric":[118],"studies":[119],"indicate":[120],"our":[122],"proposed":[123],"successfully":[126],"resolve":[127],"location":[129],"spatial":[131],"dimensions":[132],"different":[134],"types":[135],"such":[138],"as":[139],"sub-surface":[140],"voids,":[141],"oblique":[142],"cracks":[143],"metal-composite":[145],"disbonds.":[146],"provides":[149],"foundation":[152],"method":[162],"challenging":[165],"defect":[166],"scenarios":[167],"composites.":[170]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1}],"updated_date":"2026-05-23T08:51:43.019350","created_date":"2021-11-22T00:00:00"}