{"id":"https://openalex.org/W1944106919","doi":"https://doi.org/10.1109/tci.2015.2461492","title":"A Model-Based Image Reconstruction Algorithm With Simultaneous Beam Hardening Correction for X-Ray CT","display_name":"A Model-Based Image Reconstruction Algorithm With Simultaneous Beam Hardening Correction for X-Ray CT","publication_year":2015,"publication_date":"2015-07-28","ids":{"openalex":"https://openalex.org/W1944106919","doi":"https://doi.org/10.1109/tci.2015.2461492","mag":"1944106919"},"language":"en","primary_location":{"id":"doi:10.1109/tci.2015.2461492","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tci.2015.2461492","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computational Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051636340","display_name":"Pengchong Jin","orcid":null},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Pengchong Jin","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","School of Electrical and Computer Engineering. Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering. Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056657991","display_name":"Charles A. Bouman","orcid":"https://orcid.org/0000-0001-8504-0383"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Charles A. Bouman","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","School of Electrical and Computer Engineering. Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering. Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110231549","display_name":"K. Sauer","orcid":null},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ken D. Sauer","raw_affiliation_strings":["Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN, USA","Dept. of Electrical Engineering, University of Notre Dame, Notre Dame, IN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]},{"raw_affiliation_string":"Dept. of Electrical Engineering, University of Notre Dame, Notre Dame, IN, USA","institution_ids":["https://openalex.org/I107639228"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5051636340"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":16.5514,"has_fulltext":false,"cited_by_count":162,"citation_normalized_percentile":{"value":0.99558229,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"1","issue":"3","first_page":"200","last_page":"216"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10844","display_name":"Radiation Dose and Imaging","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6699569821357727},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.5855726599693298},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.5508426427841187},{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.48344025015830994},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48133859038352966},{"id":"https://openalex.org/keywords/hardening","display_name":"Hardening (computing)","score":0.46543943881988525},{"id":"https://openalex.org/keywords/beam","display_name":"Beam (structure)","score":0.4584606885910034},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4415086507797241},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.41457685828208923},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.40135207772254944},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3085549473762512},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.29343533515930176},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.18985959887504578},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.1774856448173523}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6699569821357727},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.5855726599693298},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.5508426427841187},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.48344025015830994},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48133859038352966},{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.46543943881988525},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.4584606885910034},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4415086507797241},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.41457685828208923},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.40135207772254944},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3085549473762512},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.29343533515930176},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.18985959887504578},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.1774856448173523},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tci.2015.2461492","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tci.2015.2461492","pdf_url":null,"source":{"id":"https://openalex.org/S4210233665","display_name":"IEEE Transactions on Computational Imaging","issn_l":"2333-9403","issn":["2333-9403","2573-0436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computational Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.5199999809265137}],"awards":[{"id":"https://openalex.org/G7282745900","display_name":null,"funder_award_id":"2013-ST-061-ED0001","funder_id":"https://openalex.org/F4320306110","funder_display_name":"U.S. Department of Homeland Security"}],"funders":[{"id":"https://openalex.org/F4320306110","display_name":"U.S. Department of Homeland Security","ror":"https://ror.org/00jyr0d86"},{"id":"https://openalex.org/F4320313814","display_name":"Marquette University","ror":"https://ror.org/04gr4te78"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":53,"referenced_works":["https://openalex.org/W299328272","https://openalex.org/W1411449688","https://openalex.org/W1502722793","https://openalex.org/W1556473642","https://openalex.org/W1586661374","https://openalex.org/W1604209691","https://openalex.org/W1969726300","https://openalex.org/W1972037630","https://openalex.org/W1972240851","https://openalex.org/W1973203270","https://openalex.org/W1975061714","https://openalex.org/W1975563492","https://openalex.org/W1982416531","https://openalex.org/W1984984788","https://openalex.org/W1986262252","https://openalex.org/W2000441297","https://openalex.org/W2001090382","https://openalex.org/W2003624223","https://openalex.org/W2005649374","https://openalex.org/W2016827952","https://openalex.org/W2018562406","https://openalex.org/W2020669628","https://openalex.org/W2020960731","https://openalex.org/W2031359912","https://openalex.org/W2035182647","https://openalex.org/W2049442067","https://openalex.org/W2049760669","https://openalex.org/W2053958583","https://openalex.org/W2054663128","https://openalex.org/W2062901757","https://openalex.org/W2068068894","https://openalex.org/W2073730742","https://openalex.org/W2098494036","https://openalex.org/W2110594768","https://openalex.org/W2128307228","https://openalex.org/W2135046866","https://openalex.org/W2148111899","https://openalex.org/W2154280873","https://openalex.org/W2156046546","https://openalex.org/W2159840967","https://openalex.org/W2160416946","https://openalex.org/W2163108870","https://openalex.org/W2168730277","https://openalex.org/W2227444683","https://openalex.org/W2294596027","https://openalex.org/W2540943031","https://openalex.org/W2544811972","https://openalex.org/W3045727282","https://openalex.org/W6689633053","https://openalex.org/W6697094459","https://openalex.org/W6728943543","https://openalex.org/W6781586230","https://openalex.org/W7055156917"],"related_works":["https://openalex.org/W2062605435","https://openalex.org/W2273182195","https://openalex.org/W2186374051","https://openalex.org/W2377963109","https://openalex.org/W2022279172","https://openalex.org/W2352247021","https://openalex.org/W2145835458","https://openalex.org/W2059332403","https://openalex.org/W2066034608","https://openalex.org/W1990381203"],"abstract_inverted_index":{"Beam":[0],"hardening":[1,38,68,93],"is":[2,11,127,135,223],"a":[3,17,33,84,138,154,160],"well-known":[4],"effect":[5,39],"in":[6,64,218],"X-ray":[7,105,156,260],"CT":[8],"scanning":[9],"that":[10,90,132,144,201,246],"caused":[12],"by":[13,43,115,137],"the":[14,27,36,66,104,111,118,122,130,133,169,175,187,190,194,197,203,209,221,226,232,235,247,259],"interaction":[15],"of":[16,32,103,140,163,196,234,258],"broad":[18],"polychromatic":[19],"source":[20],"spectrum":[21,106,210,261],"with":[22],"energy-dependent":[23],"material":[24,165,171,191,263],"attenuation.":[25],"If":[26],"scanned":[28],"object":[29,134],"only":[30],"consists":[31],"single":[34],"material,":[35],"beam":[37,67,92],"can":[40,69,145],"be":[41,146],"corrected":[42],"sinogram":[44],"precorrection":[45],"techniques.":[46],"However,":[47],"when":[48],"multiple":[49],"materials":[50,143],"are":[51,215],"present,":[52],"it":[53],"becomes":[54],"much":[55],"more":[56],"difficult":[57],"to":[58,71,225],"fully":[59],"compensate":[60],"for":[61,168,174,184],"this":[62,80,207],"distortion;":[63],"general,":[65],"contribute":[70],"reconstruction":[72,88,253],"artifacts":[73,254],"such":[74],"as":[75],"cupping":[76],"and":[77,120,172,193,211,220,241,262],"streaking.":[78],"In":[79],"paper,":[81],"we":[82],"present":[83],"novel":[85],"model-based":[86],"iterative":[87],"algorithm":[89,113,183,237,249],"incorporates":[91],"correction":[94,98,222],"(MBIR-BHC).":[95],"Unlike":[96],"most":[97],"algorithms,":[99],"which":[100],"require":[101],"knowledge":[102,257],"or":[107],"mass":[108,212],"attenuation":[109,213],"functions,":[110],"MBIR-BHC":[112,248],"works":[114],"simultaneously":[116],"reconstructing":[117],"image":[119],"estimating":[121,186],"beam-hardening":[123,204],"function.":[124,205],"The":[125],"method":[126],"based":[128,148],"on":[129,149],"assumption":[131],"formed":[136],"combination":[139],"two":[141,164,198],"distinct":[142],"separated":[147],"their":[150],"densities.":[151],"We":[152,177,230],"formulate":[153],"poly-energetic":[155],"forward":[157],"model":[158],"using":[159,238],"polynomial":[161,200],"function":[162],"projections:":[166],"one":[167,173],"low-density":[170],"high.":[176],"then":[178],"develop":[179],"an":[180],"alternating":[181],"minimization":[182],"jointly":[185],"reconstructed":[188],"image,":[189],"segmentation,":[192],"coefficients":[195],"component":[199],"models":[202],"With":[206],"approach,":[208],"functions":[214],"not":[216],"needed":[217],"advance,":[219],"adapted":[224],"dataset":[227],"being":[228],"reconstructed.":[229],"examine":[231],"performance":[233],"proposed":[236],"both":[239],"simulated":[240],"real":[242],"datasets.":[243],"Results":[244],"indicate":[245],"significantly":[250],"reduces":[251],"several":[252],"without":[255],"advanced":[256],"properties.":[264]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":16},{"year":2018,"cited_by_count":27},{"year":2017,"cited_by_count":25},{"year":2016,"cited_by_count":30},{"year":2015,"cited_by_count":9},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}